{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,20]],"date-time":"2025-10-20T10:25:57Z","timestamp":1760955957029,"version":"3.37.3"},"reference-count":19,"publisher":"World Scientific Pub Co Pte Ltd","issue":"03","funder":[{"DOI":"10.13039\/501100001809","name":"the National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61672259","61876070","61602203"],"award-info":[{"award-number":["61672259","61876070","61602203"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"National Science Foundation of Jilin Province","award":["20170520064JH","20180520020JH"],"award-info":[{"award-number":["20170520064JH","20180520020JH"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2020,3]]},"abstract":"<jats:p> With the rapid development of digital phones, the digital image forensics system in current times has had a great impact. It will lead to a serious threat for us, and especially the emergence of the recaptured image makes the existing digital image forensics algorithm invalid. So, it needs an effective image detection algorithm for us to identify recaptured images. In this paper, a new detection algorithm of the recaptured image is presented based on gray level co-occurrence matrix by analyzing the differences between the real and recaptured images. In order to analyze the differences, a new image evaluation model was put forward in this paper, which is called image variance ratio. Firstly, the algorithm proposed extracted high-frequency and low-frequency information of images by wavelet transform, based on which we calculated the relative gray level co-occurrence matrices. Secondly, the features of gray level co-occurrence matrix were extracted. At last, the recaptured image was classified by the support vector machine according to the features. The experimental results showed the algorithm proposed can not only effectively identify the recaptured image obtained from different media but also have better identification rate. <\/jats:p>","DOI":"10.1142\/s0218001420540117","type":"journal-article","created":{"date-parts":[[2019,5,14]],"date-time":"2019-05-14T06:23:17Z","timestamp":1557814997000},"page":"2054011","source":"Crossref","is-referenced-by-count":12,"title":["Recaptured Image Forensics Algorithm Based on Image Texture Feature"],"prefix":"10.1142","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5747-4966","authenticated-orcid":false,"given":"Yanjun","family":"Sun","sequence":"first","affiliation":[{"name":"College of Computer Science and Technology, Jilin University, Changchun 130022, P.\u00a0R.\u00a0China"},{"name":"Symbol Computation and Knowledge, Engineer of Ministry of Education, Changchun 130022, P.\u00a0R.\u00a0China"},{"name":"Air Force Aviation University Computer Department, Changchun 130022, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuanjing","family":"Shen","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, Jilin University, Changchun 130022, P.\u00a0R.\u00a0China"},{"name":"Symbol Computation and Knowledge, Engineer of Ministry of Education, Changchun 130022, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Changming","family":"Liu","sequence":"additional","affiliation":[{"name":"Air Force Aviation University Computer Department, Changchun 130022, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongzhe","family":"Zhao","sequence":"additional","affiliation":[{"name":"College of Computer Science and Technology, Jilin University, Changchun 130022, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,7,22]]},"reference":[{"issue":"3","key":"S0218001420540117BIB001","first-page":"1790","volume":"23","author":"Cao H.","year":"2010","journal-title":"IEEE Int. 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