{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,3,26]],"date-time":"2024-03-26T13:48:21Z","timestamp":1711460901214},"reference-count":4,"publisher":"World Scientific Pub Co Pte Lt","issue":"03","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2007,6]]},"abstract":"<jats:p> In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. <\/jats:p>","DOI":"10.1142\/s0218126607003629","type":"journal-article","created":{"date-parts":[[2007,10,11]],"date-time":"2007-10-11T10:04:36Z","timestamp":1192097076000},"page":"455-465","source":"Crossref","is-referenced-by-count":20,"title":["A METHODOLOGY FOR THE ESTIMATION OF CAPACITIVE CROSSTALK-INDUCED SHORT-CIRCUIT ENERGY"],"prefix":"10.1142","volume":"16","author":[{"given":"MOSIN","family":"MONDAL","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering Department, Rice University, 6100 Main St. MS. 380, Houston, TX 77005, USA"}]},{"given":"YEHIA","family":"MASSOUD","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, Rice University, 6100 Main St. MS. 380, Houston, TX 77005, USA"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"rf1","doi-asserted-by":"publisher","DOI":"10.1109\/92.335013"},{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1109\/43.775633"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.1013890"},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1109\/43.331409"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126607003629","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T03:41:41Z","timestamp":1565149301000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126607003629"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,6]]},"references-count":4,"journal-issue":{"issue":"03","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[2007,6]]}},"alternative-id":["10.1142\/S0218126607003629"],"URL":"https:\/\/doi.org\/10.1142\/s0218126607003629","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2007,6]]}}}