{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T23:44:19Z","timestamp":1783381459392,"version":"3.54.6"},"reference-count":79,"publisher":"World Scientific Pub Co Pte Ltd","issue":"14","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62175236"],"award-info":[{"award-number":["62175236"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Patt. Recogn. Artif. Intell."],"published-print":{"date-parts":[[2024,11]]},"abstract":"<jats:p> Hyperspectral Image (HSI) with its high resolution spatial and spectral information, has important applications in military, aerospace and civil applications. The classification methods have become the focus of the field as a significant research aspect of hyperspectral remote monitor engineering for earth reflexion. Because of its high dimensional nature, high relation between bands and spectral variety, traditional classification methods are difficult to achieve high precision and accuracy which limits the development of HSI classification technology. In the past years, with the fast recrudesce of deep learning engineering, its powerful feature extraction ability can remarkably ameliorate the accuracy of HSI classification, HSI classification on account of deep learning has become a feasibility study hotspot. In this paper, the methods of HSI classification on account of deep learning are reviewed. First, the research background of HSI classification is introduced and the deep neural network models which are expensively used in the field of HSI classification are summarized. On this basis, some HSI classification methods on account of deep learning are introduced in detail. Finally, the breakthrough aspects of deep learning in the map of HSI classification are summarized at the current stage and the future research direction is prospected. <\/jats:p>","DOI":"10.1142\/s021800142432001x","type":"journal-article","created":{"date-parts":[[2024,9,13]],"date-time":"2024-09-13T09:56:27Z","timestamp":1726221387000},"source":"Crossref","is-referenced-by-count":2,"title":["Review of Hyperspectral Image Classification Based on Deep Learning"],"prefix":"10.1142","volume":"38","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-3456-1272","authenticated-orcid":false,"given":"Yujuan","family":"Liu","sequence":"first","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130061, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9627-9430","authenticated-orcid":false,"given":"Aoxing","family":"Hao","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130061, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5990-1658","authenticated-orcid":false,"given":"Yanda","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130061, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-7921-8044","authenticated-orcid":false,"given":"Chunyu","family":"Liu","sequence":"additional","affiliation":[{"name":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-3108-5515","authenticated-orcid":false,"given":"Zhiyong","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130061, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-2568-3941","authenticated-orcid":false,"given":"Yiming","family":"Cao","sequence":"additional","affiliation":[{"name":"College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130061, P.\u00a0R.\u00a0China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"219","published-online":{"date-parts":[[2024,11,25]]},"reference":[{"key":"S021800142432001XBIB001","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298986"},{"key":"S021800142432001XBIB002","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2952062"},{"key":"S021800142432001XBIB003","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.2005729"},{"key":"S021800142432001XBIB004","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2046494"},{"key":"S021800142432001XBIB005","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2005.857031"},{"key":"S021800142432001XBIB006","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2014.2329330"},{"key":"S021800142432001XBIB007","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2015.2388577"},{"key":"S021800142432001XBIB008","doi-asserted-by":"publisher","DOI":"10.3390\/rs13132599"},{"key":"S021800142432001XBIB009","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2014.2329330"},{"key":"S021800142432001XBIB010","doi-asserted-by":"publisher","DOI":"10.5194\/isprs-annals-V-3-2022-139-2022"},{"key":"S021800142432001XBIB011","first-page":"378","volume":"5","author":"Chen Z.","year":"2008","journal-title":"J. Infrared Millimeter Waves"},{"key":"S021800142432001XBIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2129595"},{"key":"S021800142432001XBIB013","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2584107"},{"key":"S021800142432001XBIB014","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2584107"},{"key":"S021800142432001XBIB015","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2004.837009"},{"key":"S021800142432001XBIB016","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2010.2081677"},{"key":"S021800142432001XBIB017","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2015.7326114"},{"key":"S021800142432001XBIB018","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2318058"},{"key":"S021800142432001XBIB019","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.922034"},{"key":"S021800142432001XBIB020","doi-asserted-by":"publisher","DOI":"10.1080\/07038992.2022.2123625"},{"key":"S021800142432001XBIB021","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2022.08.032"},{"key":"S021800142432001XBIB022","doi-asserted-by":"publisher","DOI":"10.1109\/MGRS.2018.2854840"},{"key":"S021800142432001XBIB023","doi-asserted-by":"publisher","DOI":"10.1109\/MGRS.2016.2616418"},{"issue":"2","key":"S021800142432001XBIB024","first-page":"14","volume":"1","author":"Ghassan A. I.","year":"2023","journal-title":"East.-Eur. J. Enterprise Technol."},{"key":"S021800142432001XBIB025","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2514404"},{"issue":"2","key":"S021800142432001XBIB026","first-page":"11","volume":"33","author":"Han Y.","year":"2021","journal-title":"Remote Sens. Land Resour."