{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:11:29Z","timestamp":1773655889918,"version":"3.50.1"},"reference-count":32,"publisher":"Pleiades Publishing Ltd","issue":"10","license":[{"start":{"date-parts":[[2015,10,1]],"date-time":"2015-10-01T00:00:00Z","timestamp":1443657600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2015,10,1]],"date-time":"2015-10-01T00:00:00Z","timestamp":1443657600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Autom Remote Control"],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1134\/s0005117915100112","type":"journal-article","created":{"date-parts":[[2015,10,20]],"date-time":"2015-10-20T08:39:46Z","timestamp":1445330386000},"page":"1834-1848","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":19,"title":["Applications of modular summation codes to concurrent error detection systems for combinational boolean circuits"],"prefix":"10.1134","volume":"76","author":[{"given":"D. V.","family":"Efanov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V. V.","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vl. V.","family":"Sapozhnikov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"137","published-online":{"date-parts":[[2015,10,21]]},"reference":[{"key":"349_CR1","volume-title":"Samoproveryaemye ustroistva i otkazoustoichivye sistemy (Self-Testing Devices and Fault-Tolerant Systems)","author":"E.S. Sogomonyan","year":"1989","unstructured":"Sogomonyan, E.S. and Slabakov, E.V., Samoproveryaemye ustroistva i otkazoustoichivye sistemy (Self-Testing Devices and Fault-Tolerant Systems), Moscow: Radio i Svyaz\u2019, 1989"},{"key":"349_CR2","volume-title":"Samoproveryaemye diskretnye ustroistva (Self-Testing Discrete Devices)","author":"V.V. Sapozhnikov","year":"1992","unstructured":"Sapozhnikov, V.V. and Sapozhnikov, Vl.V., Samoproveryaemye diskretnye ustroistva (Self-Testing Discrete Devices), St. Petersburg: Energoatomizdat, 1992."},{"key":"349_CR3","volume-title":"Error Detection Circuits","author":"M. Goessel","year":"1994","unstructured":"Goessel, M. and Graf, S., Error Detection Circuits, London: McGraw-Hill, 1994"},{"key":"349_CR4","volume-title":"Fault-Tolerant Computer System Design, Upper Saddle","author":"D.K. Pradhan","year":"1996","unstructured":"Pradhan, D.K., Fault-Tolerant Computer System Design, Upper Saddle River: Prentice Hall, 1996"},{"issue":"6","key":"349_CR5","first-page":"70","volume":"20","author":"V.V. Sapozhnikov","year":"1998","unstructured":"Sapozhnikov, V.V., Sapozhnikov, Vl.V., Gessel\u2019, M., and Morozov, A.A., A Method for Constructing Combinational Self-Testing Devices with Detection of All Single Faults, Elektron. Modelir., 1998, vol. 20, no. 6, pp. 70\u201380.","journal-title":"Elektron. Modelir."},{"issue":"2","key":"349_CR6","first-page":"299","volume":"58","author":"M. Goessel","year":"1997","unstructured":"Goessel, M., Morozov, A.A., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Study of Combinational Self-Checking Devices with Independent and Monotonic Independent Outputs, Autom. Remote Control, 1997, vol. 58, no. 2, part 2, pp. 299\u2013309.","journal-title":"Autom. Remote Control"},{"issue":"1","key":"349_CR7","doi-asserted-by":"publisher","first-page":"68","DOI":"10.1016\/S0019-9958(61)80037-5","volume":"4","author":"J.M. Berger","year":"1961","unstructured":"Berger, J.M., A Note on Error Detection Codes for Asymmetric Channels, Inform. Control, 1961, vol. 4, no. 1, pp. 68\u201373.","journal-title":"Inform. Control"},{"issue":"4","key":"349_CR8","doi-asserted-by":"publisher","first-page":"525","DOI":"10.1109\/43.125100","volume":"11","author":"J.