{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:38:16Z","timestamp":1740116296042,"version":"3.37.3"},"reference-count":5,"publisher":"World Scientific Pub Co Pte Ltd","issue":"05","funder":[{"DOI":"10.13039\/501100004569","name":"Ministerstwo Nauki i Szkolnictwa Wy\u017cszego","doi-asserted-by":"publisher","award":["BK-220\/RAu-3\/2016"],"award-info":[{"award-number":["BK-220\/RAu-3\/2016"]}],"id":[{"id":"10.13039\/501100004569","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2017,5]]},"abstract":"<jats:p> The paper presents the idea and implementation of a digital nonlinearity measurement of a voltage ramp. The measurement process is based on evaluation of a time period between the moments when an input voltage ramp and an ideal voltage ramp reach the given value. During this period, the clock pulse train is supplied to the counter. By adjusting the pulse frequency and the circuit parameters, it is possible to obtain the nonlinearity readout in a fraction of percent directly. An automatic range determination has been presented when the reference frequency is constant. Calibration and measurement are completed for two slopes (periods) of the voltage ramp. The measurement error for the proposed method and implementation results were evaluated. <\/jats:p>","DOI":"10.1142\/s0218126617500815","type":"journal-article","created":{"date-parts":[[2016,12,9]],"date-time":"2016-12-09T02:08:17Z","timestamp":1481249297000},"page":"1750081","source":"Crossref","is-referenced-by-count":1,"title":["Nonlinearity Measurement of a Voltage Ramp Using a Digital Technique"],"prefix":"10.1142","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1043-290X","authenticated-orcid":false,"given":"Adam","family":"Milik","sequence":"first","affiliation":[{"name":"Institute of Electronics, Silesian University of Technology, Akademicka 16, 44-100 Gliwice, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edward","family":"Hrynkiewicz","sequence":"additional","affiliation":[{"name":"Institute of Electronics, Silesian University of Technology, Akademicka 16, 44-100 Gliwice, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2017,2,8]]},"reference":[{"key":"S0218126617500815BIB005","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2012.08.005"},{"key":"S0218126617500815BIB007","doi-asserted-by":"publisher","DOI":"10.1016\/j.chroma.2005.01.064"},{"volume-title":"Electronic Measurements and Instrumentation","year":"1978","author":"Oliver B. M.","key":"S0218126617500815BIB013"},{"key":"S0218126617500815BIB014","doi-asserted-by":"publisher","DOI":"10.1109\/19.728785"},{"volume-title":"Industrial Electronic Circuits","year":"1981","author":"Zagajewski T.","key":"S0218126617500815BIB015"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126617500815","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,20]],"date-time":"2019-09-20T19:40:19Z","timestamp":1569008419000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126617500815"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,2,8]]},"references-count":5,"journal-issue":{"issue":"05","published-online":{"date-parts":[[2017,2,8]]},"published-print":{"date-parts":[[2017,5]]}},"alternative-id":["10.1142\/S0218126617500815"],"URL":"https:\/\/doi.org\/10.1142\/s0218126617500815","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2017,2,8]]}}}