{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T06:02:41Z","timestamp":1762408961044,"version":"3.41.2"},"reference-count":8,"publisher":"ASME International","issue":"4","content-domain":{"domain":["asmedigitalcollection.asme.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,12,1]]},"abstract":"<jats:p>Considerable research effort has been focused on evaluating the accuracy of meso- and macroscale digital close range photogrammetry. However, evaluations of accuracy and applications in the submillimeter scale are rare. In this paper the authors propose the development of a three-dimensional (3D) photogrammetric scanner, based on macrolens cameras, able to reconstruct the three-dimensional surface topography of objects with submillimeter features. The system exploits multifocal image composition and has been designed for installation on all types of Numerical Controlled or Robotic systems. The approach is exploitable for digitizing submillimeter features at mesoscale as well as macroscale objects.<\/jats:p>","DOI":"10.1115\/1.4024973","type":"journal-article","created":{"date-parts":[[2013,8,17]],"date-time":"2013-08-17T10:30:39Z","timestamp":1376735439000},"update-policy":"https:\/\/doi.org\/10.1115\/crossmarkpolicy-asme","source":"Crossref","is-referenced-by-count":13,"title":["Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology"],"prefix":"10.1115","volume":"13","author":[{"given":"L. M.","family":"Galantucci","sequence":"first","affiliation":[{"name":"e-mail:"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Lavecchia","sequence":"additional","affiliation":[{"name":"e-mail:"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Percoco","sequence":"additional","affiliation":[{"name":"e-mail:\u2002 Dipartimento di Meccanica, Matematica e Management, Politecnico di Bari, Viale Japigia 182, Bari 70126, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"33","published-online":{"date-parts":[[2013,8,19]]},"reference":[{"issue":"2","key":"2019100316225502900_B1","doi-asserted-by":"crossref","first-page":"473","DOI":"10.1016\/S0007-8506(07)63451-9","article-title":"State of the Art of Micromachining","volume":"49","year":"2000","journal-title":"CIRP Ann. Manuf. Technol."},{"issue":"2","key":"2019100316225502900_B2","doi-asserted-by":"crossref","first-page":"815","DOI":"10.1016\/j.cirp.2012.05.009","article-title":"Technological Shifts in Surface Metrology","volume":"61","year":"2012","journal-title":"CIRP Ann. Manuf. Technol."},{"issue":"1","key":"2019100316225502900_B3","doi-asserted-by":"crossref","first-page":"383","DOI":"10.1016\/j.cirp.2012.03.137","article-title":"Raw Part Characterization and Automated Alignment by Means of a Photogrammetric Approach","volume":"61","year":"2012","journal-title":"CIRP Ann. Manuf. Technol."},{"issue":"B5","key":"2019100316225502900_B4","first-page":"628","article-title":"Surface Determination With an Accuracy of Few Microns, International Archives of Photogrammetry and Remote Sensing","volume":"29","year":"1992"},{"issue":"94","key":"2019100316225502900_B5","doi-asserted-by":"crossref","first-page":"695","DOI":"10.1111\/0031-868X.00148","article-title":"Digital Photogrammetry and Microscope Photographs","volume":"16","year":"1999","journal-title":"Photogramm. Rec."},{"key":"2019100316225502900_B6","unstructured":"Yanagi, H., and Chikatsu, H., 2010, \u201c3D Modeling of Small Objects Using Macrolens in Digital Very Close Range Photogrammetry,\u201d 2010, ISPRS Archives\u2014Volume XXXVIII\u2014Part 5, 2010, Proceedings of the ISPRS Commission V Mid-Term Symposium \u2018Close Range Image Measurement Techniques\u2019, June 21\u201324, Newcastle upon Tyne, United Kingdom."},{"volume-title":"Photographic Multishot Techniques: High Dynamic Range, Super-Resolution, Extended Depth of Field, Stitching","year":"2009","key":"2019100316225502900_B7"},{"issue":"135","key":"2019100316225502900_B8","doi-asserted-by":"crossref","first-page":"339","DOI":"10.1111\/j.1477-9730.2011.00648.x","article-title":"Calibration of Long Focal Length Cameras in Close Range Photogrammetry","volume":"26","year":"2011","journal-title":"Photogramm. Rec."}],"container-title":["Journal of Computing and Information Science in Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/asmedigitalcollection.asme.org\/computingengineering\/article-pdf\/doi\/10.1115\/1.4024973\/6099509\/jcise_013_04_044501.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"http:\/\/asmedigitalcollection.asme.org\/computingengineering\/article-pdf\/doi\/10.1115\/1.4024973\/6099509\/jcise_013_04_044501.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,3]],"date-time":"2019-10-03T20:23:05Z","timestamp":1570134185000},"score":1,"resource":{"primary":{"URL":"https:\/\/asmedigitalcollection.asme.org\/computingengineering\/article\/doi\/10.1115\/1.4024973\/370844\/Multistack-Close-Range-Photogrammetry-for-Low-Cost"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8,19]]},"references-count":8,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2013,12,1]]}},"URL":"https:\/\/doi.org\/10.1115\/1.4024973","relation":{},"ISSN":["1530-9827","1944-7078"],"issn-type":[{"type":"print","value":"1530-9827"},{"type":"electronic","value":"1944-7078"}],"subject":[],"published":{"date-parts":[[2013,8,19]]},"article-number":"044501"}}