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Comparisons between predictive technology model data and predicted parameters are used to check the validity of the used method. As a study case, we will detail the behavior of optimized telescopic operational transconductance amplifier performance with process scaling. <\/jats:p>","DOI":"10.1142\/s0218126612500612","type":"journal-article","created":{"date-parts":[[2012,12,21]],"date-time":"2012-12-21T03:12:20Z","timestamp":1356059540000},"page":"1250061","source":"Crossref","is-referenced-by-count":2,"title":["USE OF ROBUST PREDICTIVE METHOD FOR NANO-CMOS PROCESS: APPLICATION TO BASIC BLOCK ANALOG CIRCUIT DESIGN"],"prefix":"10.1142","volume":"21","author":[{"given":"HOUDA","family":"DAOUD","sequence":"first","affiliation":[{"name":"University of Sfax, Tunisia, National Engineering School of Sfax, Information Technologies and Electronics Laboratory, BP W 3038 Sfax, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"SAMIR","family":"BENSELEM","sequence":"additional","affiliation":[{"name":"University of Sfax, Tunisia, National Engineering School of Sfax, Information Technologies and Electronics Laboratory, BP W 3038 Sfax, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"SONIA","family":"ZOUARI","sequence":"additional","affiliation":[{"name":"University of Sfax, Tunisia, National Engineering School of Sfax, Information Technologies and Electronics Laboratory, BP W 3038 Sfax, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"MOURAD","family":"LOULOU","sequence":"additional","affiliation":[{"name":"University of Sfax, Tunisia, National Engineering School of Sfax, Information Technologies and Electronics Laboratory, BP W 3038 Sfax, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2013,1,17]]},"reference":[{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1145\/1229175.1229176"},{"key":"rf7","unstructured":"Y.\u00a0Dodge, Statistique: Dictionnaire Encyclop\u00e9dique (Springer, 2004)\u00a0p. 634."},{"key":"rf8","doi-asserted-by":"crossref","unstructured":"S. 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