{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,2]],"date-time":"2026-02-02T14:13:20Z","timestamp":1770041600849,"version":"3.49.0"},"reference-count":18,"publisher":"World Scientific Pub Co Pte Ltd","issue":"12","funder":[{"name":"Natural Science Foundation of Shaanxi Province of China","award":["2016JM6067"],"award-info":[{"award-number":["2016JM6067"]}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","award":["20120281"],"award-info":[{"award-number":["20120281"]}],"id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2017,12]]},"abstract":"<jats:p> High reliability against undesirable effects is one of the key objectives in the design for Network-on-Chip (NoC). As a result, designing reliable and efficient routing method is highly desirable. This paper presents a novel turn model called NMad-y using one and two virtual channels along the [Formula: see text]- and [Formula: see text]-dimensions, respectively, and Adaptive and Fault-tolerant Routing Method (AFRM) which is designed based on the NMad-y turn model. AFRM can effectively tolerate multiple faulty routers and links in more complicated faulty situations by the link status of neighbor routers within two hops. AFRM is able to impose the reliability of network without losing the performance of network. Simulation results show that AFRM achieves better saturation throughput (0.83% on average) than a state-of-the-art fault-tolerant routing method and maintains high reliability of more than 97.43% on average. <\/jats:p>","DOI":"10.1142\/s0218126617502000","type":"journal-article","created":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T03:09:41Z","timestamp":1496200181000},"page":"1750200","source":"Crossref","is-referenced-by-count":2,"title":["AFRM: Adaptive and Fault-Tolerant Routing Method for 2D Network-on-Chip"],"prefix":"10.1142","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1703-7497","authenticated-orcid":false,"given":"Ruilian","family":"Xie","sequence":"first","affiliation":[{"name":"State Key Laboratory of Wide Bandgap Semiconductor Technology Disciplines, Xidian University, No. 2 South Taibai Road, Xi\u2019an, Shaanxi 710071, P. R. China"},{"name":"School of Computer Science, Xi\u2019an Polytechnic University, No. 19 Jinhua South Road, Xi\u2019an, Shaanxi 710048, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1852-0982","authenticated-orcid":false,"given":"Jueping","family":"Cai","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Wide Bandgap Semiconductor Technology Disciplines, Xidian University, No. 2 South Taibai Road, Xi\u2019an, Shaanxi 710071, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Wide Bandgap Semiconductor Technology Disciplines, Xidian University, No. 2 South Taibai Road, Xi\u2019an, Shaanxi 710071, P. R. China"},{"name":"China Electronics Technology Group Corporation No. 47 Research Institute, No. 20 Lingyuan Street, Shenyang, Liaoning 110032, P. R. 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