{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,13]],"date-time":"2025-11-13T12:45:04Z","timestamp":1763037904950,"version":"3.41.2"},"reference-count":44,"publisher":"World Scientific Pub Co Pte Ltd","issue":"11","funder":[{"DOI":"10.13039\/501100004479","name":"Natural Science Foundation of Jiangxi Province","doi-asserted-by":"publisher","award":["20224BAB202033"],"award-info":[{"award-number":["20224BAB202033"]}],"id":[{"id":"10.13039\/501100004479","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013064","name":"Key Research and Development Program of Jiangxi Province","doi-asserted-by":"publisher","award":["20192BBE50015"],"award-info":[{"award-number":["20192BBE50015"]}],"id":[{"id":"10.13039\/501100013064","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2023,9,15]]},"abstract":"<jats:p> The welding defect classification method based on deep learning often faces problems such as insufficient training data and complex model structures, which affect its real-time performance. Therefore, a welding defect classification method based on lightweight convolutional neural network (CNN) is proposed. The problems of insufficient and unbalanced welding defect image are solved by using the generative adversarial networks (GANs) data augmentation method. A lightweight CNN model is developed, which reduces the structural parameters under the premise of ensuring classification accuracy. The feature data of each convolution layer are visualized to verify the feasibility of the model and improve the interpretability of the model. By comparing the accuracy and real-time performance with other lightweight models, the excellent performance of the proposed model in welding defect classification is verified. Additionally, our model achieves 98.25% accuracy on the MNIST dataset. <\/jats:p>","DOI":"10.1142\/s021800142350026x","type":"journal-article","created":{"date-parts":[[2023,8,18]],"date-time":"2023-08-18T01:42:01Z","timestamp":1692322921000},"source":"Crossref","is-referenced-by-count":8,"title":["Welding Defect Classification Based on Lightweight CNN"],"prefix":"10.1142","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0815-0583","authenticated-orcid":false,"given":"Bo","family":"Guo","sequence":"first","affiliation":[{"name":"Nanchang Key Laboratory of Welding Robot & Intelligent Technology, Nanchang Institute of Technology, Nanchang 330099, P. R. China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-9138-235X","authenticated-orcid":false,"given":"Youtao","family":"Wang","sequence":"additional","affiliation":[{"name":"Jiangxi General Institute of Testing and Certification, Nanchang 330052, P. R. China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-9576-2502","authenticated-orcid":false,"given":"Xu","family":"Li","sequence":"additional","affiliation":[{"name":"Nanchang Key Laboratory of Welding Robot & Intelligent Technology, Nanchang Institute of Technology, Nanchang 330099, P. R. China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6458-3245","authenticated-orcid":false,"given":"Yeping","family":"Zhou","sequence":"additional","affiliation":[{"name":"Jiangxi General Institute of Testing and Certification, Nanchang 330052, P. R. China"}]},{"given":"Jianmin","family":"Li","sequence":"additional","affiliation":[{"name":"Jiangxi Hengda Hi-Tech Co., Ltd., Nanchang 330096, P. R. China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4583-4193","authenticated-orcid":false,"given":"Lanxiang","family":"Rao","sequence":"additional","affiliation":[{"name":"Jiangxi Science and Technology Infrastructure Platform Center, Nanchang 330003, P. R. China"}]}],"member":"219","published-online":{"date-parts":[[2023,9,14]]},"reference":[{"key":"S021800142350026XBIB001","doi-asserted-by":"crossref","first-page":"603","DOI":"10.1016\/j.jmapro.2019.07.020","volume":"45","author":"Bacioiu D.","year":"2019","journal-title":"J. Manuf. Process."},{"key":"S021800142350026XBIB002","first-page":"1","volume":"70","author":"Chang Y.","year":"2021","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"S021800142350026XBIB003","doi-asserted-by":"crossref","first-page":"2351004","DOI":"10.1142\/S0218001423510047","volume":"37","author":"Chin C. L.","year":"2023","journal-title":"Int. J. Pattern Recognit. Artif. Intell."