{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,2]],"date-time":"2026-09-02T09:25:06Z","timestamp":1788341106763,"version":"build-2803163510"},"reference-count":52,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2026,8,21]],"date-time":"2026-08-21T00:00:00Z","timestamp":1787270400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"},{"start":{"date-parts":[[2026,8,21]],"date-time":"2026-08-21T00:00:00Z","timestamp":1787270400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Journal of Microscopy"],"published-print":{"date-parts":[[2026,9]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>Drift is one of the primary sources of uncertainty limiting the accuracy, repeatability, and reliability of scanning probe microscopy (SPM) measurements, with a particularly significant effect on the comparison of consecutive surface topography images. In this study, a two\u2010module hybrid physical\u2013computational framework is presented for the drift\u2010aware interpretation and reliability assessment of consecutive AFM topography measurements. The first module integrates deep learning (DL)\u2010based inter\u2010frame correspondence extraction, geometric validation, physical coordinate reconstruction, scan\u2010order\u2010based acquisition\u2010time assignment, inter\u2010scan delay correction, and temperature synchronisation to generate a time\u2010labelled drift representation. The second module uses this structured representation for comparative data\u2010driven modelling and evaluates drift velocity (), model performance, and stability through temperature\u2010included and temperature\u2010excluded configurations. This structure enables the joint analysis of validated correspondences in terms of lateral displacement, relative height variation, acquisition time, , drift direction, and synchronously recorded ambient temperature, together with their physical coordinate labels. The results indicate that the proposed framework should be positioned not as a universal drift\u2010correction method, but as a complementary and modular analysis approach that supports the drift\u2010aware interpretation, comparison, and reliability assessment of consecutive AFM topography\u00a0measurements.<\/jats:p>","DOI":"10.1111\/jmi.70160","type":"journal-article","created":{"date-parts":[[2026,8,21]],"date-time":"2026-08-21T14:45:57Z","timestamp":1787323557000},"page":"312-326","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A drift\u2010aware framework for reliability assessment and image\u2010based interpretation of atomic force microscopy measurements"],"prefix":"10.1111","volume":"303","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3998-1910","authenticated-orcid":false,"given":"D. Gemici","family":"Deveci","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Institute of Graduate Studies Alt\u0131nba\u015f University Istanbul Turkey"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9994-3487","authenticated-orcid":false,"given":"\u00d6.","family":"\u00dcnverdi","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Department of Electrical and Electronics Engineering Ya\u015far University Izmir Turkey"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"B.","family":"Yenen","sequence":"additional","affiliation":[{"name":"Department of Physics Engineering Istanbul Technical University Istanbul Turkey"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S. N.","family":"S\u00f6nmez","sequence":"additional","affiliation":[{"name":"Department of Physics Engineering Istanbul Technical University Istanbul Turkey"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2279-8098","authenticated-orcid":false,"given":"H. \u00d6.","family":"\u00d6zer","sequence":"additional","affiliation":[{"name":"Department of Physics Engineering Istanbul Technical University Istanbul Turkey"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[2026,8,21]]},"reference":[{"key":"e_1_2_8_2_1","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.75.949"},{"key":"e_1_2_8_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41570-016-0005"},{"key":"e_1_2_8_4_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200500701"},{"key":"e_1_2_8_5_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.78.205305"},{"key":"e_1_2_8_6_1","doi-asserted-by":"publisher","DOI":"10.2138\/am-2002-0102"},{"key":"e_1_2_8_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2025.111678"},{"key":"e_1_2_8_8_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1144890"},{"key":"e_1_2_8_9_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.587266"},{"key":"e_1_2_8_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/0257-8972(94)90121-X"},{"key":"e_1_2_8_11_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1150217"},{"key":"e_1_2_8_12_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1145650"},{"key":"e_1_2_8_13_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.1553972"},{"key":"e_1_2_8_14_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.589834"},{"key":"e_1_2_8_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.875534"},{"key":"e_1_2_8_16_1","doi-asserted-by":"crossref","unstructured":"Krohs F. &Fatikow S.(2012).A flexible control system for automated atomic force microscope based micro\u2010\/nanomanipulation. InInternational Design Engineering Technical Conferences and Computers and Information in Engineering Conference(Vol.45042 pp.311\u2013317).American Society of Mechanical Engineers.","DOI":"10.1115\/DETC2012-70304"},{"key":"e_1_2_8_17_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/18\/3\/046"},{"key":"e_1_2_8_18_1","doi-asserted-by":"publisher","DOI":"10.1243\/03093247JSA400"},{"key":"e_1_2_8_19_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.1306302"},{"key":"e_1_2_8_20_1","doi-asserted-by":"crossref","unstructured":"Abe M. Sugimoto Y. Custance O. &Morita S.