{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T05:37:15Z","timestamp":1740116235972,"version":"3.37.3"},"reference-count":19,"publisher":"World Scientific Pub Co Pte Ltd","issue":"13","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2020,10]]},"abstract":"<jats:p>In this paper, two approaches are evaluated using the Full Error Detection and Correction (FEDC) method for a pipelined structure. The approaches are referred to as Full Duplication with Comparison (FDC) and Concurrent Checking with Parity Prediction (CCPP). Aforementioned approaches are focused on the borderline cases of FEDC method which implement Error Detection Circuit (EDC) in two manners for the purpose of protection of combinational logic to address the soft errors of unspecified duration. The FDC approach implements a full duplication of the combinational circuit, as the most complex and expensive implementation of the FEDC method, and the CCPP approach implements only the parity prediction bit, being the simplest and cheapest technique, for soft error detection. Both approaches are capable of detecting soft errors in the combinational logic, with single faults being injected into the design. On the one hand, the FDC approach managed to detect and correct all injected faults while the CCPP approach could not detect multiple faults created at the output of combinational circuit. On the other hand, the FDC approach leads to higher power consumption and area increase compared to the CCPP approach.<\/jats:p>","DOI":"10.1142\/s0218126620502187","type":"journal-article","created":{"date-parts":[[2020,2,4]],"date-time":"2020-02-04T07:38:12Z","timestamp":1580801892000},"page":"2050218","source":"Crossref","is-referenced-by-count":1,"title":["Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches"],"prefix":"10.1142","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9294-679X","authenticated-orcid":false,"given":"Mehmed","family":"Dug","sequence":"first","affiliation":[{"name":"IHP \u2014 Leibniz-Institut f\u00fcr Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stefan","family":"Weidling","sequence":"additional","affiliation":[{"name":"IHP \u2014 Leibniz-Institut f\u00fcr Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Egor","family":"Sogomonyan","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Potsdam, August-Bebel-Stra\u00dfe 89, 15236 Potsdam, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dejan","family":"Jokic","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, International Burch University, Francuske revolucije bb, 71210 Ilid\u017ea, Bosnia and Herzegovina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP \u2014 Leibniz-Institut f\u00fcr Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany"},{"name":"Department of Computer Science, University of Potsdam, August-Bebel-Stra\u00dfe 89, 15236 Potsdam, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2020,3,4]]},"reference":[{"key":"S0218126620502187BIB001","series-title":"Frontiers in Electrronic Testing","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1007\/978-1-4419-6993-4_2","volume-title":"Soft Errors in Modern Electronics Systems","volume":"41","author":"Gaillard R.","year":"2010"},{"key":"S0218126620502187BIB002","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1109\/DATE.2005.274","volume-title":"Proc. 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