{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,8,28]],"date-time":"2023-08-28T06:55:25Z","timestamp":1693205725315},"reference-count":20,"publisher":"World Scientific Pub Co Pte Lt","issue":"04","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2009,6]]},"abstract":"<jats:p> This paper presents an efficient redundancy removal technique for hierarchical optimization of FSM networks. In this technique, we first remove redundant transitions from the state transition graph (STG) of the driven FSM, M<jats:sub>2<\/jats:sub>, of the cascaded network by applying a reachability analysis to the composite machine, M<jats:sub>1<\/jats:sub> \u2192 M<jats:sub>2<\/jats:sub>, once and for all. Then, a k-wise complete test suite for M<jats:sub>2<\/jats:sub> is generated from the new STG of the driven FSM. Redundancy identification consists of two phases. In the first phase, almost all of the detectable stuck-at faults are identified by fault simulation using the k-wise test suite. During the second phase, each fault f that is undetected by k-wise tests is injected in M<jats:sub>2<\/jats:sub> to obtain [Formula: see text] in the topologically sorted order one by one. Then the equivalence check of two FSMs M<jats:sub>2<\/jats:sub> and [Formula: see text] in the environment where [Formula: see text] is driven by M<jats:sub>1<\/jats:sub> is done. If a fault is found to be undetectable in the second phase, it is a redundant fault and kept in M<jats:sub>2<\/jats:sub> ([Formula: see text] is taken as M<jats:sub>2<\/jats:sub>). Finally, simultaneous removal of redundant faults is done at logic level. We present experimental results to provide a comparison of the data produced by the state-of-the-art FSM network optimizer and show the effectiveness of our approach. <\/jats:p>","DOI":"10.1142\/s0218126609005174","type":"journal-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T10:11:24Z","timestamp":1243937484000},"page":"647-663","source":"Crossref","is-referenced-by-count":1,"title":["OPTIMIZATION OF EMBEDDED CONTROLLERS BASED ON REDUNDANT TRANSITION REMOVAL AND FAULT SIMULATION USING K-WISE TESTS"],"prefix":"10.1142","volume":"18","author":[{"given":"SEZER","family":"G\u00d6REN","sequence":"first","affiliation":[{"name":"Department of Computer Engineering, Bah\u00e7e\u015fehir University, Be\u015fikta\u015f, Istanbul, Turkey"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20020160"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1109\/32.605761"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1109\/43.103497"},{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1109\/43.391740"},{"key":"rf6","doi-asserted-by":"publisher","DOI":"10.1109\/43.851991"},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2006.06.001"},{"key":"rf8","first-page":"1","volume":"11","author":"G\u00f6ren S.","journal-title":"ACM Trans. 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