{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T18:58:28Z","timestamp":1790362708442,"version":"4.1.0"},"reference-count":54,"publisher":"American Association for the Advancement of Science (AAAS)","issue":"39","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["T2125011"],"award-info":[{"award-number":["T2125011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["226-2024-00142"],"award-info":[{"award-number":["226-2024-00142"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017599","name":"Science and Technology Program of Zhejiang Province","doi-asserted-by":"publisher","award":["2025C01041"],"award-info":[{"award-number":["2025C01041"]}],"id":[{"id":"10.13039\/501100017599","id-type":"DOI","asserted-by":"publisher"}]},{"name":"CAS","award":["YSBR-068"],"award-info":[{"award-number":["YSBR-068"]}]},{"name":"Innovation Program for Quantum Science and Technology","award":["2023ZD0300100"],"award-info":[{"award-number":["2023ZD0300100"]}]},{"name":"Innovation Program for Quantum Science and Technology","award":["2021ZD0302200"],"award-info":[{"award-number":["2021ZD0302200"]}]},{"name":"Innovation Program for Quantum Science and Technology","award":["2021ZD0303204"],"award-info":[{"award-number":["2021ZD0303204"]}]},{"name":"New Cornerstone Science Foundation","award":["XPLORER PRIZE"],"award-info":[{"award-number":["XPLORER PRIZE"]}]}],"content-domain":{"domain":["www.science.org"],"crossmark-restriction":true},"short-container-title":["Sci. Adv."],"published-print":{"date-parts":[[2026,9,25]]},"abstract":"<jats:p>\n                    The nanoscale charge environment critically influences the performance of semiconductor devices, yet traditional characterization techniques usually lack the spatial resolution to resolve nanoscale charge heterogeneity and identify microscopic noise sources. Here, we address this critical gap using individual PL5 color centers in commercial silicon carbide as room-temperature, broadband (near-dc to gigahertz) quantum spectrometers. We report real-time, nanoscale observation of single-charge tunneling dynamics at room temperature in 4H-SiC by monitoring the random telegraph noise using optically detected magnetic resonance. This capability enables an electrical noise imaging technique that shows distinct noise variations on different wafers. Using dynamical decoupling and\n                    <jats:inline-formula>\n                      <mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\" display=\"inline\" overflow=\"scroll\">\n                        <mml:msub>\n                          <mml:mi>T<\/mml:mi>\n                          <mml:mn>1<\/mml:mn>\n                        <\/mml:msub>\n                      <\/mml:math>\n                    <\/jats:inline-formula>\n                    relaxation spectroscopy, we observe correlations of noise spectral density across frequency bands and obtain the nanoscale electron paramagnetic resonance fingerprint of spin defects in silicon carbide. Ultimately, through surface chemical engineering, we identify the native oxide layer as the main source of resolved electromagnetic fluctuations. This work establishes a versatile atomic-scale metrology platform bridging quantum sensing and semiconductor engineering, offering critical insights for optimizing third-generation semiconductor interfaces and advancing solid-state quantum technologies.\n                  <\/jats:p>","DOI":"10.1126\/sciadv.aej5462","type":"journal-article","created":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T17:58:53Z","timestamp":1790359133000},"update-policy":"https:\/\/doi.org\/10.34133\/aaas_crossmark","source":"Crossref","is-referenced-by-count":0,"title":["Quantum noise spectroscopy of nanoscale charge defects in silicon carbide at room temperature"],"prefix":"10.1126","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-1555-897X","authenticated-orcid":true,"given":"Jinpeng","family":"Liu","sequence":"first","affiliation":[{"name":"School of Biomedical Engineering, Division of Life Sciences and Medicine, University of Science and Technology of China, Hefei, Anhui 230026, China."},{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, Jiangsu 215123, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-2641-1105","authenticated-orcid":true,"given":"Yuanhong","family":"Teng","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3025-1228","authenticated-orcid":true,"given":"Yu","family":"Chen","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yixuan","family":"Wang","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sen","family":"Luan","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Division of Life Sciences and Medicine, University of Science and Technology of China, Hefei, Anhui 230026, China."},{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, Jiangsu 215123, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chihang","family":"Luo","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9320-1543","authenticated-orcid":true,"given":"Jun","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Division of Life Sciences and Medicine, University of Science and Technology of China, Hefei, Anhui 230026, China."