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In this paper, the reliability and mean time to failure (MTTF) of the CBC, and two- and three-stage IBCs are figured out. Using the obtained results and considering various scenarios, a comprehensive comparison is provided. In addition, the operation of the converter in case of fault occurrence for high and low capacities is analyzed and reliability is evaluated in each state. The relation between the reliability and temperature of semiconductor elements is discussed. Furthermore, a laboratory-scaled prototype is used to extract the experimental results of the temperature variation of the elements during a fault. Markov model is used to evaluate the analyzed reliability. <\/jats:p>","DOI":"10.1142\/s021812662050139x","type":"journal-article","created":{"date-parts":[[2019,9,30]],"date-time":"2019-09-30T02:46:40Z","timestamp":1569811600000},"page":"2050139","source":"Crossref","is-referenced-by-count":3,"title":["Markov Chain Modeling for Reliability Analysis of Multi-Phase Buck Converters"],"prefix":"10.1142","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2100-1208","authenticated-orcid":false,"given":"Elias Shokati","family":"Asl","sequence":"first","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"},{"name":"Faculty of Engineering, University of Mohaghegh Ardabili, Ardabil, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehran","family":"Sabahi","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehdi","family":"Abapour","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alireza Eyvazizadeh","family":"Khosroshahi","sequence":"additional","affiliation":[{"name":"School of Engineering, University of British Columbia, Kelowna, BC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hossein","family":"Khoun-Jahan","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,11,7]]},"reference":[{"key":"S021812662050139XBIB001","doi-asserted-by":"publisher","DOI":"10.1109\/24.974125"},{"key":"S021812662050139XBIB002","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2011.6063620"},{"key":"S021812662050139XBIB003","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2010.5448046"},{"key":"S021812662050139XBIB004","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.921388"},{"key":"S021812662050139XBIB005","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.818148"},{"key":"S021812662050139XBIB006","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2013.835359"},{"key":"S021812662050139XBIB007","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2012.682250"},{"key":"S021812662050139XBIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2308357"},{"key":"S021812662050139XBIB009","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2357836"},{"key":"S021812662050139XBIB010","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2358555"},{"key":"S021812662050139XBIB011","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2361918"},{"key":"S021812662050139XBIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2278509"},{"key":"S021812662050139XBIB013","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192503"},{"key":"S021812662050139XBIB014","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.06.053"},{"key":"S021812662050139XBIB015","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.152"},{"key":"S021812662050139XBIB016","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2216238"},{"key":"S021812662050139XBIB017","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2157939"},{"key":"S021812662050139XBIB018","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2397881"},{"key":"S021812662050139XBIB019","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301774"},{"key":"S021812662050139XBIB020","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2393812"},{"key":"S021812662050139XBIB021","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2228505"},{"key":"S021812662050139XBIB022","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2090948"},{"key":"S021812662050139XBIB023","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273976"},{"key":"S021812662050139XBIB024","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2400421"},{"key":"S021812662050139XBIB025","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2380829"},{"key":"S021812662050139XBIB026","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2766787"},{"key":"S021812662050139XBIB027","doi-asserted-by":"publisher","DOI":"10.1016\/B978-012088525-1\/50005-5"},{"key":"S021812662050139XBIB028","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2773611"},{"volume-title":"Handbook of 217 Plus Reliability Prediction Models","year":"2006","author":"Denson W.","key":"S021812662050139XBIB029"},{"volume-title":"Reliability Modeling: The RIAC Quide to Reliability Prediction, Assessment and Estimation","year":"2006","author":"Denson W.","key":"S021812662050139XBIB030"},{"key":"S021812662050139XBIB031","unstructured":"D. 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