{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,12]],"date-time":"2025-06-12T04:47:25Z","timestamp":1749703645915},"reference-count":6,"publisher":"World Scientific Pub Co Pte Lt","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2017,1]]},"abstract":"<jats:p> Mismatch and parasitic effects of bridge capacitors in successive-approximation-register analog-to-digital converter\u2019s (SAR-ADC) split capacitor digital-to-analog conversion (DAC) cause a significant performance deterioration. This paper presents a nonlinearity analysis based on an analytical model, and a modified calibration method utilizing a pre-bias bridge capacitor is accordingly proposed. The proposed method, which uses three-segment split capacitor DAC structure, can effectively eliminate over-calibration error caused by conventional structure. To verify the technique, a 14-bit SAR-ADC has been designed in 0.35-[Formula: see text]m 2P4M CMOS process with the PIP capacitor, and the simulation results show the method can further improve ADC performance. <\/jats:p>","DOI":"10.1142\/s0218126617500037","type":"journal-article","created":{"date-parts":[[2016,8,23]],"date-time":"2016-08-23T04:56:27Z","timestamp":1471928187000},"page":"1750003","source":"Crossref","is-referenced-by-count":1,"title":["Study of Split Capacitor DAC Mismatch and Calibration in SAR-ADC"],"prefix":"10.1142","volume":"26","author":[{"given":"Yun","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiqiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2016,10,4]]},"reference":[{"key":"S0218126617500037BIB001","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1975.1050629"},{"key":"S0218126617500037BIB003","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856291"},{"key":"S0218126617500037BIB004","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.1752"},{"key":"S0218126617500037BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2010.2081362"},{"key":"S0218126617500037BIB010","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2163556"},{"key":"S0218126617500037BIB018","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.03.011"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126617500037","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T15:01:20Z","timestamp":1565103680000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126617500037"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10,4]]},"references-count":6,"journal-issue":{"issue":"01","published-online":{"date-parts":[[2016,10,4]]},"published-print":{"date-parts":[[2017,1]]}},"alternative-id":["10.1142\/S0218126617500037"],"URL":"https:\/\/doi.org\/10.1142\/s0218126617500037","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,10,4]]}}}