{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T21:19:11Z","timestamp":1768339151453,"version":"3.49.0"},"reference-count":33,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T00:00:00Z","timestamp":1751587200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T00:00:00Z","timestamp":1751587200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,4]]},"DOI":"10.1109\/yef-ece66503.2025.11117525","type":"proceedings-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:07:24Z","timestamp":1755626844000},"page":"175-179","source":"Crossref","is-referenced-by-count":1,"title":["A Robustness Analysis of Hot Spots Bias Points on the FinFET: A Simulation-Based Approach"],"prefix":"10.1109","author":[{"given":"Rafael","family":"Martins","sequence":"first","affiliation":[{"name":"NOVA School of Science and Technology,Caparica,Portugal"}]},{"given":"Miguel","family":"Coelho","sequence":"additional","affiliation":[{"name":"Universidade de Lisboa,Faculdade de Ciências,Lisboa,Portugal"}]},{"given":"Pedro","family":"Toledo","sequence":"additional","affiliation":[{"name":"Synopsys,Oeiras,Portugal"}]},{"given":"Alexandra","family":"Matos","sequence":"additional","affiliation":[{"name":"NOVA School of Science and Technology,Caparica,Portugal"}]},{"given":"Rafael","family":"Ferreira","sequence":"additional","affiliation":[{"name":"NOVA School of Science and Technology,Caparica,Portugal"}]},{"given":"Boyapati","family":"Subrahmanyam","sequence":"additional","affiliation":[{"name":"Synopsys,Dublin,Ireland"}]},{"given":"Luis B.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"NOVA School of Science and Technology Center for Technologies and System (CTS),Intelligent Systems Associate Laboratory,Caparica,Portugal"}]},{"given":"Jos\u00e9 Soares","family":"Augusto","sequence":"additional","affiliation":[{"name":"Universidade de Lisboa,Faculdade de Ciências,Lisboa,Portugal"}]},{"given":"Jo\u00e3o P.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"NOVA School of Science and Technology Center for Technologies and System (CTS),Intelligent Systems Associate Laboratory,Caparica,Portugal"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2557327"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2283084"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2015.2415584"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3109984.3110013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3198644"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2017.2712318"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511803840"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.535416"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3010875"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3270106"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2930595"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MIXDES.2007.4286119"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/81.933328"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1328343"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v10i2.411"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2016.7999041"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2017.8291999"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1149\/1.2728862"},{"key":"ref19","doi-asserted-by":"crossref","DOI":"10.1145\/2800986.2801000","article-title":"CMOS Transconductor Analysis for Low Temperature Sensitivity Based on ZTC MOSFET Condition","volume-title":"Proceedings of the 28th Symposium on Integrated Circuits and Systems Design, SBCCI \u201915","author":"Toledo","year":"2015"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2016.7724075"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.29292\/jics.v11i1.427"},{"key":"ref22","volume-title":"MOSFET Zero-Temperature-Coefficient (ZTC) Effect Modeling and Analysis for Low Thermal Sensitivity Analog Applications","author":"Toledo","year":"2015"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-016-0766-5"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.920335"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2018.2844607"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/YEF-ECE58420.2023.10209294"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511803840"},{"key":"ref28","first-page":"1","article-title":"Cmos transconductor analysis for low temperature sensitivity based on ztc mosfet condition","volume-title":"2015 28th Symposium on Integrated Circuits and Systems Design (SBCC1)","author":"Toledo","year":"2015"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/BF02124750"},{"key":"ref30","volume-title":"Physics of Semiconductor Device","author":"Sze","year":"1981"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2868387"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852045"}],"event":{"name":"2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)","location":"Caparica \/ Lisbon, Portugal","start":{"date-parts":[[2025,7,4]]},"end":{"date-parts":[[2025,7,4]]}},"container-title":["2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11117209\/11117227\/11117525.pdf?arnumber=11117525","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:28:45Z","timestamp":1755714525000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11117525\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,4]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/yef-ece66503.2025.11117525","relation":{},"subject":[],"published":{"date-parts":[[2025,7,4]]}}}