{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T11:45:12Z","timestamp":1648640712699},"reference-count":17,"publisher":"World Scientific Pub Co Pte Lt","issue":"06","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2014,9]]},"abstract":"<jats:p> Locally linear embedding (LLE) depends on the Euclidean distance (ED) to select the k-nearest neighbors. However, the ED may not reflect the actual geometry structure of data, which may lead to the selection of ineffective neighbors. The aim of our work is to make full use of the local spectral angle (LSA) to find proper neighbors for dimensionality reduction (DR) and classification of hyperspectral remote sensing data. At first, we propose an improved LLE method, called local spectral angle LLE (LSA-LLE), for DR. It uses the ED of data to obtain large-scale neighbors, then utilizes the spectral angle to get the exact neighbors in the large-scale neighbors. Furthermore, a local spectral angle-based nearest neighbor classifier (LSANN) has been proposed for classification. Experiments on two hyperspectral image data sets demonstrate the effectiveness of the presented methods. <\/jats:p>","DOI":"10.1142\/s0218001414500165","type":"journal-article","created":{"date-parts":[[2014,7,7]],"date-time":"2014-07-07T07:30:43Z","timestamp":1404718243000},"page":"1450016","source":"Crossref","is-referenced-by-count":1,"title":["HYPERSPECTRAL IMAGE CLASSIFICATION USING LOCAL SPECTRAL ANGLE-BASED MANIFOLD LEARNING"],"prefix":"10.1142","volume":"28","author":[{"given":"FULIN","family":"LUO","sequence":"first","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, P. R. China"}]},{"given":"JIAMIN","family":"LIU","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, P. R. China"}]},{"given":"HONG","family":"HUANG","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, P. R. China"},{"name":"Technical Center of Chongqing Chuanyi Automation Co., Ltd., Chongqing 401121, P. R. China"}]},{"given":"YUMEI","family":"LIU","sequence":"additional","affiliation":[{"name":"Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, P. R. China"}]}],"member":"219","published-online":{"date-parts":[[2014,9,21]]},"reference":[{"key":"rf1","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2011.05.011"},{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.842292"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1162\/089976603321780317"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1117\/1.2723663"},{"key":"rf5","first-page":"1992","volume":"36","author":"Chen D.","year":"2008","journal-title":"Acta Electron. 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