},{"issue":"01","key":"S021800142350026XBIB004","doi-asserted-by":"crossref","first-page":"2054002","DOI":"10.1142\/S0218001420540026","volume":"34","author":"Daniel J.","year":"2020","journal-title":"Int. J. Pattern Recognit. Artif. Intell."},{"key":"S021800142350026XBIB005","doi-asserted-by":"crossref","first-page":"1381","DOI":"10.1016\/j.ins.2022.07.160","volume":"609","author":"Ding Y.","year":"2022","journal-title":"Inf. Sci."},{"key":"S021800142350026XBIB006","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1109\/TII.2019.2937563","volume":"16","author":"Feng Y.","year":"2019","journal-title":"IEEE Trans. Ind. Inf."},{"key":"S021800142350026XBIB007","first-page":"2627","volume":"31","author":"Ge D. H.","year":"2020","journal-title":"J. Softw."},{"key":"S021800142350026XBIB008","first-page":"193","volume":"33","author":"Ge Y.","year":"2022","journal-title":"J. Softw."},{"key":"S021800142350026XBIB009","doi-asserted-by":"crossref","first-page":"794","DOI":"10.1109\/LGRS.2018.2806945","volume":"15","author":"Ghamisi P.","year":"2018","journal-title":"IEEE Geosci. Remote Sens. Lett."},{"issue":"9","key":"S021800142350026XBIB010","doi-asserted-by":"crossref","first-page":"10844","DOI":"10.1109\/JSEN.2021.3059860","volume":"21","author":"Guo R.","year":"2021","journal-title":"IEEE Sens. J."},{"issue":"14","key":"S021800142350026XBIB011","doi-asserted-by":"crossref","first-page":"2252026","DOI":"10.1142\/S0218001422520267","volume":"36","author":"He L.","year":"2022","journal-title":"Int. J. Pattern Recognit. Artif. Intell."},{"key":"S021800142350026XBIB012","doi-asserted-by":"crossref","first-page":"472","DOI":"10.1109\/TIP.2020.3036770","volume":"30","author":"Hu B.","year":"2020","journal-title":"IEEE Trans. Image Process."},{"key":"S021800142350026XBIB013","first-page":"2740","volume-title":"Proc. IEEE\/CVF Int. Conf. Computer Vision (ICCV)","author":"Jang Y.","year":"2019"},{"key":"S021800142350026XBIB014","doi-asserted-by":"crossref","first-page":"84","DOI":"10.1145\/3065386","volume":"60","author":"Krizhevsky A.","year":"2017","journal-title":"Commun. ACM"},{"key":"S021800142350026XBIB015","doi-asserted-by":"crossref","first-page":"7393","DOI":"10.1007\/s00521-021-05826-w","volume":"33","author":"Kugelman J.","year":"2021","journal-title":"Neural Comput. Appl."},{"key":"S021800142350026XBIB016","doi-asserted-by":"crossref","first-page":"95097","DOI":"10.1109\/ACCESS.2021.3093487","volume":"9","author":"Kumaresan S.","year":"2021","journal-title":"IEEE Access"},{"issue":"7","key":"S021800142350026XBIB017","first-page":"1841","volume":"59","author":"Li Y.","year":"2009","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"S021800142350026XBIB018","doi-asserted-by":"crossref","first-page":"110645","DOI":"10.1016\/j.matdes.2022.110645","volume":"217","author":"Li Z.","year":"2022","journal-title":"Mater. Des."},{"issue":"8","key":"S021800142350026XBIB019","doi-asserted-by":"crossref","first-page":"2052004","DOI":"10.1142\/S0218001420520047","volume":"34","author":"Li Y.","year":"2020","journal-title":"Int. J. Pattern Recognit. Artif. Intell."},{"key":"S021800142350026XBIB020","first-page":"4","volume":"33","author":"Liang P.","year":"2012","journal-title":"Trans. China Weld. Inst."},{"key":"S021800142350026XBIB021","first-page":"2790","volume-title":"Proc. IEEE\/CVF Conf. Computer Vision and Pattern Recognition (CVPR)","author":"Lin S.","year":"2019"},{"key":"S021800142350026XBIB022","first-page":"1","volume":"71","author":"Liu J.","year":"2022","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"S021800142350026XBIB023","first-page":"1","volume":"71","author":"Liu Y.","year":"2022","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"S021800142350026XBIB024","first-page":"6069589","volume":"60","author":"Ma S.","year":"2022","journal-title":"Comput. Intell. Neurosci."},{"key":"S021800142350026XBIB025","doi-asserted-by":"crossref","first-page":"130","DOI":"10.1016\/j.jmapro.2020.12.067","volume":"64","author":"Ma G.","year":"2021","journal-title":"J. Manuf. Process."},{"key":"S021800142350026XBIB026","doi-asserted-by":"crossref","first-page":"8629","DOI":"10.3390\/app10238629","volume":"10","author":"Oh S.