{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:50:35Z","timestamp":1764841835394},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Power Delivery"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1109\/tpwrd.2015.2504352","type":"journal-article","created":{"date-parts":[[2015,12,3]],"date-time":"2015-12-03T19:07:36Z","timestamp":1449169656000},"page":"1-1","source":"Crossref","is-referenced-by-count":16,"title":["Predicting Equipment Outages Due to Voltage Sags"],"prefix":"10.1109","author":[{"given":"Andre","family":"dos Santos","sequence":"first","affiliation":[]},{"given":"Maria Teresa","family":"Correia de Barros","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","first-page":"1010","article-title":"The IEEE reliability test system-1996","volume":"14","year":"1999","journal-title":"IEEE Trans Power Syst"},{"key":"ref30","author":"bollen","year":"2000","journal-title":"Understanding Power Quality Problems—Voltage Sags and Interruptions"},{"key":"ref10","year":"1981","journal-title":"Fault Tree Handbook"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.852385"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2008.4668789"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.829125"},{"key":"ref14","author":"zhang","year":"2008","journal-title":"Techno-economic Assessment of Voltage Sag Performance and Mitigation"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2362957"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.04.015"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.05.028"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.05.010"},{"key":"ref19","article-title":"Comparative analysis of busbar protection architectures","author":"dos santos","year":"2015","journal-title":"IEEE Trans Power Del"},{"key":"ref28","year":"2010","journal-title":"International Electrotechnical Vocabulary—Part 447 Measuring Relays"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.886795"},{"key":"ref27","article-title":"Neutre MT et exploitation a electricite de france","author":"gregoire","year":"1995","journal-title":"EDF Internal Publ"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/28.740859"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2002.1221415"},{"key":"ref29","author":"van c warrington","year":"1962","journal-title":"Protective Relays—Their Theory and Practice—Volume One"},{"key":"ref5","first-page":"1461","article-title":"Reliability analysis of industrial power systems taking into account voltage sags","author":"bollen","year":"1993","journal-title":"Proc IEEE AIE Meeting"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.874108"},{"key":"ref7","article-title":"A Monte Carlo simulation approach to the method of fault positions for stochastic assessment of voltage dips (sags)","author":"olguin","year":"2005","journal-title":"Asia Pacific IEEE\/PES Trans Dist Conf Exhib"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/28.67549"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2021029"},{"key":"ref1","year":"2008","journal-title":"Electromagnetic Compatibility (EMC)—Part 4–30 Testing and Measurement Techniques—Power Quality Measurement Methods"},{"key":"ref20","year":"2014","journal-title":"IEEE Guide for Voltage Sag Indices"},{"key":"ref22","year":"2004","journal-title":"Testing and Measurement Techniques—Voltage Dips Short Interruptions and Voltage Variations Immunity Tests"},{"key":"ref21","year":"2006","journal-title":"Semiconductor Equipment and Materials International (SEMI) Specification for Semiconductor Processing Equipment Voltage Sag Immunity"},{"key":"ref24","year":"2010","journal-title":"Voltage dip immunity of equipment and installations"},{"key":"ref23","year":"2005","journal-title":"Testing and Measurement Techniques—Voltage Dips Short Interruptions and Voltage Variations Immunity Tests for Equipment With Input Current More Than 16 A per Phase"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/EE.1937.6539982"},{"key":"ref25","author":"shooman","year":"1968","journal-title":"Probabilistic Reliability An Engineering Approach"}],"container-title":["IEEE Transactions on Power Delivery"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/61\/4359248\/07346490.pdf?arnumber=7346490","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:45:11Z","timestamp":1642005911000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7346490\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tpwrd.2015.2504352","relation":{},"ISSN":["0885-8977","1937-4208"],"issn-type":[{"value":"0885-8977","type":"print"},{"value":"1937-4208","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}