{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T03:30:19Z","timestamp":1725679819539},"reference-count":17,"publisher":"SPIE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,3,13]]},"DOI":"10.1117\/12.2083007","type":"proceedings-article","created":{"date-parts":[[2015,3,13]],"date-time":"2015-03-13T18:30:29Z","timestamp":1426271429000},"page":"939808","source":"Crossref","is-referenced-by-count":2,"title":["Statistical analysis of bidirectional reflectance distribution functions"],"prefix":"10.1117","volume":"9398","author":[{"given":"Carlos J.","family":"Zubiaga","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laurent","family":"Belcour","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Carles","family":"Bosch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adolfo","family":"Mu\u00f1oz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Barla","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"189","reference":[{"key":"c1","doi-asserted-by":"publisher","DOI":"10.1364\/AO.4.000767"},{"key":"c2","doi-asserted-by":"publisher","DOI":"10.1145\/15886"},{"key":"c3","unstructured":"Hunter, R. S., [The measurement of appearance], John Wiley & Sons (1987)."},{"key":"c4","doi-asserted-by":"publisher","DOI":"10.1145\/1559755"},{"key":"c5","first-page":"117","article-title":"Experimental analysis of brdf models","author":"Ngan","year":"2005"},{"key":"c6","doi-asserted-by":"publisher","DOI":"10.1145\/882262"},{"key":"c7","unstructured":"Bulmer, G., [Principles of Statistics], Dover Books on Mathematics Series, Dover Publications (1979)."},{"key":"c8","doi-asserted-by":"publisher","DOI":"10.1111\/cgf.2009.28.issue-4"},{"article-title":"Statistical Characterization of Surface Reflectance","year":"2014","author":"Havran","key":"c9"},{"key":"c10","doi-asserted-by":"publisher","DOI":"10.1145\/1027411"},{"key":"c11","doi-asserted-by":"publisher","DOI":"10.1145\/1073204"},{"key":"c12","doi-asserted-by":"publisher","DOI":"10.1145\/2487228"},{"key":"c13","doi-asserted-by":"publisher","DOI":"10.1145\/1189762"},{"key":"c14","doi-asserted-by":"publisher","DOI":"10.1145\/360825.360839"},{"article-title":"BRDF Explorer.","year":"2012","author":"Burley","key":"c15"},{"key":"c16","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-002-0089-7"},{"key":"c17","doi-asserted-by":"publisher","DOI":"10.1145\/1276377"}],"event":{"name":"IS&T\/SPIE Electronic Imaging","location":"San Francisco, California, United States"},"container-title":["SPIE Proceedings","Measuring, Modeling, and Reproducing Material Appearance 2015"],"original-title":[],"deposited":{"date-parts":[[2018,10,2]],"date-time":"2018-10-02T18:21:16Z","timestamp":1538504476000},"score":1,"resource":{"primary":{"URL":"http:\/\/proceedings.spiedigitallibrary.org\/proceeding.aspx?doi=10.1117\/12.2083007"}},"subtitle":[],"editor":[{"given":"Maria V.","family":"Ortiz Segovia","sequence":"first","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]},{"given":"Philipp","family":"Urban","sequence":"additional","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]},{"given":"Francisco H.","family":"Imai","sequence":"additional","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]}],"short-title":[],"issued":{"date-parts":[[2015,3,13]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1117\/12.2083007","relation":{},"ISSN":["0277-786X"],"issn-type":[{"type":"print","value":"0277-786X"}],"subject":[],"published":{"date-parts":[[2015,3,13]]}}}