-C. Lo","year":"1992","unstructured":"Lo, J.-C, Thanawastien, S., and Nicolaidis, M., An SFS Berger Check Prediction ALU and Its Application to Self-checking Processor Designs, Comput.-Aided Design Integrat. Circuits Syst., 1992, vol. 11, no. 4, pp. 525\u2013540.","journal-title":"Comput.-Aided Design Integrat. Circuits Syst"},{"issue":"6","key":"349_CR9","doi-asserted-by":"publisher","first-page":"878","DOI":"10.1109\/43.229762","volume":"12","author":"N.K. Jha","year":"1993","unstructured":"Jha, N.K. and Wang, S.J., Design and Synthesis of Self-Checking VLSI Circuits, IEEE Trans. Comput.-Aided Design, 1993, vol. 12, no. 6, pp. 878\u2013887.","journal-title":"IEEE Trans. Comput.-Aided Design"},{"issue":"2","key":"349_CR10","doi-asserted-by":"publisher","first-page":"186","DOI":"10.1109\/92.285745","volume":"2","author":"K. De","year":"1994","unstructured":"De, K., Natarajan, C., Nair, D., and Banerjee, P., RSYN: A System for Automated Synthesis of Reliable Multilevel Circuits, IEEE Trans. VLSI Syst., 1994, vol. 2, no. 2, pp. 186\u2013195.","journal-title":"IEEE Trans. VLSI Syst"},{"issue":"7","key":"349_CR11","first-page":"1050","volume":"55","author":"M. Gessel","year":"1994","unstructured":"Gessel, M., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Construction of Combination Self-Checking Devices with Monotonically Independent Outputs, Autom. Remote Control, 1994, vol. 55, no. 7, part 2, pp. 1050\u20131059.","journal-title":"Autom. Remote Control"},{"key":"349_CR12","doi-asserted-by":"publisher","first-page":"157","DOI":"10.1109\/VTEST.1996.510851","volume-title":"Proc. VLSI Test Symp","author":"S. Gorshe","year":"1996","unstructured":"Gorshe, S. and Bose, B., A Self-Checking ALU Design with Efficient Codes, Proc. VLSI Test Symp., 1996, pp. 157\u2013161."},{"key":"349_CR13","first-page":"56","volume-title":"Proc. IEEE Int. On-Line Testing Workshop (IOLTW)","author":"V.V. Saposhnikov","year":"1996","unstructured":"Saposhnikov, V.V., Saposhnikov, Vl.V., Morosov, A., and G\u00f6essel, M., Design of Self-Checking Unidirectional Combinational Circuits with Low Area Overhead, Proc. IEEE Int. On-Line Testing Workshop (IOLTW), Biarritz, France, 1996, pp. 56\u201367."},{"issue":"4","key":"349_CR14","doi-asserted-by":"publisher","first-page":"333","DOI":"10.1155\/1998\/20389","volume":"5","author":"A. Morosov","year":"1998","unstructured":"Morosov, A., Saposhnikov, V.V., Saposhnikov, Vl.V., and Goessel, M., Self-Checking Combinational Circuits with Unidirectionally Independent Outputs, VLSI Design, 1998, vol. 5, no. 4, pp. 333\u2013345.","journal-title":"VLSI Design"},{"issue":"1\u20132","key":"349_CR15","first-page":"41","volume":"12","author":"V.V. Saposhnikov","year":"1998","unstructured":"Saposhnikov, V.V., Morosov, A., Saposhnikov, Vl.V., and G\u00f6essel, M., A New Design Method for Self-Checking Unidirectional Combinational Circuits, J. Electron. Testing: Theory Appl., 1998, vol. 12, nos. 1\u20132 (February\/April), pp. 41\u201353.","journal-title":"J. Electron. Testing: Theory Appl"},{"key":"349_CR16","first-page":"141","volume-title":"6th IEEE Int. On-Line Testing Workshop, Palma de Mallorca, Spain","author":"A. Morozov","year":"2000","unstructured":"Morozov, A., Saposhnikov, V.V., Saposhnikov, Vl.V., and Goessel, M., New Self-Checking Circuits by Use of Berger-codes, 6th IEEE Int. On-Line Testing Workshop, Palma de Mallorca, Spain, 2000, pp. 141\u2013146."