{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T10:11:56Z","timestamp":1755598316806,"version":"3.41.2"},"reference-count":38,"publisher":"World Scientific Pub Co Pte Ltd","issue":"05","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2022,3,30]]},"abstract":"<jats:p> In this paper, an investigation on compact microstrip low-pass filters (MLPFs) with extremely perfect low-pass characteristics and improved out-band suppression has been carried out for the improvement of the selectivity parameter ([Formula: see text]). For this purpose, two different defected ground structures (DGSs) based on Moore fractals and Meander line have been designed and experimentally validated. The proposed third-order low-pass filter (LPF) configurations are designed and simulated using the High-Frequency Structure Simulator (HFSS). To validate the simulation models, the prototypes of the suggested low-pass filters are fabricated using Teflon (TM) substrate having a relative permittivity of 2.65 and a loss tangent of 0.001, and measured using the Vector Network Analyzer. The simulation and measurement results are in good agreement. The proposed filters occupy a compact size of [Formula: see text]. The selectivity parameter values for the proposed Moore fractals- and Meander line-modeled DGS-based LPFs are 425[Formula: see text]dB\/GHz and 850[Formula: see text]dB\/GHz, respectively. The proposed microstrip low-pass filters offer a significant improvement in the selectivity parameter, offering a maximum value of 850[Formula: see text]dB\/GHz. The proposed filters exhibit a very high figure of merit (FOM), reporting 71,335 for Moore fractals-based LPF and 118,354 for the Meander line-based LPF. These proposed filters are suitable for advanced mobile phone services, [Formula: see text]-band radar, Global Positioning System, mobile, paging services, Wi-Fi, Bluetooth and wireless LAN. <\/jats:p>","DOI":"10.1142\/s0218126622500906","type":"journal-article","created":{"date-parts":[[2021,10,24]],"date-time":"2021-10-24T12:53:41Z","timestamp":1635080021000},"source":"Crossref","is-referenced-by-count":3,"title":["Investigations on Three-Pole Microstrip Low-Pass Filters Incorporated with DGS and Fractals for Selectivity Improvement"],"prefix":"10.1142","volume":"31","author":[{"given":"Ch. Murali","family":"Krishna","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, PDPM Indian Institute of Information Technology Design and Manufacturing Jabalpur, Dumna Airport Road, Jabalpur 482005, Madhya Pradesh, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4555-7438","authenticated-orcid":false,"given":"Sudipta","family":"Das","sequence":"additional","affiliation":[{"name":"Department of Electronics & Communication Engineering, IMPS College of Engineering & Technology, Nityanandapur P.O., Chandipur (Kazigram), Malda 732103, West Bengal, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chaitali","family":"Koley","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology Mizoram, Chaltlang, Aizwal 796012, Mizoram, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B. T. P.","family":"Madhav","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Green Fields, Vaddeswaram, Guntur 522502, AP, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2021,10,23]]},"reference":[{"key":"S0218126622500906BIB001","doi-asserted-by":"publisher","DOI":"10.1002\/0471221619"},{"key":"S0218126622500906BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1969.1127058"},{"key":"S0218126622500906BIB003","doi-asserted-by":"publisher","DOI":"10.1142\/S0218126621501310"},{"key":"S0218126622500906BIB004","doi-asserted-by":"publisher","DOI":"10.13164\/re.2017.0269"},{"key":"S0218126622500906BIB005","first-page":"98","volume":"3","author":"Das S.","year":"2012","journal-title":"Int. J. Electron. Commun. Technol."},{"key":"S0218126622500906BIB006","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.3673"},{"key":"S0218126622500906BIB007","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2018.05.030"},{"key":"S0218126622500906BIB008","doi-asserted-by":"publisher","DOI":"10.1002\/mop.21236"},{"key":"S0218126622500906BIB009","doi-asserted-by":"publisher","DOI":"10.1007\/s40998-019-00191-w"},{"key":"S0218126622500906BIB010","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2019.153032"},{"key":"S0218126622500906BIB011","doi-asserted-by":"publisher","DOI":"10.2528\/PIERC16073003"},{"key":"S0218126622500906BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2007.901769"},{"key":"S0218126622500906BIB013","doi-asserted-by":"publisher","DOI":"10.1109\/RFIT.2014.6933260"},{"key":"S0218126622500906BIB014","doi-asserted-by":"publisher","DOI":"10.1109\/ACCT.2012.38"},{"key":"S0218126622500906BIB015","doi-asserted-by":"publisher","DOI":"10.1049\/el.2012.3473"},{"key":"S0218126622500906BIB016","doi-asserted-by":"publisher","DOI":"10.2528\/PIERC18092107"},{"key":"S0218126622500906BIB017","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8040403"},{"key":"S0218126622500906BIB018","doi-asserted-by":"publisher","DOI":"10.13164\/re.2015.0708"},{"key":"S0218126622500906BIB019","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2010.2047457"},{"key":"S0218126622500906BIB020","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2011.2132120"},{"key":"S0218126622500906BIB021","doi-asserted-by":"publisher","DOI":"10.1017\/S1759078716000556"},{"key":"S0218126622500906BIB022","doi-asserted-by":"publisher","DOI":"10.1017\/S175907871400124X"},{"key":"S0218126622500906BIB023","doi-asserted-by":"publisher","DOI":"10.1049\/el.2016.3431"},{"key":"S0218126622500906BIB024","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2017.10.022"},{"key":"S0218126622500906BIB025","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2015.2440773"},{"key":"S0218126622500906BIB026","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.3490"},{"key":"S0218126622500906BIB027","doi-asserted-by":"publisher","DOI":"10.2528\/PIERM18052909"},{"key":"S0218126622500906BIB028","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2020.153318"},{"key":"S0218126622500906BIB029","doi-asserted-by":"publisher","DOI":"10.2528\/PIERL19120802"},{"key":"S0218126622500906BIB030","doi-asserted-by":"publisher","DOI":"10.1515\/freq-2016-0111"},{"key":"S0218126622500906BIB031","doi-asserted-by":"publisher","DOI":"10.1002\/mop.32144"},{"key":"S0218126622500906BIB032","doi-asserted-by":"publisher","DOI":"10.2528\/PIERM18062605"},{"key":"S0218126622500906BIB033","doi-asserted-by":"publisher","DOI":"10.1515\/freq-2017-0062"},{"key":"S0218126622500906BIB034","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.21235"},{"key":"S0218126622500906BIB035","doi-asserted-by":"publisher","DOI":"10.1109\/LAPC.2009.5352551"},{"key":"S0218126622500906BIB036","doi-asserted-by":"publisher","DOI":"10.1109\/APMC.2015.7413399"},{"key":"S0218126622500906BIB037","doi-asserted-by":"publisher","DOI":"10.1002\/mop.10212"},{"key":"S0218126622500906BIB038","doi-asserted-by":"publisher","DOI":"10.1080\/00207217.2013.769180"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126622500906","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T05:57:47Z","timestamp":1648447067000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126622500906"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,23]]},"references-count":38,"journal-issue":{"issue":"05","published-print":{"date-parts":[[2022,3,30]]}},"alternative-id":["10.1142\/S0218126622500906"],"URL":"https:\/\/doi.org\/10.1142\/s0218126622500906","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2021,10,23]]},"article-number":"2250090"}}