},{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, Jiangsu 215123, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6946-4362","authenticated-orcid":true,"given":"Hao","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Key Laboratory of Superconductor Integrated Circuit Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7304-0474","authenticated-orcid":true,"given":"Lixing","family":"You","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Silicon Materials and Advanced Semiconductors &amp; School of Materials Science and Engineering, Institute of Advanced Semiconductors, ZJU-Hangzhou Global Scientific and Technological Innovation Center, Zhejiang University, Hangzhou, Zhejiang 310027, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qiang","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Silicon Materials and Advanced Semiconductors &amp; School of Materials Science and Engineering, Institute of Advanced Semiconductors, ZJU-Hangzhou Global Scientific and Technological Innovation Center, Zhejiang University, Hangzhou, Zhejiang 310027, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0117-8225","authenticated-orcid":true,"given":"Chunming","family":"Yin","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China."},{"name":"Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6232-7234","authenticated-orcid":true,"given":"Ya","family":"Wang","sequence":"additional","affiliation":[{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China."},{"name":"Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8889-2039","authenticated-orcid":true,"given":"Qi","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Division of Life Sciences and Medicine, University of Science and Technology of China, Hefei, Anhui 230026, China."},{"name":"Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, Jiangsu 215123, China."},{"name":"Institute of Quantum Sensing, School of Physics, Institute of Fundamental and Transdisciplinary Research, Zhejiang Key Laboratory of R&amp;D and Application of Cutting-edge Scientific Instruments, Zhejiang University, Hangzhou 310027, China."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3312-5566","authenticated-orcid":true,"given":"Fazhan","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Division of Life Sciences and Medicine, University of Science and Technology of China, Hefei, Anhui 230026, China."},{"name":"Laboratory of Spin Magnetic Resonance, School of Physical Sciences, Anhui Province Key Laboratory of Scientific Instrument Development and Application, University of Science and Technology of China, Hefei 230026, China."},{"name":"Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, Jiangsu 215123, China."},{"name":"Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China."},{"name":"Hefei National Research Center for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei 230026, China."}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"221","reference":[{"key":"e_1_3_2_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2652401"},{"key":"e_1_3_2_3_2","doi-asserted-by":"publisher","DOI":"10.1186\/s11671-022-03672-w"},{"key":"e_1_3_2_4_2","doi-asserted-by":"publisher","DOI":"10.1063\/5.0077299"},{"key":"e_1_3_2_5_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.112.097603"},{"key":"e_1_3_2_6_2","doi-asserted-by":"publisher","DOI":"10.1038\/nphys1969"},{"key":"e_1_3_2_7_2","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms12660"},{"key":"e_1_3_2_8_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-021-00656-z"},{"key":"e_1_3_2_9_2","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202405338"},{"key":"e_1_3_2_10_2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.4c00222"},{"key":"e_1_3_2_11_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-023-01352-4"},{"key":"e_1_3_2_12_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.109.224104"},{"key":"e_1_3_2_13_2","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.abl9402"},{"key":"e_1_3_2_14_2","unstructured":"R. Monge Y. Nakamura O. Bach J. Shao A. Lozovoi A. A. Wood K. Sasaki K. Kobayashi T. Delord and C. A. Meriles Beyond ensemble averaging: Parallelized single-shot readout of hole capture in diamond. arXiv:2507.11722 [cond-mat.mes-hall] (2025)."},{"key":"e_1_3_2_15_2","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.96.025001"},{"key":"e_1_3_2_16_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.14.014085"},{"key":"e_1_3_2_17_2","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.89.035002"},{"key":"e_1_3_2_18_2","doi-asserted-by":"publisher","DOI":"10.1126\/science.aax9406"},{"key":"e_1_3_2_19_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-024-01456-5"},{"key":"e_1_3_2_20_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-025-61839-2"},{"key":"e_1_3_2_21_2","doi-asserted-by":"publisher","DOI":"10.1038\/nature10562"},{"key":"e_1_3_2_22_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-54606-2"},{"key":"e_1_3_2_23_2","doi-asserted-by":"publisher","DOI":"10.1093\/nsr\/nwab122"},{"key":"e_1_3_2_24_2","unstructured":"Y. Chen Q. Zhang M. Liu J. Wu J. Liu X. Zhao J. Zhou P. Yu S. Lin Y. Teng W. Yu Y. Wang C. Duan F. Shi Oxygen-vacancy quantum spin de fects in silicon carbide. arXiv:2504.07558 [cond-mat.mtrl-sci] (2026)."