{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,14]],"date-time":"2025-05-14T02:28:38Z","timestamp":1747189718671,"version":"3.40.5"},"reference-count":26,"publisher":"World Scientific Pub Co Pte Ltd","issue":"09","funder":[{"name":"Natural Science Foundation Applying System of Tianjin","award":["18JCYBJC90400"],"award-info":[{"award-number":["18JCYBJC90400"]}]},{"name":"Development Fund of Tianjin Education Commission for Higher Education","award":["2019KJ014"],"award-info":[{"award-number":["2019KJ014"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2021,7]]},"abstract":"<jats:p> In the widely used single-molecule Deoxyribonucleic Acid (DNA) sequencing and patch-clamp technique, the fast capacitance (C-Fast) noise in application circuit affects the accuracy of the system measurement. In this paper, a high-performance C-Fast compensation method based on compensation circuit and fuzzy adaptive algorithm is proposed. The model of C-Fast noise is analyzed and a C-Fast compensation circuit is designed, whose parameters can be automatically calculated and adjusted by fuzzy adaptive algorithm. The method is validated through simulations and experiments on the test setup. The results indicate that the proposed method can effectively eliminate the C-Fast noise and improve the measurement accuracy. <\/jats:p>","DOI":"10.1142\/s0218126621501528","type":"journal-article","created":{"date-parts":[[2020,11,12]],"date-time":"2020-11-12T06:41:06Z","timestamp":1605163266000},"page":"2150152","source":"Crossref","is-referenced-by-count":0,"title":["A High-Performance Fast Capacitance Compensation Method"],"prefix":"10.1142","volume":"30","author":[{"given":"Jinzhen","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, TianGong University, Tianjin 300387, P.\u00a0R.\u00a0China"},{"name":"Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin 300387, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5541-4783","authenticated-orcid":false,"given":"Fangfang","family":"Ye","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, TianGong University, Tianjin 300387, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui","family":"Xiong","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, TianGong University, Tianjin 300387, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2021,4,14]]},"reference":[{"key":"S0218126621501528BIB001","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2225044"},{"key":"S0218126621501528BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2200893"},{"key":"S0218126621501528BIB003","doi-asserted-by":"publisher","DOI":"10.1007\/s40846-016-0165-5"},{"key":"S0218126621501528BIB004","doi-asserted-by":"publisher","DOI":"10.1038\/nbt.2171"},{"key":"S0218126621501528BIB005","doi-asserted-by":"publisher","DOI":"10.1038\/nmat1143"},{"key":"S0218126621501528BIB006","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.85.3057"},{"key":"S0218126621501528BIB007","doi-asserted-by":"publisher","DOI":"10.1049\/iet-nbt.2015.0066"},{"key":"S0218126621501528BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2008.2005419"},{"key":"S0218126621501528BIB009","first-page":"164","volume-title":"IEEE\/NIH Life Sci. 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