{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:37:06Z","timestamp":1740116226779,"version":"3.37.3"},"reference-count":28,"publisher":"World Scientific Pub Co Pte Ltd","issue":"supp01","funder":[{"DOI":"10.13039\/501100002428","name":"Austrian Science Fund","doi-asserted-by":"publisher","award":["P26436-N30"],"award-info":[{"award-number":["P26436-N30"]}],"id":[{"id":"10.13039\/501100002428","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2019,12,1]]},"abstract":"<jats:p> The increasing number of clock domain crossings in modern systems-on-chip makes the careful consideration of metastability paramount. However, the manifestation of metastability at a flip-flop output is often unduly reduced to late transitions only, while glitches are hardly ever accounted for. In this paper we study the occurrence of glitches resulting from metastability in detail. To this end we propose a measurement circuit whose principle substantially differs from the conventional approach, and by that allows to reliably detect glitches. By means of experimental measurements on an FPGA target we can clearly identify late transitions, single glitches and double glitches as possible manifestations of metastability. Some of these behaviors are unexpected as they do not follow from the traditional modeling theory. We also study the dependence of metastable behavior on supply voltage. Beyond confirming that, as reported in previous literature, the metastable decay constant [Formula: see text] is voltage-dependent, we also produce strong evidence that the relative occurrence of glitches is not voltage-dependent. <\/jats:p>","DOI":"10.1142\/s0218126619400061","type":"journal-article","created":{"date-parts":[[2019,4,2]],"date-time":"2019-04-02T04:47:54Z","timestamp":1554180474000},"page":"1940006","source":"Crossref","is-referenced-by-count":0,"title":["An Experimental Study of Metastability-Induced Glitching Behavior"],"prefix":"10.1142","volume":"28","author":[{"given":"Thomas","family":"Polzer","sequence":"first","affiliation":[{"name":"Department Electronic Engineering, UAS Technikum Wien, H\u00f6chst\u00e4dtplatz 6, A-1200, Vienna, Austria"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Florian","family":"Huemer","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, TU Wien, Karlsplatz 13, A-1040 Vienna, Austria"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3847-1647","authenticated-orcid":false,"given":"Andreas","family":"Steininger","sequence":"additional","affiliation":[{"name":"Institute of Computer Engineering, TU Wien, Karlsplatz 13, A-1040 Vienna, Austria"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,12,12]]},"reference":[{"doi-asserted-by":"publisher","key":"S0218126619400061BIB001","DOI":"10.1109\/JSSC.1980.1051359"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB002","DOI":"10.1016\/j.microrel.2017.11.017"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB003","DOI":"10.1002\/9780470517147"},{"key":"S0218126619400061BIB004","first-page":"441","volume-title":"Proc. Conf. Computers-Systems and Technology","author":"Kinniment D.","year":"1972"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB005","DOI":"10.1109\/T-C.1973.223730"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB006","DOI":"10.1109\/ASYNC.2003.1199167"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB007","DOI":"10.1109\/ASYNC.2006.21"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB008","DOI":"10.1109\/ICMTS.2008.4509330"},{"key":"S0218126619400061BIB009","first-page":"80","volume-title":"Proc. 2010 East-West Design and Test Symp.","author":"Rogina B. M.","year":"2010"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB010","DOI":"10.1109\/JSSC.1987.1052671"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB011","DOI":"10.1109\/ASYNC.2009.8"},{"key":"S0218126619400061BIB012","first-page":"1","volume-title":"Proc. 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel","author":"Beer S.","year":"2012"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB013","DOI":"10.1145\/1278480.1278518"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB014","DOI":"10.1109\/JSSC.2007.913160"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB015","DOI":"10.1109\/ASYNC.1996.494449"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB017","DOI":"10.1109\/ICEMI.2009.5274693"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB018","DOI":"10.1109\/ICM.2004.1434782"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB019","DOI":"10.1145\/1723112.1723142"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB020","DOI":"10.1109\/JSSC.1982.1051804"},{"key":"S0218126619400061BIB021","first-page":"94","volume-title":"Proc. 2010 26th Convention of Electrical and Electronics Engineers in Israel","author":"Beer S.","year":"2010"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB022","DOI":"10.1109\/Austrochip.2016.021"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB023","DOI":"10.1109\/ASYNC.2013.14"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB024","DOI":"10.1109\/ASYNC.2017.18"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB025","DOI":"10.1109\/ASYNC.2008.11"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB026","DOI":"10.1109\/TVLSI.2014.2365255"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB027","DOI":"10.1109\/TIM.2016.2534670"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB028","DOI":"10.1109\/DDECS.2018.00032"},{"doi-asserted-by":"publisher","key":"S0218126619400061BIB029","DOI":"10.1109\/DDECS.2017.7934582"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126619400061","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,12,13]],"date-time":"2019-12-13T02:17:00Z","timestamp":1576203420000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126619400061"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12,1]]},"references-count":28,"journal-issue":{"issue":"supp01","published-print":{"date-parts":[[2019,12,1]]}},"alternative-id":["10.1142\/S0218126619400061"],"URL":"https:\/\/doi.org\/10.1142\/s0218126619400061","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2019,12,1]]}}}