{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T21:41:11Z","timestamp":1771018871168,"version":"3.50.1"},"reference-count":18,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2025,7,31]],"date-time":"2025-07-31T00:00:00Z","timestamp":1753920000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Journal of Microscopy"],"published-print":{"date-parts":[[2025,10]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>We present the analytical solution to the diffraction integral that describes the Rayleigh length for a focused Gaussian beam with any value of a spherical truncating aperture. This exact solution is in precise agreement with numerical calculations for the light distribution in the near focal area. The solution arises under assumption of the paraxial approximation, which also provides the basis for the classical Rayleigh length definition. It will be shown that the non\u2010paraxial regime can be included by adding an empirical term (<jats:italic>C<\/jats:italic><jats:sub>np<\/jats:sub>) to the solution of the diffraction integral. This extends the validity of the expression to high numerical apertures (<jats:italic>NA<\/jats:italic>) up to <jats:italic>n<\/jats:italic> times 0.95, with <jats:italic>n<\/jats:italic> being the refractive index of the immersion medium. Thus, the entire practical range of NA, encountered in optical microscopy, is covered with a calculated error of less than 0.4% in the non\u2010paraxial limit. This theoretical result is important in the design of optical instrumentation, where overall light efficiency in excitation and detection and spatial resolution must be optimised together.<\/jats:p>","DOI":"10.1111\/jmi.70016","type":"journal-article","created":{"date-parts":[[2025,7,31]],"date-time":"2025-07-31T14:25:46Z","timestamp":1753971946000},"page":"124-133","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Analytical solution of the classical Rayleigh length definition, including truncation at arbitrary values"],"prefix":"10.1111","volume":"300","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8210-5898","authenticated-orcid":false,"given":"Aufried","family":"Lenferink","sequence":"first","affiliation":[{"name":"Department of Bio Engineering and Technology, Technical Medical Centre, Faculty of Science &amp; Technology University of Twente  Enschede The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cees","family":"Otto","sequence":"additional","affiliation":[{"name":"Department of Bio Engineering and Technology, Technical Medical Centre, Faculty of Science &amp; Technology University of Twente  Enschede The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2025,7,31]]},"reference":[{"key":"e_1_2_9_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.nano.2019.102109"},{"key":"e_1_2_9_3_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.est.9b03105"},{"key":"e_1_2_9_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0030-4018(03)01562-1"},{"key":"e_1_2_9_5_1","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.69.000575"},{"key":"e_1_2_9_6_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.1988.tb04563.x"},{"key":"e_1_2_9_7_1","doi-asserted-by":"publisher","DOI":"10.1364\/ao.39.004918"},{"key":"e_1_2_9_8_1","doi-asserted-by":"publisher","DOI":"10.1364\/ao.43.0006209"},{"key":"e_1_2_9_9_1","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.61.000031"},{"key":"e_1_2_9_10_1","doi-asserted-by":"publisher","DOI":"10.1364\/AO.9.001854"},{"key":"e_1_2_9_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/0030-4018(88)90225-8"},{"key":"e_1_2_9_12_1","doi-asserted-by":"crossref","unstructured":"Virendra N. &Mahajan N. V.(1986).Uniform versus Gaussian beams: A comparison of the effects of diffraction obscuration and aberrations.Journal of the Optical Society of America A: Optics and Image Science and Vision 3(4).","DOI":"10.1364\/JOSAA.3.000470"},{"key":"e_1_2_9_13_1","unstructured":"Siegman A. E.(1986).Lasers. University Science Chapter 16."},{"key":"e_1_2_9_14_1","first-page":"219","volume-title":"Polarization optics in telecommunications","author":"Damask J. N.","year":"2004"},{"key":"e_1_2_9_15_1","doi-asserted-by":"crossref","unstructured":"Siegman A. E.(1986).Lasers. University Science Chapter 17 668.","DOI":"10.1080\/02331938608843182"},{"key":"e_1_2_9_16_1","unstructured":"Siegman A. E.(1986).Lasers. University Science Chapter 17 666."},{"key":"e_1_2_9_17_1","doi-asserted-by":"publisher","DOI":"10.1364\/OE.8.000458"},{"key":"e_1_2_9_18_1","doi-asserted-by":"crossref","unstructured":"Siegman A. E.(1998).How to (maybe) measure laser beam quality. InM.Dowley(Ed.) DPSS (diode pumped solid state) lasers: Applications and issues(Vol. 17 of OSA Trends in Optics and Photonics). Optica Publishing Group.","DOI":"10.1364\/DLAI.1998.MQ1"},{"key":"e_1_2_9_19_1","doi-asserted-by":"publisher","DOI":"10.1364\/ao.44.001381"}],"container-title":["Journal of Microscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1111\/jmi.70016","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,24]],"date-time":"2025-09-24T14:17:05Z","timestamp":1758723425000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1111\/jmi.70016"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,31]]},"references-count":18,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2025,10]]}},"alternative-id":["10.1111\/jmi.70016"],"URL":"https:\/\/doi.org\/10.1111\/jmi.70016","archive":["Portico"],"relation":{},"ISSN":["0022-2720","1365-2818"],"issn-type":[{"value":"0022-2720","type":"print"},{"value":"1365-2818","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7,31]]},"assertion":[{"value":"2025-03-06","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-06-26","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-07-31","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}