{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,6,7]],"date-time":"2024-06-07T18:38:41Z","timestamp":1717785521028},"reference-count":12,"publisher":"World Scientific Pub Co Pte Lt","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2013,1]]},"abstract":"<jats:p> The paper presents a bandgap voltage reference (BGR) implemented in TSMC 0.25 \u03bcm BCD technology for an automotive application. To withstand a car's battery large voltage variations, from 5 V to 40 V, the circuit features an embedded pseudo-regulator providing a stable bias current for the bandgap core. High-voltage (HV) MOS count has been kept low thus allowing the design of a compact BGR with an area of 0.118 mm<jats:sup>2<\/jats:sup>. The BGR has been designed to operate in automotive extended temperature range (-40\u00b0C to 150\u00b0C) and it provides a stable voltage of 1.21 V, which is also used as reference for a cascade 3.7 V linear regulator. Measurements carried on fabricated IC samples prove the effectiveness of the BGR design in terms of supported input voltage variations and operating temperature range, temperature drift, line regulation and PSRR performance. <\/jats:p>","DOI":"10.1142\/s0218126612500697","type":"journal-article","created":{"date-parts":[[2013,1,15]],"date-time":"2013-01-15T21:47:29Z","timestamp":1358286449000},"page":"1250069","source":"Crossref","is-referenced-by-count":6,"title":["BANDGAP VOLTAGE REFERENCE IC FOR HV AUTOMOTIVE APPLICATIONS WITH PSEUDO-REGULATED BIAS AND SERVICE REGULATOR"],"prefix":"10.1142","volume":"22","author":[{"given":"SERGIO","family":"SAPONARA","sequence":"first","affiliation":[{"name":"Department of Information Engineering, University of Pisa, via Caruso 16, I-56122 Pisa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"LUCA","family":"FANUCCI","sequence":"additional","affiliation":[{"name":"Department of Information Engineering, University of Pisa, via Caruso 16, I-56122 Pisa, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"TOMMASO","family":"BALDETTI","sequence":"additional","affiliation":[{"name":"SensorDynamics AG (now Maxim IC), Navacchio, via, Giuntini 13, 56023 Navacchio (Pisa), Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ENRICO","family":"PARDI","sequence":"additional","affiliation":[{"name":"SensorDynamics AG (now Maxim IC), Navacchio, via, Giuntini 13, 56023 Navacchio (Pisa), Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2013,2,28]]},"reference":[{"key":"rf6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2084979"},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029583"},{"key":"rf8","doi-asserted-by":"publisher","DOI":"10.1109\/TEPM.2004.843109"},{"key":"rf10","first-page":"1","volume":"14","author":"Shurong G.","year":"2007","journal-title":"Eng. Lett."},{"key":"rf11","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-009-9344-4"},{"key":"rf12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.1015695"},{"key":"rf15","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-009-9333-7"},{"key":"rf17","volume-title":"Design of Analog CMOS Integrated Circuits","author":"Razavi B.","year":"2000"},{"key":"rf18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2174653"},{"key":"rf20","first-page":"095010-1","volume":"31","author":"Yintang Y.","year":"2010","journal-title":"IOP J. Semiconductors"},{"key":"rf21","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126611007608"},{"key":"rf22","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.4.597"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126612500697","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T16:46:35Z","timestamp":1565109995000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126612500697"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,1]]},"references-count":12,"journal-issue":{"issue":"01","published-online":{"date-parts":[[2013,2,28]]},"published-print":{"date-parts":[[2013,1]]}},"alternative-id":["10.1142\/S0218126612500697"],"URL":"https:\/\/doi.org\/10.1142\/s0218126612500697","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,1]]}}}