{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T23:41:39Z","timestamp":1759189299404,"version":"3.37.3"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Nucl. Sci."],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/tns.2015.2401427","type":"journal-article","created":{"date-parts":[[2015,3,20]],"date-time":"2015-03-20T15:20:26Z","timestamp":1426864826000},"page":"577-587","source":"Crossref","is-referenced-by-count":3,"title":["Prospects on Low-Z Elements K Fluorescence and Actinide-Radionuclides L Fluorescence X-Ray Detection With Cooled CZT"],"prefix":"10.1109","volume":"62","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9314-1763","authenticated-orcid":false,"given":"J. M.","family":"Maia","sequence":"first","affiliation":[]},{"given":"R. M.","family":"Curado da Silva","sequence":"additional","affiliation":[]},{"given":"Yoon-Seong","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1002\/xrs.1227"},{"year":"0","key":"ref32"},{"key":"ref31","first-page":"1","author":"tertian","year":"1982","journal-title":"Principles of Quantitative X-Ray Fluorescence Analysis"},{"journal-title":"Data Reduction and Error Analysis for the Physical Sciences","year":"2003","author":"bevington","key":"ref30"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2005.10.005"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(97)01143-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2195504"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(00)00282-5"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2011.01.144"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2009.02.043"},{"key":"ref14","first-page":"82","author":"spieler","year":"2008","journal-title":"Semiconductor Detector Systems"},{"key":"ref15","first-page":"122","author":"nicholson","year":"1974","journal-title":"Nuclear Electronics"},{"journal-title":"Radiation Detection and Measurement","year":"2000","author":"knoll","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/9781118521014"},{"year":"0","key":"ref18"},{"journal-title":"National Council on Radiation Protection and Measurements","year":"1976","key":"ref19"},{"key":"ref28","first-page":"145031","article-title":"Accurate measurement of electrical bulk resistivity and surface leakage of CdZnTe radiation detector crystals","volume":"100","author":"prokesch","year":"2003","journal-title":"J Appl Phys"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s90503491"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2003.08.058"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-87663-9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/23.958705"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"637","DOI":"10.1016\/j.nima.2006.05.085","article-title":"Signal variance in gamma-ray detectors?A review","volume":"565","author":"devanathan","year":"2006","journal-title":"Nucl Instrum Methods Phys Res A"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(03)00745-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10686-006-9047-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2218829"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(01)01956-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2004.05.071"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2153211"},{"key":"ref20","first-page":"588","author":"l?annunziata","year":"2003","journal-title":"Handbook of Radioactivity Analysis"},{"year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"229","DOI":"10.1016\/0168-9002(95)00043-7","article-title":"Absolute L X-ray intensities in the decays of <formula formulatype=\"inline\"><tex Notation=\"TeX\">${}^{230}{\\rm Th}$<\/tex> <\/formula>, <formula formulatype=\"inline\"><tex Notation=\"TeX\">${}^{234}{\\rm U}$<\/tex><\/formula>, <formula formulatype=\"inline\"><tex Notation=\"TeX\">${}^{238}{\\rm Pu}$<\/tex><\/formula> and <formula formulatype=\"inline\"><tex Notation=\"TeX\">${}^{244}{\\rm Cm}$<\/tex><\/formula>","volume":"361","author":"johnston","year":"1995","journal-title":"Nucl Instrum Methods Phys Res A"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.apradiso.2008.02.078"},{"year":"0","key":"ref23"},{"year":"0","key":"ref26"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/0370-1573(92)90086-F"}],"container-title":["IEEE Transactions on Nuclear Science"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/23\/7084208\/07064810.pdf?arnumber=7064810","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:52:46Z","timestamp":1641988366000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7064810\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":35,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tns.2015.2401427","relation":{},"ISSN":["0018-9499","1558-1578"],"issn-type":[{"type":"print","value":"0018-9499"},{"type":"electronic","value":"1558-1578"}],"subject":[],"published":{"date-parts":[[2015,4]]}}}