{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T06:25:02Z","timestamp":1764224702302},"reference-count":14,"publisher":"World Scientific Pub Co Pte Lt","issue":"06","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2002,12]]},"abstract":"<jats:p>There is a growing need to analyze and optimize the stand-by component of power in digital circuits designed for portable and battery-powered applications. Since these circuits remain in stand-by (or sleep) mode significantly longer than in active mode, their stand-by current, and not their active switching current, determines their battery life. Hence, stringent specifications are being placed on the stand-by (or leakage) current drawn by such devices. As the power supply voltage is reduced, the threshold voltage of transistors is scaled down to maintain a constant switching speed. Since reducing the threshold voltage increases the leakage of a device exponentially, leakage current has become a dominant factor in the design of VLSI circuits. In this paper, we describe a method that uses simultaneous dynamic voltage scaling (DVS) and adaptive body biasing (ABB) to reduce the total power consumption of a processor under dynamic computational workloads. Analytical models of the leakage current, dynamic power, and frequency as a function of supply voltage and body bias are derived and verified with SPICE simulation. Given these models, we show how to derive an analytical expression for the optimal trade-off between supply voltage and body bias, given a required clock frequency and duration of operation. The proposed method is then applied to a processor and is compared with DVS alone for workloads obtained using real-time monitoring of processor utilization for four typical applications.<\/jats:p>","DOI":"10.1142\/s0218126602000665","type":"journal-article","created":{"date-parts":[[2003,4,11]],"date-time":"2003-04-11T09:29:32Z","timestamp":1050053372000},"page":"621-635","source":"Crossref","is-referenced-by-count":13,"title":["LEAKAGE CURRENT REDUCTION IN VLSI SYSTEMS"],"prefix":"10.1142","volume":"11","author":[{"given":"DAVID","family":"BLAAUW","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Ave., Ann Arbor, MI 48109-2122, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"STEVE","family":"MARTIN","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Ave., Ann Arbor, MI 48109-2122, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"TREVOR","family":"MUDGE","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Ave., Ann Arbor, MI 48109-2122, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"KRISZTIAN","family":"FLAUTNER","sequence":"additional","affiliation":[{"name":"ARM Ltd, Cambridge, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"},{"key":"p_3","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1109\/MSPEC.2000.8736475","volume":"37","author":"Geppert L.","year":"2000","journal-title":"IEEE Spectrum"},{"key":"p_6","first-page":"280","author":"Mizuno H.","year":"1999","journal-title":"Proc. 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J."}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126602000665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,18]],"date-time":"2020-03-18T13:44:52Z","timestamp":1584539092000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126602000665"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,12]]},"references-count":14,"journal-issue":{"issue":"06","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[2002,12]]}},"alternative-id":["10.1142\/S0218126602000665"],"URL":"https:\/\/doi.org\/10.1142\/s0218126602000665","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,12]]}}}