{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T18:44:58Z","timestamp":1648579498654},"reference-count":13,"publisher":"World Scientific Pub Co Pte Lt","issue":"12","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2017,12]]},"abstract":"<jats:p> In this paper, we use bias current boosting and slew rate enhancement in multiple-output Low-dropout structure to achieve a faster transient response. This method reduces ripples of output voltage during sudden changes in load current and input voltage. The proposed MOLDO circuit was simulated with a 0.18[Formula: see text][Formula: see text]m CMOS process in buck mode with four-output legs. Integrating of proposed circuit is easier because there is the symmetry in the circuit designing. The results of our work show that when input voltage changes between 2.5\u20133.3[Formula: see text]V, the output voltage after 25[Formula: see text][Formula: see text]s with load current of 100[Formula: see text]mA, is determined with ripple less than 1.8[Formula: see text]mV. In sudden changes, the load current at the range 0\u2013100[Formula: see text]mA, and output voltages after a maximum 15.5[Formula: see text][Formula: see text]s with an input voltage of 3.3[Formula: see text]V have the highest ripple in output voltage of 4[Formula: see text]mV. <\/jats:p>","DOI":"10.1142\/s0218126617501973","type":"journal-article","created":{"date-parts":[[2017,5,16]],"date-time":"2017-05-16T07:10:24Z","timestamp":1494918624000},"page":"1750197","source":"Crossref","is-referenced-by-count":1,"title":["Slew Rate and Transient Response Enhancement in MOLDO with Modifying Error Amplifier Structure"],"prefix":"10.1142","volume":"26","author":[{"given":"Fatemeh","family":"Abdi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Shahid Rajaee Teacher Training University, 1678815811, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mahnaz Janipoor","family":"Deylamani","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Shahid Rajaee Teacher Training University, 1678815811, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Parviz","family":"Amiri","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Shahid Rajaee Teacher Training University, 1678815811, Tehran, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2017,8]]},"reference":[{"key":"S0218126617501973BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2014726"},{"key":"S0218126617501973BIB003","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2164019"},{"key":"S0218126617501973BIB004","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"},{"key":"S0218126617501973BIB005","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852658"},{"key":"S0218126617501973BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.908767"},{"key":"S0218126617501973BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.915182"},{"key":"S0218126617501973BIB009","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837027"},{"key":"S0218126617501973BIB010","first-page":"2466","volume":"45","author":"Ho M.","year":"2011","journal-title":"IEEE J. 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