{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T23:54:07Z","timestamp":1767916447816,"version":"3.49.0"},"reference-count":33,"publisher":"World Scientific Pub Co Pte Ltd","issue":"03","funder":[{"name":"The Provincial Engineering Research Center of Jiangsu, the Innovation and Application of Jiangsu Small Business Industrial Internet Engineering Research Center"},{"name":"General program of natural science research in Jiangsu University","award":["19KJB520023"],"award-info":[{"award-number":["19KJB520023"]}]},{"name":"Open Lab of Edge of Computing for Smart Manufacturing","award":["KYPT201802Z"],"award-info":[{"award-number":["KYPT201802Z"]}]},{"name":"Natural science research project of Changzhou College of Information Technology","award":["CXKZ201905Y"],"award-info":[{"award-number":["CXKZ201905Y"]}]},{"name":"Natural science research project of Changzhou College of Information Technology","award":["CXKZ201907Y"],"award-info":[{"award-number":["CXKZ201907Y"]}]},{"name":"Natural science research project for Higher Education of Jiangsu","award":["18KJB480001"],"award-info":[{"award-number":["18KJB480001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2022,2]]},"abstract":"<jats:p> Existing block-level defect detection method in patterned fabric causes a large number of false detections due to the lack of edge information. To solve this problem, in this paper, we propose a bilayer Markov random field (BMRF) method for inspecting defects in patterned fabric. First, the proposed method reduces samples of the original fabric image to obtain the constraint layer, which can locate the defective block roughly. Second, we interpolate samples into the image to supplement the local information to improve and optimize the imperfect boundary, to obtain a more detailed data layer. Moreover, this paper proposes a new potential function, which considers the differential characteristics of the image blocks in the same layer and the transition probability between different layers. Finally, this paper utilizes a parameter estimation method based on the expectation maximization to solve the parameters of the BMRF method. The proposed BMRF method is evaluated on databases of star-, box- and dot-patterned fabrics. By comparing the resultant and ground-truth images, the recall rate of the proposed method in the three patterned fabrics is 95.32%, 89.29% and 93.28%, respectively, which is comparable to the existing methods. <\/jats:p>","DOI":"10.1142\/s021812662250058x","type":"journal-article","created":{"date-parts":[[2021,9,30]],"date-time":"2021-09-30T14:47:26Z","timestamp":1633013246000},"source":"Crossref","is-referenced-by-count":13,"title":["Bilayer Markov Random Field Method for Detecting Defects in Patterned Fabric"],"prefix":"10.1142","volume":"31","author":[{"given":"Xingzhi","family":"Chang","sequence":"first","affiliation":[{"name":"Open Lab of Industrial Cloud for Intelligent Manufacturing, Changzhou College of Information Technology, Changzhou 213164, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8393-1980","authenticated-orcid":false,"given":"Wei","family":"Liu","sequence":"additional","affiliation":[{"name":"Open Lab of Industrial Cloud for Intelligent Manufacturing, Changzhou College of Information Technology, Changzhou 213164, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chuan","family":"Zhu","sequence":"additional","affiliation":[{"name":"Open Lab of Industrial Cloud for Intelligent Manufacturing, Changzhou College of Information Technology, Changzhou 213164, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaohua","family":"Zou","sequence":"additional","affiliation":[{"name":"Open Lab of Industrial Cloud for Intelligent Manufacturing, Changzhou College of Information Technology, Changzhou 213164, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3888-2881","authenticated-orcid":false,"given":"Guan","family":"Gui","sequence":"additional","affiliation":[{"name":"College of Telecommunication and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2021,9,30]]},"reference":[{"key":"S021812662250058XBIB001","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.10.006"},{"key":"S021812662250058XBIB002","first-page":"1","volume":"99","author":"Yu K.","year":"2021","journal-title":"IEEE Int. Things J."