{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T16:45:50Z","timestamp":1782405950008,"version":"3.54.5"},"reference-count":34,"publisher":"World Scientific Pub Co Pte Ltd","issue":"07","funder":[{"name":"Special Major Project of the Ministry of Science and Technology of Hubei Province of China","award":["2016AAA056"],"award-info":[{"award-number":["2016AAA056"]}]},{"name":"Major project of Hubei Provincial Department of Education","award":["Z20101501"],"award-info":[{"award-number":["Z20101501"]}]},{"name":"Research foundation for the returned Overseas Chinese Scholars of State Education Ministry","award":["20091001"],"award-info":[{"award-number":["20091001"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["51775390"],"award-info":[{"award-number":["51775390"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2020,6,30]]},"abstract":"<jats:p> A new method about the multi-fault condition monitoring of slurry pump based on principal component analysis (PCA) and sequential probability ratio test (SPRT) is proposed. The method identifies the condition of the slurry pump by analyzing the vibration signal. The experimental model is established using the normal impeller and the faulty impellers where the collected vibration signals were preprocessed using wavelet packet transform (WPT). The characteristic parameters of the vibration signals are extracted by time domain signal analysis and the dimension of data was reduced by PCA. The principal components with the largest contribution rate are chosen as the inputted signal to SPRT to assess the proposed algorithm. The new methodology is reasonable and practical for the multi-fault diagnosis of slurry pump. <\/jats:p>","DOI":"10.1142\/s0218001420590193","type":"journal-article","created":{"date-parts":[[2019,8,13]],"date-time":"2019-08-13T02:34:00Z","timestamp":1565663640000},"page":"2059019","source":"Crossref","is-referenced-by-count":49,"title":["Multi-fault Condition Monitoring of Slurry Pump with Principle Component Analysis and Sequential Hypothesis Test"],"prefix":"10.1142","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6740-9287","authenticated-orcid":false,"given":"Hanxin","family":"Chen","sequence":"first","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"},{"name":"Hubei Provincial Key Laboratory of Chemical Equipment, Intensification and Intrinsic Safety, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenjian","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jinmin","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chenghao","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liu","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yibin","family":"He","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"},{"name":"Hubei Provincial Key Laboratory of Chemical Equipment, Intensification and Intrinsic Safety, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Li","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, P. R. China"},{"name":"Hubei Provincial Key Laboratory of Chemical Equipment, Intensification and Intrinsic Safety, Wuhan Institute of Technology, Wuhan 430073, P. R. China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"219","published-online":{"date-parts":[[2019,10,11]]},"reference":[{"key":"S0218001420590193BIB001","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)CP.1943-5487.0000734"},{"key":"S0218001420590193BIB002","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/598490"},{"key":"S0218001420590193BIB003","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.06.023"},{"issue":"2","key":"S0218001420590193BIB004","first-page":"1","volume":"55","author":"Chen H. X.","year":"2013","journal-title":"Insight, Non-Destr. Test. Cond. Monit."},{"key":"S0218001420590193BIB005","first-page":"656","volume-title":"IEEE Int. Conf. Data Driven Control and Learning Systems","author":"Ding J."},{"key":"S0218001420590193BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2007.897053"},{"key":"S0218001420590193BIB007","doi-asserted-by":"publisher","DOI":"10.1142\/S0129183118500079"},{"key":"S0218001420590193BIB008","first-page":"4035","volume":"32","author":"Hou M. X.","year":"2014","journal-title":"J. Lightwave"},{"key":"S0218001420590193BIB009","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)AS.1943-5525.0000829"},{"key":"S0218001420590193BIB010","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-1904-8"},{"key":"S0218001420590193BIB011","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.11.029"},{"key":"S0218001420590193BIB012","doi-asserted-by":"publisher","DOI":"10.1049\/el.2017.4613"},{"key":"S0218001420590193BIB013","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.430-432.1163"},{"key":"S0218001420590193BIB014","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa50df"},{"key":"S0218001420590193BIB015","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2016.02.014"},{"key":"S0218001420590193BIB016","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2768078"},{"issue":"3","key":"S0218001420590193BIB017","first-page":"152","volume":"17","author":"Muralidharan V.","year":"2014","journal-title":"Eng. Sci. Technol."},{"key":"S0218001420590193BIB018","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.sigpro.2014.07.030","volume":"108","author":"Qin Y.","year":"2015","journal-title":"Eurasip J. Adv. Signal Process."},{"key":"S0218001420590193BIB019","doi-asserted-by":"publisher","DOI":"10.1115\/1.3153054"},{"key":"S0218001420590193BIB020","doi-asserted-by":"publisher","DOI":"10.1115\/1.4039344"},{"key":"S0218001420590193BIB021","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2673959"},{"key":"S0218001420590193BIB022","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177731118"},{"key":"S0218001420590193BIB023","volume-title":"Sequential Analysis","author":"Wald A.","year":"1947"},{"key":"S0218001420590193BIB024","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2018.01.035"},{"key":"S0218001420590193BIB025","doi-asserted-by":"publisher","DOI":"10.1080\/15732479.2015.1076852"},{"key":"S0218001420590193BIB026","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2015.07.025"},{"issue":"6","key":"S0218001420590193BIB027","first-page":"5808","volume":"2014","author":"Xu C. J.","year":"2014","journal-title":"Math. Probl. Eng."},{"key":"S0218001420590193BIB028","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2018.04.012"},{"key":"S0218001420590193BIB029","author":"Yang L.","year":"2018","journal-title":"Neural Comput. Appl."},{"key":"S0218001420590193BIB030","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/3435751"},{"key":"S0218001420590193BIB031","doi-asserted-by":"publisher","DOI":"10.1016\/j.apor.2018.09.006"},{"key":"S0218001420590193BIB032","doi-asserted-by":"publisher","DOI":"10.1109\/ICNC.2010.5583233"},{"key":"S0218001420590193BIB033","doi-asserted-by":"publisher","DOI":"10.1016\/j.corsci.2018.08.045"},{"key":"S0218001420590193BIB034","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2018.07.049"}],"container-title":["International Journal of Pattern Recognition and Artificial Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218001420590193","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T09:52:38Z","timestamp":1593510758000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218001420590193"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10,11]]},"references-count":34,"journal-issue":{"issue":"07","published-print":{"date-parts":[[2020,6,30]]}},"alternative-id":["10.1142\/S0218001420590193"],"URL":"https:\/\/doi.org\/10.1142\/s0218001420590193","relation":{},"ISSN":["0218-0014","1793-6381"],"issn-type":[{"value":"0218-0014","type":"print"},{"value":"1793-6381","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,10,11]]}}}