{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T23:46:36Z","timestamp":1648511196780},"reference-count":9,"publisher":"World Scientific Pub Co Pte Lt","issue":"06","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2012,10]]},"abstract":"<jats:p> With the advent of nanometer age in digital circuits, the overshooting time becomes an important component of gate delay for CMOS logic gates. However, there has been little attention paid to the research of the overshooting effect for multi-input gate in nanometer technologies until now. Therefore, in this paper, an effective model considering the overshooting effect of multi-input gate is presented. The experimental results using 32-nm PTM model reflect that the proposed model is accurate within 3.6% error compared with SPICE simulation results. <\/jats:p>","DOI":"10.1142\/s0218126612400129","type":"journal-article","created":{"date-parts":[[2012,11,12]],"date-time":"2012-11-12T06:11:49Z","timestamp":1352700709000},"page":"1240012","source":"Crossref","is-referenced-by-count":1,"title":["MODELING THE OVERSHOOTING EFFECT OF MULTI-INPUT GATE IN NANOMETER TECHNOLOGIES"],"prefix":"10.1142","volume":"21","author":[{"given":"LI","family":"DING","sequence":"first","affiliation":[{"name":"Graduate School of Information, Production and Systems, Waseda University, 2-7 Hibikino, Wakamatsu-Ku, Kitakyushu-Shi, 808-0135, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ZHANGCAI","family":"HUANG","sequence":"additional","affiliation":[{"name":"Information, Production and Systems Research Center, Waseda University, 2-7 Hibikino, Wakamatsu-Ku, Kitakyushu-Shi, 808-0135, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"MINGLU","family":"JIANG","sequence":"additional","affiliation":[{"name":"Graduate School of Information, Production and Systems, Waseda University, 2-7 Hibikino, Wakamatsu-Ku, Kitakyushu-Shi, 808-0135, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ATSUSHI","family":"KUROKAWA","sequence":"additional","affiliation":[{"name":"Graduate School of Science and Technology, Hirosaki University, 3-bunkyocho, Hirosaki-shi, Aomori-ken 036-8561, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"YASUAKI","family":"INOUE","sequence":"additional","affiliation":[{"name":"Graduate School of Information, Production and Systems, Waseda University, 2-7 Hibikino, Wakamatsu-Ku, Kitakyushu-Shi, 808-0135, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2012,12,3]]},"reference":[{"key":"rf1","volume-title":"Principles of CMOS VLSI Design: A Systems Perspective","author":"Weste N. H. E.","year":"1993"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1109\/4.400428"},{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1109\/4.736655"},{"key":"rf6","first-page":"1362","volume":"47","author":"Auvergne D.","journal-title":"IEEE Trans. Circuits Syst. I, Fundam. Theory Appl."},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1109\/82.877142"},{"key":"rf8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804088"},{"key":"rf9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.830692"},{"key":"rf10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035539"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126612400129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T14:18:30Z","timestamp":1565101110000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126612400129"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":9,"journal-issue":{"issue":"06","published-online":{"date-parts":[[2012,12,3]]},"published-print":{"date-parts":[[2012,10]]}},"alternative-id":["10.1142\/S0218126612400129"],"URL":"https:\/\/doi.org\/10.1142\/s0218126612400129","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,10]]}}}