},{"key":"349_CR17","volume-title":"New Methods of Concurrent Checking","author":"M. G\u00f6essel","year":"2008","unstructured":"G\u00f6essel, M., Ocheretny, V., Sogomonyan, E., and Marienfeld, D., New Methods of Concurrent Checking, Dordrecht: Springer Science+Business Media B.V., 2008, 1st ed."},{"key":"349_CR18","first-page":"179","volume-title":"Proc. 8 Ann. Int. Conf. Fault-Tolerant Comput., Toulouse","author":"M.A. Marouf","year":"1978","unstructured":"Marouf, M.A. and Friedman, A.D., Design of Self-Checking Checkers for Berger Codes, Proc. 8 Ann. Int. Conf. Fault-Tolerant Comput., Toulouse, 1978, vol. C-27, pp. 179\u2013183."},{"issue":"2","key":"349_CR19","first-page":"85","volume":"XXII","author":"A.G. Mel\u2019nikov","year":"1986","unstructured":"Mel\u2019nikov, A.G., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Synthesis of Self-Checking Checkers for Summation Codes, Probl. Peredachi Inf., 1986, vol. XXII, no. 2, pp. 85\u201397.","journal-title":"Probl. Peredachi Inf"},{"key":"349_CR20","volume-title":"Design of Self-Testing Checkers for Unidirectional Error Detecting Codes","author":"S.J. Piestrak","year":"1995","unstructured":"Piestrak, S.J., Design of Self-Testing Checkers for Unidirectional Error Detecting Codes, Wroc-law: Oficyna Wydawnicza Politechniki Wroc-lavskiej, 1995"},{"issue":"2","key":"349_CR21","first-page":"280","volume":"35","author":"E.S. Sogomonyan","year":"1974","unstructured":"Sogomonyan, E.S., Design of Built-In Self-Checking Monitoring Circuits for Combinational Devices, Autom. Remote Control, 1974, vol. 35, no. 2, part 2, pp. 280\u2013289.","journal-title":"Autom. Remote Control"},{"key":"349_CR22","doi-asserted-by":"publisher","first-page":"19","DOI":"10.1007\/BF00971960","volume":"5","author":"F.Y. Busaba","year":"1994","unstructured":"Busaba, F.Y. and Lala, P.K., Self-Checking Combinational Circuit Design for Single and Unidirectional Multibit Errors, J. Electron. Testing: Theory Appl., 1994, no. 5, pp. 19\u201328.","journal-title":"J. Electron. Testing: Theory Appl"},{"key":"349_CR23","first-page":"745","volume":"16","author":"V. Saposhnikov","year":"1999","unstructured":"Saposhnikov, V., Saposhnikov, Vl., Goessel, M., and Morosov, A., A Method of Construction of Combinational Self-Checking Units with Detection of all Single Faults, Eng. Simul., 1999, vol. 16, pp. 745\u2013756.","journal-title":"Eng. Simul"},{"key":"349_CR24","doi-asserted-by":"publisher","first-page":"1026","DOI":"10.1109\/TC.1985.1676535","volume":"C-34","author":"B. Bose","year":"1985","unstructured":"Bose, B. and Lin, D.J., Systematic Unidirectional Error-Detection Codes, IEEE Trans. Comput., 1985, vol. C-34. Nov, pp. 1026\u20131032.","journal-title":"IEEE Trans. Comput"},{"key":"349_CR25","first-page":"172","volume-title":"Proc. 3rd IEEE Int. On-Line Testing Workshop","author":"X. Kavousianos","year":"1998","unstructured":"Kavousianos, X. and Nikolos, D., Novel TSC Checkers for Bose-Lin and Bose Codes, Proc. 3rd IEEE Int. On-Line Testing Workshop, July 6\u20138, 1998, Capry, Italy, pp. 172\u2013176."},{"issue":"6","key":"349_CR26","doi-asserted-by":"publisher","first-page":"1117","DOI":"10.1134\/S0005117910060123","volume":"71","author":"D.V. Efanov","year":"2010","unstructured":"Efanov, D.