{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T04:46:37Z","timestamp":1772772397564,"version":"3.50.1"},"reference-count":11,"publisher":"World Scientific Pub Co Pte Ltd","issue":"14","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2018,12,31]]},"abstract":"<jats:p> In this paper, we propose a novel voltage-programmed pixel circuit with polysilicon thin\u2013flim transistors (poly-Si TFTs) for active matrix organic light-emitting diode (AMOLED) displays, which consists of one programming transistor, one driving transistor, four switching transistors and two storage capacitors, respectively. Specifically, the proposed pixel circuit is able to not only efficiently compensate for the threshold variations of TFTs, but also largely suppresses the electrical degradations of the devices caused by the long-term electrical stress. Moreover, the mobility variation of the driving transistor can be compensated as well. The simulation has been performed by HSPICE, and results indicate that the average values of nonuniformities are, respectively, 7.3% as the threshold-voltage varies by [Formula: see text][Formula: see text]V and 2.1%, as the mobility of the driving transistor varies by [Formula: see text]%, both of which are much lower than that of the conventional two-transistor and one-capacitor (2T1C) pixel. Furthermore, since the OLED is reverse-biased during the nonemission phases, the lifetime of OLED will be extended naturally. As a consequence, the proposed pixel circuit can substantially improve the display performance. <\/jats:p>","DOI":"10.1142\/s0218126618502213","type":"journal-article","created":{"date-parts":[[2018,3,14]],"date-time":"2018-03-14T04:18:08Z","timestamp":1521001088000},"page":"1850221","source":"Crossref","is-referenced-by-count":2,"title":["A Novel Voltage-Programmed Pixel Circuit with Poly-Si TFTs for AMOLED Displays"],"prefix":"10.1142","volume":"27","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7501-8959","authenticated-orcid":false,"given":"Zunkai","family":"Huang","sequence":"first","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, P. R. China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Tian","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Songlin","family":"Feng","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2018,8,23]]},"reference":[{"key":"S0218126618502213BIB001","doi-asserted-by":"publisher","DOI":"10.1063\/1.98799"},{"key":"S0218126618502213BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/16.808054"},{"key":"S0218126618502213BIB003","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.826567"},{"key":"S0218126618502213BIB004","doi-asserted-by":"publisher","DOI":"10.1049\/el:19981616"},{"key":"S0218126618502213BIB005","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2341676"},{"key":"S0218126618502213BIB007","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850615"},{"key":"S0218126618502213BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2148152"},{"key":"S0218126618502213BIB009","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2014.2301020"},{"key":"S0218126618502213BIB010","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2010.2044015"},{"key":"S0218126618502213BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2289315"},{"key":"S0218126618502213BIB013","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2014.2301020"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126618502213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T13:56:00Z","timestamp":1565099760000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126618502213"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8,23]]},"references-count":11,"journal-issue":{"issue":"14","published-online":{"date-parts":[[2018,8,23]]},"published-print":{"date-parts":[[2018,12,31]]}},"alternative-id":["10.1142\/S0218126618502213"],"URL":"https:\/\/doi.org\/10.1142\/s0218126618502213","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,8,23]]}}}