{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T22:55:05Z","timestamp":1752360905926},"reference-count":2,"publisher":"World Scientific Pub Co Pte Lt","issue":"03","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2017,3]]},"abstract":"<jats:p> This paper proposes a mixed signal DC offset cancellation (DCOC) which does not cause the near-DC rejection for zero-IF receiver. To achieve low output offset efficiently, the DCOC consisting of a comparator, a digital logic controller and compensation voltage generators is used. It utilizes current sources arrays that are controlled by thermometer code to generate the compensation voltage. The proposed DCOC is implemented in GF 0.18 [Formula: see text]m CMOS process. The measurement results show that the proposed calibration method can reduce the offset residue to less than 80 mV and the total calibration time is less than 13 [Formula: see text]s. It only drains 60 [Formula: see text]A from a 3.3 V supply. <\/jats:p>","DOI":"10.1142\/s0218126617500475","type":"journal-article","created":{"date-parts":[[2016,10,10]],"date-time":"2016-10-10T04:55:48Z","timestamp":1476075348000},"page":"1750047","source":"Crossref","is-referenced-by-count":1,"title":["A Mixed Signal DC Offset Cancellation for VGA of Zero-IF Receiver"],"prefix":"10.1142","volume":"26","author":[{"given":"Yiqiang","family":"Zhao","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jingshuai","family":"Wang","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yun","family":"Sheng","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai, Tianjin 300072, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2016,11,21]]},"reference":[{"key":"S0218126617500475BIB001","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2010.12.005"},{"key":"S0218126617500475BIB006","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/32\/12\/125008"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126617500475","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T09:12:16Z","timestamp":1565082736000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126617500475"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,21]]},"references-count":2,"journal-issue":{"issue":"03","published-online":{"date-parts":[[2016,11,21]]},"published-print":{"date-parts":[[2017,3]]}},"alternative-id":["10.1142\/S0218126617500475"],"URL":"https:\/\/doi.org\/10.1142\/s0218126617500475","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,11,21]]}}}