{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,29]],"date-time":"2025-10-29T03:45:25Z","timestamp":1761709525075,"version":"3.37.3"},"reference-count":20,"publisher":"World Scientific Pub Co Pte Ltd","issue":"12","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2019,11]]},"abstract":"<jats:p> Quantum reversible circuit is a new emerging technology attracting the researchers. A reversible circuit is composed of reversible gates. One example of reversible gate is Toffoli gate. A Toffoli gate (also known as [Formula: see text]-CNOT) has two components\u00a0\u2014 the control and the target. Initially, stuck-at fault and other fault models were used for modeling defects in quantum reversible circuits. Later, a new fault model known as missing gate fault model was introduced, which is more effective in capturing the errors in quantum reversible circuit. Boolean Difference is already a known technique to detect stuck-at faults in conventional CMOS circuit. In this paper, Boolean Difference method is applied to derive the test set for detecting each stuck-at fault and missing gate fault in a reversible circuit. Then an optimization algorithm is used to derive an optimal test set, which will detect all possible faults in a circuit. The method is valid also for other fault models. <\/jats:p>","DOI":"10.1142\/s0218126619502128","type":"journal-article","created":{"date-parts":[[2018,12,9]],"date-time":"2018-12-09T21:22:50Z","timestamp":1544390570000},"page":"1950212","source":"Crossref","is-referenced-by-count":2,"title":["Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits"],"prefix":"10.1142","volume":"28","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2029-132X","authenticated-orcid":false,"given":"Joyati","family":"Mondal","sequence":"first","affiliation":[{"name":"AKCSIT, Calcutta University, JD-2, Sector 3, Salt Lake City, Kolkata 700009, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bappaditya","family":"Mondal","sequence":"additional","affiliation":[{"name":"Indian Institute of Engineering Science and Technology, Shibpur, Howrah 711103, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dipak Kumar","family":"Kole","sequence":"additional","affiliation":[{"name":"Jalpaiguri Government Engineering College, Jalpaiguri 735102, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hafizur","family":"Rahaman","sequence":"additional","affiliation":[{"name":"Indian Institute of Engineering Science and Technology, Shibpur, Howrah 711103, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Debesh Kumar","family":"Das","sequence":"additional","affiliation":[{"name":"Jadavpur University, Kolkata 700098, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,11,14]]},"reference":[{"key":"S0218126619502128BIB001","doi-asserted-by":"publisher","DOI":"10.1109\/43.62730"},{"key":"S0218126619502128BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.889370"},{"key":"S0218126619502128BIB003","doi-asserted-by":"publisher","DOI":"10.1147\/rd.53.0183"},{"key":"S0218126619502128BIB004","doi-asserted-by":"publisher","DOI":"10.1147\/rd.176.0525"},{"key":"S0218126619502128BIB005","doi-asserted-by":"publisher","DOI":"10.1147\/rd.321.0016"},{"key":"S0218126619502128BIB006","series-title":"Frontiers in Physics","volume-title":"Feynman Lectures on Computation","volume":"95","author":"Feynman R. 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