{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T00:09:49Z","timestamp":1648944589261},"reference-count":5,"publisher":"World Scientific Pub Co Pte Lt","issue":"10","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2013,12]]},"abstract":"<jats:p> This paper presents a low-power CMOS receiving signal strength indicator (RSSI). The main architecture of the circuit adopts a six-stage limiting amplifier (LA) in a logarithmic-linear form, which shows a good performance in weak signal detection. The RSSI achieves high tolerance to process, voltage, and temperature (PVT) variations by utilizing the unique nature of branch currents in a transconductance amplifier. The power consumption is decreased by using the weak-inversion LAs. Full-waveform current rectification and summation are employed in the RSSI circuit to achieve high precision while maintaining low power consumption. Measured results show that in the 1 kHz\u201350 MHz frequency range, the input dynamic range is wider than 70 dB within \u00b12 dB linearity error. The chip occupies an area of 0.7 mm<jats:sup>2<\/jats:sup> \u00d7 0.3 mm<jats:sup>2<\/jats:sup> using a 0.18-\u03bcm CMOS. It draws 1.3 mA from a 1.8 V supply. <\/jats:p>","DOI":"10.1142\/s0218126613400343","type":"journal-article","created":{"date-parts":[[2013,12,2]],"date-time":"2013-12-02T11:35:11Z","timestamp":1385984111000},"page":"1340034","source":"Crossref","is-referenced-by-count":5,"title":["A CMOS LOW-POWER TEMPERATURE-ROBUST RSSI USING WEAK-INVERSION LIMITING AMPLIFIERS"],"prefix":"10.1142","volume":"22","author":[{"given":"KEPING","family":"WANG","sequence":"first","affiliation":[{"name":"VIRTUS, IC Design Centre of Excellence, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore"},{"name":"Department of Electrical Engineering, University of Washington, Seattle, Washington 98195, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XUEMEI","family":"LEI","sequence":"additional","affiliation":[{"name":"College of Electronic Information Engineering, Inner Mongolia University, Hohhot, Inner Mongolia, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"KAIXUE","family":"MA","sequence":"additional","affiliation":[{"name":"VIRTUS, IC Design Centre of Excellence, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"KIAT SENG","family":"YEO","sequence":"additional","affiliation":[{"name":"VIRTUS, IC Design Centre of Excellence, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XIANG","family":"CAO","sequence":"additional","affiliation":[{"name":"Institute of RF- &amp; OE-ICs, Southeast University, 2 Sipailou, Nanjing 210096, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"ZHIGONG","family":"WANG","sequence":"additional","affiliation":[{"name":"Institute of RF- &amp; OE-ICs, Southeast University, 2 Sipailou, Nanjing 210096, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2014,1]]},"reference":[{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.894307"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2049790"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2168014"},{"key":"rf6","doi-asserted-by":"publisher","DOI":"10.1109\/4.871325"},{"key":"rf9","doi-asserted-by":"publisher","DOI":"10.1109\/82.974782"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126613400343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T21:18:34Z","timestamp":1565126314000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126613400343"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":5,"journal-issue":{"issue":"10","published-online":{"date-parts":[[2014,1]]},"published-print":{"date-parts":[[2013,12]]}},"alternative-id":["10.1142\/S0218126613400343"],"URL":"https:\/\/doi.org\/10.1142\/s0218126613400343","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,12]]}}}