{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T12:06:57Z","timestamp":1648728417767},"reference-count":6,"publisher":"World Scientific Pub Co Pte Lt","issue":"03","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2016,3]]},"abstract":"<jats:p> This paper presents a digital embedded test instrument (ETI) for on-chip phase noise (PN) testing of analog\/RF integrated circuits. The technique relies on 1\u2013bit signal acquisition and dedicated processing to compute a digital signature related to the PN level. An appropriate algorithm based on on-the-fly processing of the 1-bit signal is defined in order to implement the BIST module with minimal hardware resources. Its implementation in CMOS 140[Formula: see text]nm technology occupies only 7,885[Formula: see text][Formula: see text]m<jats:sup>2<\/jats:sup>, which represents an extremely small silicon area. Hardware measurements are performed on an FPGA prototype that validates the proposed instrument. <\/jats:p>","DOI":"10.1142\/s0218126616400144","type":"journal-article","created":{"date-parts":[[2015,10,13]],"date-time":"2015-10-13T20:17:55Z","timestamp":1444767475000},"page":"1640014","source":"Crossref","is-referenced-by-count":0,"title":["Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog\/RF Integrated Circuits"],"prefix":"10.1142","volume":"25","author":[{"given":"Florence","family":"Aza\u00efs","sequence":"first","affiliation":[{"name":"LIRMM, CNRS\/Univ. Montpellier, 161 rue Ada, Montpellier 34095, France"}]},{"given":"St\u00e9phane","family":"David-Grignot","sequence":"additional","affiliation":[{"name":"LIRMM, CNRS\/Univ. Montpellier, 161 rue Ada, Montpellier 34095, France"},{"name":"NXP Semiconductors, 2 Espl. Anton Phillips, Caen 14000, France"}]},{"given":"Laurent","family":"Latorre","sequence":"additional","affiliation":[{"name":"LIRMM, CNRS\/Univ. Montpellier, 161 rue Ada, Montpellier 34095, France"}]},{"given":"Fran\u00e7ois","family":"Lefevre","sequence":"additional","affiliation":[{"name":"NXP Semiconductors, 2 Espl. Anton Phillips, Caen 14000, France"}]}],"member":"219","published-online":{"date-parts":[[2015,12,28]]},"reference":[{"key":"S0218126616400144BIB002","volume-title":"Telecommunications Measurements, Analysis and Instrumentation","author":"Feher K.","year":"1987"},{"key":"S0218126616400144BIB003","doi-asserted-by":"publisher","DOI":"10.1109\/19.948302"},{"key":"S0218126616400144BIB004","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827084"},{"key":"S0218126616400144BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/19.650819"},{"key":"S0218126616400144BIB007","doi-asserted-by":"publisher","DOI":"10.1063\/1.3133356"},{"key":"S0218126616400144BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.908689"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126616400144","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T18:38:02Z","timestamp":1565116682000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126616400144"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12,28]]},"references-count":6,"journal-issue":{"issue":"03","published-online":{"date-parts":[[2015,12,28]]},"published-print":{"date-parts":[[2016,3]]}},"alternative-id":["10.1142\/S0218126616400144"],"URL":"https:\/\/doi.org\/10.1142\/s0218126616400144","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,12,28]]}}}