{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,7]],"date-time":"2024-12-07T22:40:22Z","timestamp":1733611222667,"version":"3.30.1"},"reference-count":11,"publisher":"SPIE-Intl Soc Optical Eng","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J. Electron. Imaging"],"published-print":{"date-parts":[[2001,4,1]]},"DOI":"10.1117\/1.1351170","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T14:19:25Z","timestamp":1027693165000},"page":"511","source":"Crossref","is-referenced-by-count":1,"title":["Wavelet-based method for image filtering using scale-space continuity"],"prefix":"10.1117","volume":"10","author":[{"given":"Jacob","family":"Scharcanski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"189","reference":[{"key":"10.1117\/1.1351170_r1","doi-asserted-by":"crossref","first-page":"617","DOI":"10.1109\/18.119727","volume":"38","author":"Mallat","year":"1992","journal-title":"IEEE Trans. Inf. Theory","ISSN":"https:\/\/id.crossref.org\/issn\/0018-9448","issn-type":"print"},{"key":"10.1117\/1.1351170_r2","doi-asserted-by":"crossref","unstructured":"J. Lu, J. B. Weaver, D. M. Healy, and Y. Xu, \u201cNoise reduction with multiscale edge representation and perceptual criteria,\u201dProceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis,Victoria, B.C., October 1992, pp. 555\u2013558 (IEEE, Piscataway, NJ, 1992).","DOI":"10.1109\/TFTSA.1992.274118"},{"key":"10.1117\/1.1351170_r3","doi-asserted-by":"crossref","first-page":"747","DOI":"10.1109\/83.336245","volume":"3","author":"Xu","year":"1994","journal-title":"IEEE Trans. Image Process.","ISSN":"https:\/\/id.crossref.org\/issn\/1057-7149","issn-type":"print"},{"key":"10.1117\/1.1351170_r4","doi-asserted-by":"crossref","first-page":"549","DOI":"10.1109\/83.563320","volume":"6","author":"Malfait","year":"1997","journal-title":"IEEE Trans. Image Process.","ISSN":"https:\/\/id.crossref.org\/issn\/1057-7149","issn-type":"print"},{"key":"10.1117\/1.1351170_r5","doi-asserted-by":"crossref","unstructured":"S. G. Chang, B. Yu, and M. Vetterli, \u201cSpatially adaptive wavelet thresholding with context modeling for image denoising,\u201d inProceedings of the International Conference on Image Processing (ICIP98), pp. 535\u2013539 (1998).","DOI":"10.1109\/ICIP.1998.723556"},{"key":"10.1117\/1.1351170_r6","doi-asserted-by":"crossref","unstructured":"A. Pizurica, W. Philips, I. Lemahieu, and M. Acheroy, \u201cImage denoising in the wavelet domain using prior spatial constraints,\u201d inProceedings of the Seventh International Conference on Image Processing and its Applications, Manchester, England, pp. 216\u2013219 (1999).","DOI":"10.1049\/cp:19990314"},{"key":"10.1117\/1.1351170_r7","doi-asserted-by":"crossref","first-page":"674","DOI":"10.1109\/34.192463","volume":"2","author":"Mallat","year":"1989","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell.","ISSN":"https:\/\/id.crossref.org\/issn\/0162-8828","issn-type":"print"},{"key":"10.1117\/1.1351170_r8","doi-asserted-by":"crossref","first-page":"710","DOI":"10.1109\/34.142909","volume":"14","author":"Mallat","year":"1992","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell.","ISSN":"https:\/\/id.crossref.org\/issn\/0162-8828","issn-type":"print"},{"key":"10.1117\/1.1351170_r9","doi-asserted-by":"crossref","first-page":"679","DOI":"10.1109\/TPAMI.1986.4767851","volume":"8","author":"Canny","year":"1986","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell.","ISSN":"https:\/\/id.crossref.org\/issn\/0162-8828","issn-type":"print"},{"key":"10.1117\/1.1351170_r10","unstructured":"D. L. Donoho, \u201cWavelet shrinkage and w.v.d.: A 10-minute tour,\u201d Technical Report 416, Statistics Department, Stanford University, January, 1993."},{"key":"10.1117\/1.1351170_r11","unstructured":"H. J. Larson and B. O. Shubert,Probabilistic Models in Engineering Sciences, Vol. I, Wiley, New York (1979)."}],"container-title":["Journal of Electronic Imaging"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/electronicimaging.spiedigitallibrary.org\/article.aspx?articleid=1097723","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,7]],"date-time":"2024-12-07T22:09:21Z","timestamp":1733609361000},"score":1,"resource":{"primary":{"URL":"http:\/\/electronicimaging.spiedigitallibrary.org\/article.aspx?doi=10.1117\/1.1351170"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,4,1]]},"references-count":11,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2001,4,1]]}},"URL":"https:\/\/doi.org\/10.1117\/1.1351170","relation":{},"ISSN":["1017-9909"],"issn-type":[{"type":"print","value":"1017-9909"}],"subject":[],"published":{"date-parts":[[2001,4,1]]}}}