-J.","year":"2020","journal-title":"Appl. Sci."},{"key":"S021800142350026XBIB027","doi-asserted-by":"crossref","first-page":"4057","DOI":"10.1016\/j.aej.2021.02.052","volume":"60","author":"Radi D.","year":"2021","journal-title":"Alexandria Eng. J."},{"key":"S021800142350026XBIB028","first-page":"1","volume-title":"Proc. IEEE Conf. Computer Vision and Pattern Recognition (CVPR)","author":"Szegedy C.","year":"2015"},{"key":"S021800142350026XBIB029","doi-asserted-by":"crossref","first-page":"1495","DOI":"10.3390\/met10111495","volume":"10","author":"Wang Y.","year":"2020","journal-title":"Metals"},{"key":"S021800142350026XBIB030","doi-asserted-by":"crossref","first-page":"1645","DOI":"10.1007\/s40194-022-01323-3","volume":"66","author":"Wang Z.","year":"2022","journal-title":"Weld. World"},{"key":"S021800142350026XBIB031","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1080\/13621718.2022.2061691","volume":"27","author":"Wang X.","year":"2022","journal-title":"Sci. Technol. Weld. Join."},{"key":"S021800142350026XBIB032","first-page":"716","volume":"8","author":"Wu Q.","year":"2020","journal-title":"IEEE Access"},{"key":"S021800142350026XBIB033","first-page":"8","volume":"35","author":"Wu Y.","year":"2014","journal-title":"Trans. China Weld. Inst."},{"key":"S021800142350026XBIB034","doi-asserted-by":"crossref","first-page":"845","DOI":"10.1016\/j.jmapro.2020.05.033","volume":"56","author":"Xia C.","year":"2020","journal-title":"J. Manuf. Process."},{"key":"S021800142350026XBIB035","doi-asserted-by":"crossref","first-page":"551","DOI":"10.1007\/s00170-022-08811-2","volume":"120","author":"Xia C.","year":"2021","journal-title":"Int. J. Adv. Manuf. Technol."},{"issue":"5","key":"S021800142350026XBIB036","first-page":"1","volume":"84","author":"Xiao M.","year":"2022","journal-title":"J. Intell. Manuf."},{"key":"S021800142350026XBIB037","doi-asserted-by":"crossref","first-page":"103306","DOI":"10.1016\/j.compind.2020.103306","volume":"123","author":"Yang Y.","year":"2020","journal-title":"Comput. Ind."},{"key":"S021800142350026XBIB038","doi-asserted-by":"crossref","first-page":"164952","DOI":"10.1109\/ACCESS.2019.2953313","volume":"7","author":"Yang L.","year":"2019","journal-title":"IEEE Access"},{"key":"S021800142350026XBIB039","doi-asserted-by":"crossref","first-page":"033003","DOI":"10.1115\/1.4048052","volume":"143","author":"Zha W.","year":"2020","journal-title":"J. Energy Resour. Technol."},{"key":"S021800142350026XBIB040","doi-asserted-by":"crossref","first-page":"1574","DOI":"10.1109\/COASE.2019.8842998","volume-title":"2019 IEEE 15th Int. Conf. Automation Science and Engineering (CASE)","author":"Zhang H.","year":"2019"},{"key":"S021800142350026XBIB041","doi-asserted-by":"crossref","first-page":"208","DOI":"10.1016\/j.jmapro.2019.06.023","volume":"45","author":"Zhang Z.","year":"2019","journal-title":"J. Manuf. Process."},{"key":"S021800142350026XBIB042","first-page":"6848","volume-title":"2018 IEEE CVF Conf. Computer Vision and Pattern Recognition CVPR","author":"Zhang X.","year":"2018"},{"key":"S021800142350026XBIB043","first-page":"7","volume":"41","author":"Zhou X.","year":"2020","journal-title":"Trans. China Weld. Inst."},{"key":"S021800142350026XBIB044","doi-asserted-by":"crossref","first-page":"712","DOI":"10.1109\/DDCLS55054.2022.9858378","volume-title":"2022 IEEE 11th Data Driven Control and Learning Systems Conference (DDCLS)","author":"Zuo F.","year":"2022"}],"container-title":["International Journal of Pattern Recognition and Artificial Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S021800142350026X","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,2]],"date-time":"2023-10-02T01:45:32Z","timestamp":1696211132000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/10.1142\/S021800142350026X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,14]]},"references-count":44,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2023,9,15]]}},"alternative-id":["10.1142\/S021800142350026X"],"URL":"https:\/\/doi.org\/10.1142\/s021800142350026x","relation":{},"ISSN":["0218-0014","1793-6381"],"issn-type":[{"type":"print","value":"0218-0014"},{"type":"electronic","value":"1793-6381"}],"subject":[],"published":{"date-parts":[[2023,9,14]]},"article-number":"2350026"}}