{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T12:44:55Z","timestamp":1756385095103,"version":"3.41.2"},"reference-count":17,"publisher":"World Scientific Pub Co Pte Ltd","issue":"13","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2022,9,15]]},"abstract":"<jats:p> Glitch at the input can increase the power consumption of flip-flop greatly. To solve this problem effectively, a Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements (LARC) is proposed in this paper. The proposed Latch Multiplexer-A Double-edge Triggered Flip-flop (LARC-DET) can effectively block the glitch at the input and prevent the redundant transition at internal nodes. As a result, the extra power consumption caused by the glitch at the input is effectively reduced. The simulation was performed using HSPICE under 32[Formula: see text]nm complementary metal oxide semiconductor (CMOS) process. The simulation results show that, compared with 12 double edge flip-flops, the proposed LARC-DET is the lowest in terms of power consumption and power delay product. Process voltage temperature (PVT) variation analysis shows its insensitivity to voltage variation, temperature variation and process variation. <\/jats:p>","DOI":"10.1142\/s0218126622502310","type":"journal-article","created":{"date-parts":[[2022,4,28]],"date-time":"2022-04-28T10:23:06Z","timestamp":1651141386000},"source":"Crossref","is-referenced-by-count":2,"title":["Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements"],"prefix":"10.1142","volume":"31","author":[{"given":"Zhengfeng","family":"Huang","sequence":"first","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wanshu","family":"Zhong","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lanxi","family":"Duan","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianan","family":"Wang","sequence":"additional","affiliation":[{"name":"The 24th Research Institute of CETC, Chongqing 401332, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tai","family":"Song","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Anhui University, 11 Jiulong Road, Hefei, Anhui 230601, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yingchun","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, 193 Tunxi Road, Hefei, Anhui 230009, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2022,5,20]]},"reference":[{"first-page":"138","volume-title":"IEEE Int. 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