},{"key":"e_1_3_2_25_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.112.187601"},{"key":"e_1_3_2_26_2","unstructured":"C. Zeledon B. Pingault J. C. Marcks M. Onizhuk Y. Tsaturyan Y. xin Wang B. S. Soloway H. Abe M. Ghezellou J. Ul-Hassan T. Ohshima N. T. Son F. J. Heremans G. Galli C. P. Anderson D. D. Awschalom Minute-long quantum coherence enabled by electrical depletion of magnetic noise. arXiv:2504.13164 [quant-ph] (2025)."},{"key":"e_1_3_2_27_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-025-59647-9"},{"key":"e_1_3_2_28_2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b00836"},{"key":"e_1_3_2_29_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.106.030802"},{"key":"e_1_3_2_30_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.118.197201"},{"key":"e_1_3_2_31_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.13.034010"},{"key":"e_1_3_2_32_2","doi-asserted-by":"publisher","DOI":"10.1093\/nsr\/nwad100"},{"key":"e_1_3_2_33_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.96.161114"},{"key":"e_1_3_2_34_2","doi-asserted-by":"publisher","DOI":"10.1039\/C9NR05938E"},{"key":"e_1_3_2_35_2","doi-asserted-by":"publisher","DOI":"10.3390\/en12122310"},{"key":"e_1_3_2_36_2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6633\/ad10b3"},{"key":"e_1_3_2_37_2","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.5c00802"},{"key":"e_1_3_2_38_2","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-022-01422-y"},{"key":"e_1_3_2_39_2","doi-asserted-by":"publisher","DOI":"10.1063\/5.0002838"},{"key":"e_1_3_2_40_2","doi-asserted-by":"publisher","DOI":"10.1002\/adma.73419"},{"key":"e_1_3_2_41_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2010.02.091"},{"key":"e_1_3_2_42_2","doi-asserted-by":"crossref","unstructured":"N. Zarrabi M. G. D\u00fcser R. Reuter S. D. Dunn J. Wrachtrup M. B\u00f6rsch \u201cDetecting substeps in the rotary motors of FoF1-ATP synthase by hidden Markov models \u201d in Biomedical Optics (BiOS) 2007 J. Enderlein Z. K. Gryczynski Eds. SPIE (2007) pp. 64440E.","DOI":"10.1117\/12.701001"},{"key":"e_1_3_2_43_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2518880"},{"key":"e_1_3_2_44_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1982.1056489"},{"key":"e_1_3_2_45_2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.4c03864"},{"key":"e_1_3_2_46_2","doi-asserted-by":"publisher","DOI":"10.1016\/0022-2364(90)90331-3"},{"key":"e_1_3_2_47_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.85.155204"},{"key":"e_1_3_2_48_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.99.012110"},{"key":"e_1_3_2_49_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1311810"},{"key":"e_1_3_2_50_2","doi-asserted-by":"crossref","unstructured":"Z. C. Feng R. Hull R. M. Osgood J. Parisi H. Warlimont Eds. SiC Power Materials: Devices and Applications Springer Series in Materials Science vol. 73 (Springer Berlin Heidelberg 2004).","DOI":"10.1007\/978-3-662-09877-6"},{"key":"e_1_3_2_51_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.66.235202"},{"key":"e_1_3_2_52_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.63.201201"},{"key":"e_1_3_2_53_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.109.187603"},{"key":"e_1_3_2_54_2","doi-asserted-by":"crossref","unstructured":"T. Kimoto J. A. Cooper \u201cCharacterization techniques and defects in silicon carbide \u201d in Fundamentals of Silicon Carbide Technology (John Wiley & Sons Ltd. 2014) pp. 125\u2013187.","DOI":"10.1002\/9781118313534.ch5"},{"key":"e_1_3_2_55_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.364397"}],"container-title":["Science Advances"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.science.org\/doi\/pdf\/10.1126\/sciadv.aej5462","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,25]],"date-time":"2026-09-25T17:59:40Z","timestamp":1790359180000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.science.org\/doi\/10.1126\/sciadv.aej5462"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9,25]]},"references-count":54,"journal-issue":{"issue":"39","published-print":{"date-parts":[[2026,9,25]]}},"alternative-id":["10.1126\/sciadv.aej5462"],"URL":"https:\/\/doi.org\/10.1126\/sciadv.aej5462","relation":{},"ISSN":["2375-2548"],"issn-type":[{"value":"2375-2548","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9,25]]},"assertion":[{"value":"2026-06-09","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-08-11","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-09-25","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"eaej5462"}}