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We have evaluated the proposed IED detector on a sizable database of 554 scalp EEG recordings (84 epileptic patients and 461 nonepileptic subjects) recorded at Massachusetts General Hospital (MGH), Boston. The proposed CNN IED detector has achieved superior performance in comparison with conventional methods with a mean cross-validation area under the precision\u2013recall curve (AUPRC) of 0.838[Formula: see text]\u00b1[Formula: see text]0.040 and false detection rate of 0.2[Formula: see text]\u00b1[Formula: see text]0.11 per minute for a sensitivity of 80%. We demonstrated the proposed system to be noninferior to 30 neurologists on a dataset from the Medical University of South Carolina (MUSC). Further, we clinically validated the system at National University Hospital (NUH), Singapore, with an agreement accuracy of 81.41% with a clinical expert. Moreover, the proposed system can be applied to EEG recordings with any arbitrary number of channels. <\/jats:p>","DOI":"10.1142\/s0129065720500306","type":"journal-article","created":{"date-parts":[[2020,3,30]],"date-time":"2020-03-30T07:02:55Z","timestamp":1585551775000},"page":"2050030","source":"Crossref","is-referenced-by-count":75,"title":["Automated Detection of Interictal Epileptiform Discharges from Scalp Electroencephalograms by Convolutional Neural Networks"],"prefix":"10.1142","volume":"30","author":[{"given":"John","family":"Thomas","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Prasanth","family":"Thangavel","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Elham","family":"Bagheri","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rajamanickam","family":"Yuvaraj","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Justin","family":"Dauwels","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rahul","family":"Rathakrishnan","sequence":"additional","affiliation":[{"name":"Division of Neurology, National University Hospital, Singapore 119074, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jonathan J.","family":"Halford","sequence":"additional","affiliation":[{"name":"Department of Neurology, Medical University of South Carolina, Charleston, SC 29425, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sydney S.","family":"Cash","sequence":"additional","affiliation":[{"name":"Department of Neurology, Massachusetts General Hospital, Boston, MA 02114, USA"},{"name":"Harvard Medical School, Boston, MA 02115, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Brandon","family":"Westover","sequence":"additional","affiliation":[{"name":"Department of Neurology, Massachusetts General Hospital, Boston, MA 02114, USA"},{"name":"Harvard Medical School, Boston, MA 02115, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"219","published-online":{"date-parts":[[2020,8,19]]},"reference":[{"key":"S0129065720500306BIB001","doi-asserted-by":"crossref","first-page":"689","DOI":"10.1016\/S0140-6736(18)32596-0","volume":"393","author":"Thijs R. 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