{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T11:03:19Z","timestamp":1648810999059},"reference-count":7,"publisher":"World Scientific Pub Co Pte Lt","issue":"09","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2013,10]]},"abstract":"<jats:p> This paper presented a high-precision, ultra-low-power hysteretic voltage detector (HVD) using current comparison to detect voltage default crossing moments for energy-harvesting systems (EHS) in wireless sensor network (WSN) applications. The HVD mainly consists of four parts: a specially designed voltage-to-current converter (VCC) with thermal stability improvement, a comparison core to make current-based comparison, a current pre-amplifier to improve its transient performance and a Schmitt inverter to provide the hysteresis characteristic. The prototype of this HVD has been implemented in SMIC 0.18 \u03bcm CMOS process and occupies 0.036 mm<jats:sup>2<\/jats:sup> area without pads. The hysteresis window is about 120 mV wide. The temperature coefficient (TC) is about -170.2 ppm\u00b0C. The average variation to different process corners can be reduced to 1.4% by MOSFET and resistor trimming. The total power consumption is only 701.5 nW when VDD is around 1.8 V. <\/jats:p>","DOI":"10.1142\/s0218126613400057","type":"journal-article","created":{"date-parts":[[2013,11,18]],"date-time":"2013-11-18T03:22:33Z","timestamp":1384744953000},"page":"1340005","source":"Crossref","is-referenced-by-count":0,"title":["A HIGH-PRECISION ULTRA-LOW-POWER HYSTERETIC VOLTAGE DETECTOR USING CURRENT-BASED COMPARISON"],"prefix":"10.1142","volume":"22","author":[{"given":"WEN-XIAO","family":"GU","sequence":"first","affiliation":[{"name":"Institute of VLSI design, Zhejiang University, Yuquan Campus, Hangzhou, Zhejiang Province, China"}]},{"given":"MENG-LIAN","family":"ZHAO","sequence":"additional","affiliation":[{"name":"Institute of VLSI design, Zhejiang University, Yuquan Campus, Hangzhou, Zhejiang Province, China"}]},{"given":"XIAO-BO","family":"WU","sequence":"additional","affiliation":[{"name":"Institute of VLSI design, Zhejiang University, Yuquan Campus, Hangzhou, Zhejiang Province, China"}]},{"given":"MINGYANG","family":"CHEN","sequence":"additional","affiliation":[{"name":"Institute of VLSI design, Zhejiang University, Yuquan Campus, Hangzhou, Zhejiang Province, China"}]},{"given":"QING","family":"LIU","sequence":"additional","affiliation":[{"name":"Institute of VLSI design, Zhejiang University, Yuquan Campus, Hangzhou, Zhejiang Province, China"}]}],"member":"219","published-online":{"date-parts":[[2013,11,27]]},"reference":[{"key":"rf1","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.3448"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/30\/12\/125008"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2069574"},{"key":"rf5","unstructured":"B.\u00a0Razavi, Design of Analog CMOS Integrated Circuits (McGraw-Hill, New York, 2001)\u00a0pp. 390\u2013392."},{"key":"rf6","unstructured":"P. R.\u00a0Gray, Analysis and Design of Analog Integrated Circuits (John. Wiley & Sons, New York, 2001)\u00a0pp. 66\u201371."},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.806265"},{"key":"rf9","doi-asserted-by":"publisher","DOI":"10.1109\/81.260219"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126613400057","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T14:57:40Z","timestamp":1565103460000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126613400057"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":7,"journal-issue":{"issue":"09","published-online":{"date-parts":[[2013,11,27]]},"published-print":{"date-parts":[[2013,10]]}},"alternative-id":["10.1142\/S0218126613400057"],"URL":"https:\/\/doi.org\/10.1142\/s0218126613400057","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}