{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:00:36Z","timestamp":1740132036092,"version":"3.37.3"},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"FCT, Portugal","award":["SFRH\/BPD\/111285\/2015"],"award-info":[{"award-number":["SFRH\/BPD\/111285\/2015"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Plasma Sci."],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/tps.2017.2735918","type":"journal-article","created":{"date-parts":[[2017,8,9]],"date-time":"2017-08-09T14:11:29Z","timestamp":1502287889000},"page":"2767-2772","source":"Crossref","is-referenced-by-count":1,"title":["Ion Beam Monitoring Over a Biased Target"],"prefix":"10.1109","volume":"45","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3793-8898","authenticated-orcid":false,"given":"J.","family":"Lopes","sequence":"first","affiliation":[]},{"given":"J.","family":"Rocha","sequence":"additional","affiliation":[]},{"given":"N.","family":"Catarino","sequence":"additional","affiliation":[]},{"given":"M.","family":"Peres","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"434","article-title":"A beam profiler and emittance meter for the spes project at INFN-LNL","author":"bassato","year":"2011","journal-title":"Proc ICALEPCS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/10739149.2016.1186033"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.3246787"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"1328","DOI":"10.1063\/1.1136766","article-title":"Simple profile monitor for low intensity, low-duty cycle pulse ion beams","volume":"52","author":"lida","year":"1981","journal-title":"Rev Sci Instrum"},{"key":"ref8","first-page":"164","article-title":"High resolution ion beam profile measurement system","author":"lopes","year":"2011","journal-title":"Proc 13th Int Conf Accelerator Large Experim Phys Control Syst"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0029-554X(69)90347-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4236\/wjet.2015.33014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IIT.2000.924169"}],"container-title":["IEEE Transactions on Plasma Science"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/27\/8059921\/08006309.pdf?arnumber=8006309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:40:22Z","timestamp":1641987622000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8006309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":8,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tps.2017.2735918","relation":{},"ISSN":["0093-3813","1939-9375"],"issn-type":[{"type":"print","value":"0093-3813"},{"type":"electronic","value":"1939-9375"}],"subject":[],"published":{"date-parts":[[2017,10]]}}}