{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T06:43:41Z","timestamp":1740120221501,"version":"3.37.3"},"reference-count":18,"publisher":"World Scientific Pub Co Pte Ltd","issue":"11","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2018,11]]},"abstract":"<jats:p> This paper introduces a new calibration method for the mapping camera called Precise Grouped Approach Method (PGAM). The conventional calibration method for the mapping camera is the exact measuring angle method. The accuracy of this method can be reduced by theoretical uncertainties and the number and distribution of observation points. PGAM is able to overcome these disadvantages and improve the accuracy. Firstly, we reduce the theoretical uncertainties by means of a grouped approach method, which rectifies the high-precision rotation stage to zero position. Secondly, a weighted theory is applied to eliminate the effect of the number and distribution of observation points. Finally, the accuracy of PGAM is analyzed. The experiment result shows that the calibration accuracy is significantly improved when using the proposed PGAM algorithm, compared to the conventional one under the identical experimental condition. <\/jats:p>","DOI":"10.1142\/s0218001418550194","type":"journal-article","created":{"date-parts":[[2018,5,14]],"date-time":"2018-05-14T22:17:06Z","timestamp":1526336226000},"page":"1855019","source":"Crossref","is-referenced-by-count":3,"title":["Calibration Method for Mapping Camera Based on a Precise Grouped Approach Method"],"prefix":"10.1142","volume":"32","author":[{"given":"Lina","family":"Zheng","sequence":"first","affiliation":[{"name":"Key Laboratory of Airborne Optical Imaging and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Science, Changchun 130033, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4723-7262","authenticated-orcid":false,"given":"Guoqin","family":"Yuan","sequence":"additional","affiliation":[{"name":"Key Laboratory of Airborne Optical Imaging and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Science, Changchun 130033, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xue","family":"Leng","sequence":"additional","affiliation":[{"name":"Changguang Insight Vision Opto-Electronic Co., Ltd., Changchun 130033, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yingfeng","family":"Wu","sequence":"additional","affiliation":[{"name":"BMW China Service Ltd., Shenyang 110000, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2018,7,24]]},"reference":[{"key":"S0218001418550194BIB001","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.020241"},{"issue":"3","key":"S0218001418550194BIB002","first-page":"298","volume":"40","author":"Bo L.","year":"2010","journal-title":"Laser and Infrared"},{"key":"S0218001418550194BIB003","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001415550010"},{"issue":"10","key":"S0218001418550194BIB004","first-page":"1628","volume":"15","author":"Guodong W.","year":"2007","journal-title":"Opto-Electron. Eng."},{"key":"S0218001418550194BIB005","volume-title":"Multiple View Geometry in Computer Vision","author":"Hartley R.","year":"2003","edition":"2"},{"key":"S0218001418550194BIB006","first-page":"1","volume":"2067","author":"Hong F.","year":"1993","journal-title":"SPIE"},{"issue":"2","key":"S0218001418550194BIB007","first-page":"50","volume":"2","author":"Lee J.-S.","year":"2000","journal-title":"IEEE Int. Conf. Sci. Technol."},{"key":"S0218001418550194BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/34.6781"},{"issue":"9","key":"S0218001418550194BIB009","first-page":"2086","volume":"18","author":"Weiyi L.","year":"2010","journal-title":"Opto-Electron. Eng."},{"key":"S0218001418550194BIB010","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001416550193"},{"issue":"4","key":"S0218001418550194BIB011","first-page":"323","volume":"3","author":"Tsai R. Y.","year":"1987","journal-title":"IEEE JRA"},{"key":"S0218001418550194BIB012","doi-asserted-by":"publisher","DOI":"10.1142\/S0218001417500094"},{"issue":"6","key":"S0218001418550194BIB013","first-page":"465","volume":"26","author":"Zhihe W.","year":"2007","journal-title":"J. Infrared Millim. Waves"},{"key":"S0218001418550194BIB014","unstructured":"W. Zhizhuo ,  The Principle of Photogrammetry  (Wuhan University Press,  Wuhan,  2007), pp.  240\u2013253."},{"issue":"4","key":"S0218001418550194BIB015","first-page":"705","volume":"38","author":"Weiyi L.","year":"2009","journal-title":"Infrared Laser Eng."},{"key":"S0218001418550194BIB016","unstructured":"M. Yingtai ,  Error Theory and Precision Analysis  (National Defence Industry Press,  Beijing,  1982), pp.  20\u2013230."},{"key":"S0218001418550194BIB017","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"S0218001418550194BIB018","unstructured":"D. Zhenliang ,  Error Theory and Data Processing  (Harbin Institute of Technology Press,  Harbin,  2006), pp.  46\u2013184."}],"container-title":["International Journal of Pattern Recognition and Artificial Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218001418550194","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T14:06:41Z","timestamp":1565186801000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218001418550194"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7,24]]},"references-count":18,"journal-issue":{"issue":"11","published-online":{"date-parts":[[2018,7,24]]},"published-print":{"date-parts":[[2018,11]]}},"alternative-id":["10.1142\/S0218001418550194"],"URL":"https:\/\/doi.org\/10.1142\/s0218001418550194","relation":{},"ISSN":["0218-0014","1793-6381"],"issn-type":[{"type":"print","value":"0218-0014"},{"type":"electronic","value":"1793-6381"}],"subject":[],"published":{"date-parts":[[2018,7,24]]}}}