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., On Summation Code Properties in Functional Control Circuits, Autom. Remote Control, 2010, vol. 71, no. 6, pp. 1117\u20131123.","journal-title":"Autom. Remote Control"},{"key":"349_CR27","first-page":"114","volume-title":"Proc. 10 IEEE East-West Design & Test Symposium (EWDTS\u20182012), Kharkov, Ukraine","author":"A. Blyudov","year":"2012","unstructured":"Blyudov, A., Efanov, D., Sapozhnikov, V., and Sapozhnikov, Vl., Properties of Code with Summation for Logical Circuit Test Organization, Proc. 10 IEEE East-West Design & Test Symposium (EWDTS\u20182012), Kharkov, Ukraine, September 14\u201317, 2012, pp. 114\u2013117."},{"issue":"6","key":"349_CR28","doi-asserted-by":"publisher","first-page":"1020","DOI":"10.1134\/S0005117913060118","volume":"74","author":"A.A. Blyudov","year":"2013","unstructured":"Blyudov, A.A., Efanov, D.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Summation Codes for Organization of Control of Combinational Circuits, Autom. Remote Control, 2013, vol. 74, no. 6, pp. 1020\u20131028.","journal-title":"Autom. Remote Control"},{"issue":"6","key":"349_CR29","first-page":"17","volume":"34","author":"A.A. Blyudov","year":"2012","unstructured":"Blyudov, A.A., Efanov, D.V., Sapozhnikov, V.V., and Sapozhnikov, Vl.V., Construction of a Modified Berger Code with Minimal Number of Undetectable Errors in Information Bits, Elektron. Modelir., 2012, vol. 34, no. 6, pp. 17\u201329.","journal-title":"Elektron. Modelir"},{"key":"349_CR30","first-page":"315","volume-title":"Proc. 23rd IEEE VLSI Test Sympos","author":"S. Ghosh","year":"2005","unstructured":"Ghosh, S., Basu, S., and Touba, N.A., Synthesis of Low Power CED Circuits Based on Parity Codes, Proc. 23rd IEEE VLSI Test Sympos. (VTS\u201905), 2005, pp. 315\u2013320."},{"key":"349_CR31","doi-asserted-by":"publisher","DOI":"10.1002\/0471792748","volume-title":"Code Design for Dependable Systems: Theory and Practical Applications","author":"E. Fujiwara","year":"2006","unstructured":"Fujiwara, E., Code Design for Dependable Systems: Theory and Practical Applications, New York: Wiley, 2006"},{"key":"349_CR32","volume-title":"Osnovy tekhnicheskoi diagnostiki (Foundations of Technical Diagnostics)","author":"V.V. Sapozhnikov","year":"2004","unstructured":"Sapozhnikov, V.V. and Sapozhnikov, Vl.V., Osnovy tekhnicheskoi diagnostiki (Foundations of Technical Diagnostics), Moscow: Marshrut, 2004."}],"container-title":["Automation and Remote Control"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1134\/S0005117915100112.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1134\/S0005117915100112","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1134\/S0005117915100112","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1134\/S0005117915100112.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,15]],"date-time":"2026-03-15T22:25:07Z","timestamp":1773613507000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1134\/S0005117915100112"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":32,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2015,10]]}},"alternative-id":["349"],"URL":"https:\/\/doi.org\/10.1134\/s0005117915100112","relation":{},"ISSN":["0005-1179","1608-3032"],"issn-type":[{"value":"0005-1179","type":"print"},{"value":"1608-3032","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,10]]},"assertion":[{"value":"19 November 2013","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"21 October 2015","order":2,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}