{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T07:59:11Z","timestamp":1767167951236,"version":"build-2238731810"},"reference-count":3,"publisher":"World Scientific Pub Co Pte Ltd","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2002,2]]},"abstract":"<jats:p>Previous analytical descriptions of the Class D\u2013E resonant dc\/dc converter using thinned-out method have been based on some assumptions, which are assumed to make it simple the evaluation about effects of thinned-out control on the equivalent impedance variation. Therefore the difference between the calculated values and the measured values is significant in case when thinned-out ratio is high. This paper presents a new analysis for this circuit. The equivalent impedance variation by thinned-out control is taken into consideration. The measured performance shows good agreement with the analytical performance in wide range.<\/jats:p>","DOI":"10.1142\/s0218126602000288","type":"journal-article","created":{"date-parts":[[2003,5,29]],"date-time":"2003-05-29T04:39:54Z","timestamp":1054183194000},"page":"35-49","source":"Crossref","is-referenced-by-count":2,"title":["ANALYSIS OF CLASS D\u2013E RESONANT dc\/dc CONVERTER USING THINNED-OUT METHOD"],"prefix":"10.1142","volume":"11","author":[{"given":"HIROTAKA","family":"KOIZUMI","sequence":"first","affiliation":[{"name":"Dept. of Electrical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa, 223-8522, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"IWAO","family":"SASASE","sequence":"additional","affiliation":[{"name":"Dept. of Electrical Engineering, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa, 223-8522, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"SHINSAKU","family":"MORI","sequence":"additional","affiliation":[{"name":"Dept. of Electrical &amp; Electronics Engineering,  Nippon Institute of Technology, 4-1 Gakuendai, Miyashiro, Minami-saitama,  Saitama, 345-8501, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"p_1","first-page":"16","volume":"106","author":"Baxandall P. J.","year":"1959","journal-title":"Proc. IEE"},{"key":"p_3","doi-asserted-by":"publisher","DOI":"10.1109\/7.220943"},{"key":"p_5","doi-asserted-by":"publisher","DOI":"10.1109\/63.623001"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126602000288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T23:44:21Z","timestamp":1565135061000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126602000288"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,2]]},"references-count":3,"aliases":["10.1016\/s0218-1266(02)00028-8"],"journal-issue":{"issue":"01","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[2002,2]]}},"alternative-id":["10.1142\/S0218126602000288"],"URL":"https:\/\/doi.org\/10.1142\/s0218126602000288","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,2]]}}}