{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T15:53:29Z","timestamp":1649087609067},"reference-count":9,"publisher":"World Scientific Pub Co Pte Lt","issue":"11","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2016,11]]},"abstract":"<jats:p> Primary-side controlled pulse-width modulation (PWM) flyback converter has been widely used in low-power and low-voltage products for its simple structure and low cost. This paper presents a novel output voltage sampling circuit which considers the influence of the rectifier diode current on the output voltage sampling. The output voltage sampling circuit samples the output voltage at 85% of the secondary inductance discharge time [Formula: see text] of last cycle, which improves the accuracy of the output voltage sampling circuit. Besides, the circuit can also sample the secondary inductance discharge time [Formula: see text]. Finally, a chip has been fabricated in 0.6[Formula: see text][Formula: see text]m complementary metal-oxide semiconductor (CMOS) process, which is used in the presented output voltage sampling circuit in its internal circuit to simple output voltage and achieve constant output voltage. <\/jats:p>","DOI":"10.1142\/s0218126616501401","type":"journal-article","created":{"date-parts":[[2016,6,30]],"date-time":"2016-06-30T09:05:42Z","timestamp":1467277542000},"page":"1650140","source":"Crossref","is-referenced-by-count":2,"title":["Output Voltage Sampling Circuit for Discontinuous Conduction Mode Flyback Pulse-Width Modulation Controller"],"prefix":"10.1142","volume":"25","author":[{"given":"Ling-Feng","family":"Shi","sequence":"first","affiliation":[{"name":"Institute of Electronic CAD, School of Electronic Engineering, Xidian University, No. 2 South Tai Bai Road, Xi\u2019an, Shaanxi 710071, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhen-Bo","family":"Shi","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, School of Electronic Engineering, Xidian University, No. 2 South Tai Bai Road, Xi\u2019an, Shaanxi 710071, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sen","family":"Chen","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, School of Electronic Engineering, Xidian University, No. 2 South Tai Bai Road, Xi\u2019an, Shaanxi 710071, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jian-Hui","family":"Xun","sequence":"additional","affiliation":[{"name":"Institute of Electronic CAD, School of Electronic Engineering, Xidian University, No. 2 South Tai Bai Road, Xi\u2019an, Shaanxi 710071, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2016,8,14]]},"reference":[{"key":"S0218126616501401BIB001","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2009.0253"},{"key":"S0218126616501401BIB002","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2011.0225"},{"key":"S0218126616501401BIB003","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2008.0189"},{"key":"S0218126616501401BIB004","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2010.0363"},{"key":"S0218126616501401BIB005","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0472"},{"key":"S0218126616501401BIB006","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2014.0358"},{"key":"S0218126616501401BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2037000"},{"key":"S0218126616501401BIB010","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2011.0254"},{"key":"S0218126616501401BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2158771"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126616501401","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T05:11:20Z","timestamp":1565154680000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126616501401"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8,14]]},"references-count":9,"journal-issue":{"issue":"11","published-online":{"date-parts":[[2016,8,14]]},"published-print":{"date-parts":[[2016,11]]}},"alternative-id":["10.1142\/S0218126616501401"],"URL":"https:\/\/doi.org\/10.1142\/s0218126616501401","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,8,14]]}}}