{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:37:47Z","timestamp":1740116267682,"version":"3.37.3"},"reference-count":13,"publisher":"World Scientific Pub Co Pte Ltd","issue":"05","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61401205"],"award-info":[{"award-number":["61401205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Qing Lan Project of Jiangsu Province","award":["2018"],"award-info":[{"award-number":["2018"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2019,5]]},"abstract":"<jats:p> Critical constituent gates are first detected and graded based on their individual impact of an error in the outputs. This brings in the idea of practical reliability analysis metric. Then, the approximation of arithmetic circuits by random logic applied to least significant gates is introduced. The 74283 fast adder is used as an example to illustrate the feasibility of the proposed methods. Simulation results show the potential efficient application of the proposed reliability analysis metric and approximation method. <\/jats:p>","DOI":"10.1142\/s0218126619500774","type":"journal-article","created":{"date-parts":[[2018,6,17]],"date-time":"2018-06-17T21:26:31Z","timestamp":1529270791000},"page":"1950077","source":"Crossref","is-referenced-by-count":2,"title":["Practical Reliability Analysis and Approximate Design of Arithmetic Circuits"],"prefix":"10.1142","volume":"28","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1778-2304","authenticated-orcid":false,"given":"Xingjian","family":"Xu","sequence":"first","affiliation":[{"name":"School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2639-201X","authenticated-orcid":false,"given":"Tian","family":"Ban","sequence":"additional","affiliation":[{"name":"School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuehua","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,5,13]]},"reference":[{"key":"S0218126619500774BIB001","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.06.020"},{"key":"S0218126619500774BIB002","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126617500165"},{"key":"S0218126619500774BIB003","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/5684902"},{"key":"S0218126619500774BIB004","doi-asserted-by":"publisher","DOI":"10.1108\/COMPEL-08-2015-0266"},{"key":"S0218126619500774BIB005","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.130"},{"key":"S0218126619500774BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2501286"},{"key":"S0218126619500774BIB007","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2317180"},{"key":"S0218126619500774BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2015.7182095"},{"key":"S0218126619500774BIB009","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2772896"},{"key":"S0218126619500774BIB010","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.06.017"},{"key":"S0218126619500774BIB011","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2014563"},{"key":"S0218126619500774BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2020591"},{"key":"S0218126619500774BIB013","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2016839"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126619500774","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,20]],"date-time":"2019-09-20T00:45:14Z","timestamp":1568940314000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126619500774"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":13,"journal-issue":{"issue":"05","published-online":{"date-parts":[[2019,5,13]]},"published-print":{"date-parts":[[2019,5]]}},"alternative-id":["10.1142\/S0218126619500774"],"URL":"https:\/\/doi.org\/10.1142\/s0218126619500774","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2019,5]]}}}