{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:37:42Z","timestamp":1740116262179,"version":"3.37.3"},"reference-count":34,"publisher":"World Scientific Pub Co Pte Ltd","issue":"07","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61504102"],"award-info":[{"award-number":["61504102"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["11604251"],"award-info":[{"award-number":["11604251"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"National Key Project of Intergovernmental Cooperation in International Scientific and Technological Innovation","award":["2016YFE0107900"],"award-info":[{"award-number":["2016YFE0107900"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2020,6,15]]},"abstract":"<jats:p> A high-linearity Multi-stAge noise SHaping (MASH) 2\u20132\u20132 sigma\u2013delta modulator (SDM) for 20-MHz signal bandwidth (BW) was presented. Multi-bit quantizers were employed in each stage to provide a sufficiently low quantization noise level and thus improve the signal-to-noise ratio (SNR) performance of the modulator. Mismatch noise in the internal multi-bit digital-to-analog converters (DACs) was analyzed in detail, and an alternative randomization scheme based on multi-layer butterfly-type network was proposed to suppress spurious tones in the output spectrum. Fabricated in a 0.18-[Formula: see text]m single\u2013poly 4-metal Complementary Metal Oxide Semiconductor (CMOS) process, the modulator occupied a chip area of 0.45[Formula: see text]mm<jats:sup>2<\/jats:sup>, and dissipated a power of 28.8[Formula: see text]mW from a 1.8-V power supply at a sampling rate of 320[Formula: see text]MHz. The measured spurious-free dynamic range (SFDR) was 94[Formula: see text]dB where 17-dB improvement was achieved by applying the randomizers for multi-bit DACs in the first two stages. The peak signal-to-noise and distortion ratio (SNDR) was 76.9[Formula: see text]dB at [Formula: see text]1 dBFS @ 2.5-MHz input, and the figure-of-merit (FOM) was 126[Formula: see text]pJ\/conv. <\/jats:p>","DOI":"10.1142\/s021812662050108x","type":"journal-article","created":{"date-parts":[[2019,8,13]],"date-time":"2019-08-13T02:41:24Z","timestamp":1565664084000},"page":"2050108","source":"Crossref","is-referenced-by-count":2,"title":["A 20-MHz BW MASH Sigma\u2013Delta Modulator with Mismatch Noise Randomization for Multi-Bit DACs"],"prefix":"10.1142","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6118-7401","authenticated-orcid":false,"given":"Di","family":"Li","sequence":"first","affiliation":[{"name":"School of Microelectronics, Xidian University, No. 2 Taibai Road, Mailbox 373, Xi\u2019an, Shaanxi 710071, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunlong","family":"Fei","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University, No. 2 Taibai Road, Mailbox 373, Xi\u2019an, Shaanxi 710071, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qidong","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University, No. 2 Taibai Road, Mailbox 373, Xi\u2019an, Shaanxi 710071, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yani","family":"Li","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University, No. 2 Taibai Road, Mailbox 373, Xi\u2019an, Shaanxi 710071, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yintang","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University, No. 2 Taibai Road, Mailbox 373, Xi\u2019an, Shaanxi 710071, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,9,11]]},"reference":[{"key":"S021812662050108XBIB002","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2859401"},{"key":"S021812662050108XBIB004","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2221215"},{"key":"S021812662050108XBIB005","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2008.54"},{"key":"S021812662050108XBIB006","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2203819"},{"key":"S021812662050108XBIB007","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2503714"},{"key":"S021812662050108XBIB008","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2468857"},{"key":"S021812662050108XBIB009","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2453953"},{"key":"S021812662050108XBIB010","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2503706"},{"key":"S021812662050108XBIB011","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2859961"},{"key":"S021812662050108XBIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2534358"},{"key":"S021812662050108XBIB013","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2017.8240236"},{"key":"S021812662050108XBIB014","doi-asserted-by":"publisher","DOI":"10.1109\/4.848205"},{"key":"S021812662050108XBIB015","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.1655"},{"key":"S021812662050108XBIB016","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2615321"},{"key":"S021812662050108XBIB019","first-page":"1","volume-title":"Proc. IEEE Custom Integrated Circuits Conf.","author":"Chae J.","year":"2010"},{"key":"S021812662050108XBIB020","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2304364"},{"key":"S021812662050108XBIB021","doi-asserted-by":"publisher","DOI":"10.1109\/4.735536"},{"key":"S021812662050108XBIB022","doi-asserted-by":"publisher","DOI":"10.1109\/4.808896"},{"key":"S021812662050108XBIB023","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.819163"},{"key":"S021812662050108XBIB025","first-page":"364","volume-title":"Proc. IEEE Int. Solid-State Circuits Conf.","author":"Huang Q.","year":"2004"},{"key":"S021812662050108XBIB026","doi-asserted-by":"publisher","DOI":"10.1049\/el:19880715"},{"key":"S021812662050108XBIB028","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.829923"},{"key":"S021812662050108XBIB030","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342714"},{"key":"S021812662050108XBIB031","doi-asserted-by":"publisher","DOI":"10.1109\/PRIMEASIA.2010.5604958"},{"key":"S021812662050108XBIB033","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.922736"},{"key":"S021812662050108XBIB034","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2019166"},{"key":"S021812662050108XBIB035","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2774280"},{"key":"S021812662050108XBIB036","first-page":"434","volume":"22","author":"Stornelli V.","year":"2013","journal-title":"Radioengineering"},{"key":"S021812662050108XBIB037","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-013-0051-9"},{"key":"S021812662050108XBIB038","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1996.539871"},{"key":"S021812662050108XBIB039","doi-asserted-by":"publisher","DOI":"10.1109\/82.633435"},{"key":"S021812662050108XBIB040","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1988.20911"},{"key":"S021812662050108XBIB041","doi-asserted-by":"publisher","DOI":"10.1109\/4.18585"},{"key":"S021812662050108XBIB042","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2387849"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S021812662050108X","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,6,11]],"date-time":"2020-06-11T00:35:13Z","timestamp":1591835713000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S021812662050108X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9,11]]},"references-count":34,"journal-issue":{"issue":"07","published-print":{"date-parts":[[2020,6,15]]}},"alternative-id":["10.1142\/S021812662050108X"],"URL":"https:\/\/doi.org\/10.1142\/s021812662050108x","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2019,9,11]]}}}