(2005b).Room\u2010temperature reproducible spatial force spectroscopy using atom\u2010tracking technique.Applied Physics Letters 87(17).","DOI":"10.1063\/1.2108112"},{"key":"e_1_2_8_21_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/12\/050"},{"key":"e_1_2_8_22_1","doi-asserted-by":"crossref","unstructured":"Abe M. Sugimoto Y. Namikawa T. Morita K. Oyabu N. &Morita S.(2007).Drift compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy.Applied Physics Letters 90(20).","DOI":"10.1063\/1.2739410"},{"key":"e_1_2_8_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2016.03.013"},{"key":"e_1_2_8_24_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1651637"},{"key":"e_1_2_8_25_1","doi-asserted-by":"crossref","unstructured":"Diao Z. Ueda K. Hou L. Yamashita H. Custance O. &Abe M.(2023b).Automatic drift compensation for nanoscale imaging using feature point matching.Applied Physics Letters 122(12).","DOI":"10.1063\/5.0139330"},{"key":"e_1_2_8_26_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.3360909"},{"key":"e_1_2_8_27_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/20\/9\/095103"},{"key":"e_1_2_8_28_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.3478305"},{"key":"e_1_2_8_29_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-00765-w"},{"key":"e_1_2_8_30_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"e_1_2_8_31_1","doi-asserted-by":"publisher","DOI":"10.1063\/5.0160568"},{"key":"e_1_2_8_32_1","doi-asserted-by":"crossref","unstructured":"Diao Z. Ueda K. Hou L. Li F. Yamashita H. &Abe M.(2024).Ai\u2010equipped scanning probe microscopy for autonomous site\u2010specific atomic\u2010level characterization at room temperature.Small Methods page2400813.","DOI":"10.1002\/smtd.202400813"},{"key":"e_1_2_8_33_1","doi-asserted-by":"publisher","DOI":"10.1002\/smtd.202400813"},{"key":"e_1_2_8_34_1","doi-asserted-by":"publisher","DOI":"10.35848\/1882-0786\/acecd6"},{"key":"e_1_2_8_35_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpca.0c10731"},{"key":"e_1_2_8_36_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.scriptamat.2022.114965"},{"key":"e_1_2_8_37_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.langmuir.3c03046"},{"key":"e_1_2_8_38_1","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.3c04712"},{"key":"e_1_2_8_39_1","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aay6913"},{"key":"e_1_2_8_40_1","doi-asserted-by":"publisher","DOI":"10.1088\/2632-2153\/ab7d2f"},{"key":"e_1_2_8_41_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202002878"},{"key":"e_1_2_8_42_1","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.2c05303"},{"key":"e_1_2_8_43_1","doi-asserted-by":"publisher","DOI":"10.1038\/s42005-020-0317-3"},{"key":"e_1_2_8_44_1","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2024.1347648"},{"key":"e_1_2_8_45_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2022.113666"},{"key":"e_1_2_8_46_1","doi-asserted-by":"publisher","DOI":"10.1145\/358669.358692"},{"key":"e_1_2_8_47_1","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000029664.99615.94"},{"key":"e_1_2_8_48_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"e_1_2_8_49_1","doi-asserted-by":"crossref","unstructured":"DeTone D. Malisiewicz T. &Rabinovich A.(2018).Superpoint: Self\u2010supervised interest point detection and description. InProceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops(pp.224\u2013236).IEEE.","DOI":"10.1109\/CVPRW.2018.00060"},{"key":"e_1_2_8_50_1","doi-asserted-by":"crossref","unstructured":"Lindenberger P. Sarlin P.\u2010E. &Pollefeys M.(2023).Lightglue: Local feature matching at light speed. InProceedings of the IEEE\/CVF international conference on computer vision(pp.17627\u201317638).IEEE.","DOI":"10.1109\/ICCV51070.2023.01616"},{"key":"e_1_2_8_51_1","unstructured":"Ke G. Meng Q. Finley T. Wang T. Chen W. Ma W. Ye Q. &Liu T.\u2010Y.(2017).LightGBM: A highly efficient gradient boosting decision tree. InNIPS'17: Proceedings of the 31st International Conference on Neural Information Processing Systems(Vol.30).ACM."},{"key":"e_1_2_8_52_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2025.120006"},{"key":"e_1_2_8_53_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2026.114401"}],"container-title":["Journal of Microscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1111\/jmi.70160","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1111\/jmi.70160","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1111\/jmi.70160","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,2]],"date-time":"2026-09-02T09:11:02Z","timestamp":1788340262000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1111\/jmi.70160"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,8,21]]},"references-count":52,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2026,9]]}},"alternative-id":["10.1111\/jmi.70160"],"URL":"https:\/\/doi.org\/10.1111\/jmi.70160","archive":["Portico"],"relation":{},"ISSN":["0022-2720","1365-2818"],"issn-type":[{"value":"0022-2720","type":"print"},{"value":"1365-2818","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,8,21]]},"assertion":[{"value":"2026-05-04","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-08-12","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-08-21","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}