},{"key":"S021800142432001XBIB027","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2899129"},{"key":"S021800142432001XBIB028","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2838665"},{"key":"S021800142432001XBIB029","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ipr.2019.1282"},{"key":"S021800142432001XBIB030","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2363682"},{"key":"S021800142432001XBIB031","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2623742"},{"key":"S021800142432001XBIB032","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2015.2482386"},{"key":"S021800142432001XBIB033","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2020.3016820"},{"issue":"6","key":"S021800142432001XBIB034","first-page":"1","volume":"35","author":"Hou J.","year":"2021","journal-title":"J. Heilongjiang Inst. Technol."},{"key":"S021800142432001XBIB035","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2319373"},{"key":"S021800142432001XBIB036","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2264508"},{"key":"S021800142432001XBIB037","doi-asserted-by":"publisher","DOI":"10.1364\/OE.430403"},{"key":"S021800142432001XBIB038","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2162649"},{"key":"S021800142432001XBIB039","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2603190"},{"key":"S021800142432001XBIB040","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2616355"},{"issue":"3","key":"S021800142432001XBIB041","first-page":"318","volume":"9","author":"Venkatesan R.","year":"2022","journal-title":"Int. J. Intell. Enterp."},{"key":"S021800142432001XBIB042","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2017.2786272"},{"key":"S021800142432001XBIB043","doi-asserted-by":"publisher","DOI":"10.3390\/rs12030582"},{"key":"S021800142432001XBIB044","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2162649"},{"key":"S021800142432001XBIB045","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2907932"},{"key":"S021800142432001XBIB046","doi-asserted-by":"publisher","DOI":"10.3390\/rs8020099"},{"issue":"6","key":"S021800142432001XBIB047","first-page":"30","volume":"23","author":"Liu Z.-g.","year":"2016","journal-title":"Electron. Opt. Control"},{"key":"S021800142432001XBIB048","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2016.2598859"},{"key":"S021800142432001XBIB049","doi-asserted-by":"publisher","DOI":"10.3390\/bios12100790"},{"key":"S021800142432001XBIB050","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2691906"},{"issue":"16","key":"S021800142432001XBIB051","first-page":"262","volume":"59","author":"Lv H.","year":"2022","journal-title":"Laser Optoelectron. Progr."},{"key":"S021800142432001XBIB052","doi-asserted-by":"publisher","DOI":"10.3390\/rs11111307"},{"key":"S021800142432001XBIB053","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.831865"},{"key":"S021800142432001XBIB054","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2636241"},{"key":"S021800142432001XBIB055","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2004.01.006"},{"key":"S021800142432001XBIB056","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2004.841417"},{"key":"S021800142432001XBIB057","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2008.2001282"},{"key":"S021800142432001XBIB058","doi-asserted-by":"publisher","DOI":"10.3390\/rs13030335"},{"key":"S021800142432001XBIB059","doi-asserted-by":"publisher","DOI":"10.32604\/csse.2023.034414"},{"key":"S021800142432001XBIB060","doi-asserted-by":"publisher","DOI":"10.1109\/SIU.2016.7495751"},{"key":"S021800142432001XBIB061","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2705073"},{"key":"S021800142432001XBIB062","doi-asserted-by":"publisher","DOI":"10.1109\/GlobalSIP.2018.8645969"},{"key":"S021800142432001XBIB063","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2157166"},{"key":"S021800142432001XBIB064","doi-asserted-by":"publisher","DOI":"10.1109\/IGARSS.2011.6050214"},{"key":"S021800142432001XBIB065","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2360672"},{"key":"S021800142432001XBIB066","doi-asserted-by":"publisher","DOI":"10.1109\/WHISPERS.2016.8071740"},{"issue":"5","key":"S021800142432001XBIB067","first-page":"689","volume":"20","author":"Tong Q. X.","year":"2016","journal-title":"J. Remote Sens."},{"key":"S021800142432001XBIB068","doi-asserted-by":"publisher","DOI":"10.1166\/jctn.2018.7509"},{"key":"S021800142432001XBIB069","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2153861"},{"key":"S021800142432001XBIB070","first-page":"1","volume":"60","author":"Wang J.","year":"2021","journal-title":"IEEE Trans. Geosci. Remote Sens."},{"key":"S021800142432001XBIB071","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2020.3014451"},{"key":"S021800142432001XBIB072","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2017.2780890"},{"key":"S021800142432001XBIB073","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2017.2737823"},{"key":"S021800142432001XBIB074","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2876123"},{"key":"S021800142432001XBIB075","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2543748"},{"key":"S021800142432001XBIB076","doi-asserted-by":"publisher","DOI":"10.3390\/rs12030582"},{"key":"S021800142432001XBIB077","first-page":"1","volume":"20","author":"Zhiyong T.","year":"2023","journal-title":"IEEE Geosci. Remote Sens. Lett."},{"key":"S021800142432001XBIB078","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2016.2630045"},{"key":"S021800142432001XBIB079","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2805286"}],"container-title":["International Journal of Pattern Recognition and Artificial Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S021800142432001X","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,29]],"date-time":"2024-11-29T09:25:55Z","timestamp":1732872355000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/10.1142\/S021800142432001X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":79,"journal-issue":{"issue":"14","published-print":{"date-parts":[[2024,11]]}},"alternative-id":["10.1142\/S021800142432001X"],"URL":"https:\/\/doi.org\/10.1142\/s021800142432001x","relation":{},"ISSN":["0218-0014","1793-6381"],"issn-type":[{"value":"0218-0014","type":"print"},{"value":"1793-6381","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]},"article-number":"2432001"}}