},{"key":"S021812662250058XBIB003","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2011.02.002"},{"key":"S021812662250058XBIB004","doi-asserted-by":"publisher","DOI":"10.1364\/AO.54.002963"},{"key":"S021812662250058XBIB005","doi-asserted-by":"publisher","DOI":"10.1108\/IJCST-03-2013-0031"},{"key":"S021812662250058XBIB006","doi-asserted-by":"publisher","DOI":"10.1007\/s12221-020-9728-8"},{"key":"S021812662250058XBIB007","doi-asserted-by":"publisher","DOI":"10.1111\/cote.12154"},{"key":"S021812662250058XBIB008","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2009.03.007"},{"key":"S021812662250058XBIB009","first-page":"1","volume-title":"J. Photonics","volume":"6","author":"Rebhi A.","year":"2015"},{"key":"S021812662250058XBIB010","doi-asserted-by":"crossref","first-page":"5947","DOI":"10.1109\/ACCESS.2017.2675940","volume":"5","author":"Tong L.","year":"2017","journal-title":"IEEE Access"},{"key":"S021812662250058XBIB011","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126621502728"},{"key":"S021812662250058XBIB012","doi-asserted-by":"publisher","DOI":"10.1063\/1.1916744"},{"key":"S021812662250058XBIB013","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.3030856"},{"key":"S021812662250058XBIB014","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2021.3076015"},{"key":"S021812662250058XBIB015","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1195\/1\/012006"},{"key":"S021812662250058XBIB016","first-page":"634","volume":"182","author":"Li Y. H.","year":"2012","journal-title":"Appl. Mech. Mater."},{"key":"S021812662250058XBIB017","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cim.2020.0062"},{"key":"S021812662250058XBIB018","doi-asserted-by":"publisher","DOI":"10.4304\/jmm.6.5.416-424"},{"key":"S021812662250058XBIB019","doi-asserted-by":"publisher","DOI":"10.1109\/MWC.001.2000374"},{"key":"S021812662250058XBIB020","first-page":"1","volume":"78","author":"Li P.","year":"2017","journal-title":"Multimed. Tools Appl."},{"key":"S021812662250058XBIB021","first-page":"1","volume":"24","author":"Liu G.","year":"2021","journal-title":"Vis. Comput."},{"key":"S021812662250058XBIB022","first-page":"1","volume":"99","author":"Guo Z.","year":"2021","journal-title":"IEEE Trans. Fuzzy Syst."},{"key":"S021812662250058XBIB023","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2004.07.009"},{"key":"S021812662250058XBIB024","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2015.09.022"},{"key":"S021812662250058XBIB025","doi-asserted-by":"publisher","DOI":"10.1117\/1.2345189"},{"key":"S021812662250058XBIB026","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2008.917140"},{"key":"S021812662250058XBIB027","first-page":"1","volume":"4","author":"Shi B.","year":"2019","journal-title":"IEEE Access"},{"key":"S021812662250058XBIB028","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2314240"},{"key":"S021812662250058XBIB029","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.01.039"},{"key":"S021812662250058XBIB030","first-page":"1","volume":"2018","author":"Chang X.","year":"2018","journal-title":"Math. Problems Eng."},{"key":"S021812662250058XBIB031","doi-asserted-by":"publisher","DOI":"10.1080\/01431161.2016.1244364"},{"key":"S021812662250058XBIB032","volume-title":"Markov Random Field Modeling in Image Analysis","author":"Li S. Z.","year":"1990","edition":"5"},{"key":"S021812662250058XBIB033","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2015.2425225"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S021812662250058X","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,8]],"date-time":"2022-03-08T10:01:33Z","timestamp":1646733693000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S021812662250058X"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,30]]},"references-count":33,"journal-issue":{"issue":"03","published-print":{"date-parts":[[2022,2]]}},"alternative-id":["10.1142\/S021812662250058X"],"URL":"https:\/\/doi.org\/10.1142\/s021812662250058x","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,9,30]]},"article-number":"2250058"}}