{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T19:52:29Z","timestamp":1649101949883},"reference-count":10,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2008,1,1]],"date-time":"2008-01-01T00:00:00Z","timestamp":1199145600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Eur. Phys. J. Spec. Top."],"published-print":{"date-parts":[[2008,1]]},"DOI":"10.1140\/epjst\/e2008-00451-3","type":"journal-article","created":{"date-parts":[[2008,3,11]],"date-time":"2008-03-11T18:12:50Z","timestamp":1205259170000},"page":"303-306","source":"Crossref","is-referenced-by-count":1,"title":["Thermal characterization of TiCxOy thin films"],"prefix":"10.1140","volume":"153","author":[{"given":"A. C.","family":"Fernandes","sequence":"first","affiliation":[]},{"given":"F.","family":"Vaz","sequence":"additional","affiliation":[]},{"given":"A.","family":"G\u00f6ren","sequence":"additional","affiliation":[]},{"given":"K. H.","family":"Junge","sequence":"additional","affiliation":[]},{"given":"J.","family":"Gibkes","sequence":"additional","affiliation":[]},{"given":"B. K.","family":"Bein","sequence":"additional","affiliation":[]},{"given":"F.","family":"Macedo","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"2008451_CR1","unstructured":"D. Fournier, J.P. Roger, A. Bellouati, C. Bou\u00e9, H. Stamm, F. Lakestani, Anal. Sci. 17, S158 (2001) (special issue)"},{"key":"2008451_CR2","doi-asserted-by":"crossref","unstructured":"A. Mani, P. Aubert, F. Mercier, H. Khodja, C. Berthier, P. Houdy, Surf. Coat. Technol. 194, 190 (2005)","DOI":"10.1016\/j.surfcoat.2004.06.017"},{"key":"2008451_CR3","doi-asserted-by":"crossref","unstructured":"M. Nakamura, S. Kato, T. Aoki, L. Sirghi, Y. Hatanaka, Thin Solid Films 401, 138 (2001)","DOI":"10.1016\/S0040-6090(01)01637-6"},{"key":"2008451_CR4","doi-asserted-by":"crossref","unstructured":"E. Kusano, A. Satoh, M. Kitagawa, H. Nanto, A. Kinbara, Thin Solid Films 343, 254 (1999)","DOI":"10.1016\/S0040-6090(98)01638-1"},{"key":"2008451_CR5","doi-asserted-by":"crossref","unstructured":"M. Staber, H. Leiste, S. Ulrich, H. Hollek, D. Schild, Surf. Coat. Technol. 150, 218 (2002)","DOI":"10.1016\/S0257-8972(01)01493-1"},{"key":"2008451_CR6","doi-asserted-by":"crossref","unstructured":"S. Inoue, Y. Wada, K. Koterazawa, Vacuum 59, 735 (2000)","DOI":"10.1016\/S0042-207X(00)00341-9"},{"key":"2008451_CR7","doi-asserted-by":"crossref","unstructured":"J. Bolte, J.H. Gu, B.K. Bein, High Temp.-High Press. 29, 567 (1997)","DOI":"10.1068\/htec49"},{"key":"2008451_CR8","doi-asserted-by":"crossref","unstructured":"J.L. Nzodoum-Fotsing, J. Gibkes, J. Pelzl, B.K. Bein, J. Appl. Phys. 98, 063522, 1 (2005)","DOI":"10.1063\/1.2058180"},{"key":"2008451_CR9","doi-asserted-by":"crossref","unstructured":"F. Macedo, F. Vaz, A.C. Fernandes, L. Rebouta, S. Carvalho, K.H. Junge, B.K. Bein, Plasma Process. Polym. 4, S190 (2007)","DOI":"10.1002\/ppap.200730609"},{"key":"2008451_CR10","doi-asserted-by":"crossref","unstructured":"F. Macedo, F. Vaz, L. Rebouta, P. Carvalho, A. Haj-Daoud, K.H. Junge, J. Pelzl, B.K. Bein, Modulated IR radiometry of (TiSi)N thin films, Proceedings RIVA 2005, in Vacuum (2007) (accepted)","DOI":"10.1016\/j.vacuum.2008.03.066"}],"container-title":["The European Physical Journal Special Topics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1140\/epjst\/e2008-00451-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1140\/epjst\/e2008-00451-3\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1140\/epjst\/e2008-00451-3","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,11,5]],"date-time":"2019-11-05T03:11:17Z","timestamp":1572923477000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1140\/epjst\/e2008-00451-3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":10,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2008,1]]}},"alternative-id":["2008451"],"URL":"https:\/\/doi.org\/10.1140\/epjst\/e2008-00451-3","relation":{},"ISSN":["1951-6355","1951-6401"],"issn-type":[{"value":"1951-6355","type":"print"},{"value":"1951-6401","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,1]]}}}