{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T13:36:40Z","timestamp":1753882600149,"version":"3.41.2"},"reference-count":44,"publisher":"World Scientific Pub Co Pte Ltd","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2023,1,15]]},"abstract":"<jats:p> Programming Online Verification Exam (OE) system has been widely used in algorithm education and practice since it can automatically analyze program results (e.g., correct or incorrect) after executing the submitted programs with corresponding test cases. OE systems can provide both execution results and error information so that novice programmers can get feedback quickly. If the submitted program cannot pass all the test cases, the novice programmers will get wrong-answer feedback, and they have to find and fix the errors in the program. Automated program fault localization techniques, which can locate the errors in programs under test automatically, thus help novice programmers fix the errors quickly. However, the performance of current automated fault localization techniques is limited due to the high-density test cases in novice programs of OE system. In this paper, we analyze the impact of test case density (TCD) and execution variety on fault localization performance and propose a method to reduce TCD to improve fault localization precision for novice programs. To evaluate the performance of our method, we conduct a number of empirical studies on 1199 real fault diagnosis algorithm related novice programs, and the experimental results show that using improved test cases through our method for fault localization in OE system can enhance the precision of fault localization for novice programs. Specifically, after decreasing the test cases\u2019 density, the improvement of fault localization accuracy ranges from 0.6% to 17.34% in terms of the Expense metric, and from the Accuracy@N metrics, the number of faulty statements that can be found increases in most cases. <\/jats:p>","DOI":"10.1142\/s0218126623500159","type":"journal-article","created":{"date-parts":[[2022,7,21]],"date-time":"2022-07-21T17:02:48Z","timestamp":1658422968000},"source":"Crossref","is-referenced-by-count":0,"title":["Investigating the Impact of Test Case Density and Execution Variety on Fault Localization for Novice Programs"],"prefix":"10.1142","volume":"32","author":[{"given":"YingChun","family":"Wang","sequence":"first","affiliation":[{"name":"Institue of Noise and Vibration, Naval University of Engineering, Wuhan, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"He","sequence":"additional","affiliation":[{"name":"Institue of Noise and Vibration, Naval University of Engineering, Wuhan, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nannan","family":"Chen","sequence":"additional","affiliation":[{"name":"National Key Laboratory on Ship Vibration and Noise, Wuhan, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6561-0630","authenticated-orcid":false,"given":"Qi","family":"Zhai","sequence":"additional","affiliation":[{"name":"The Eighth Military Representatives Office of the Naval Equipment Department, Shanghai, P.\u00a0R.\u00a0China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2022,9,9]]},"reference":[{"key":"S0218126623500159BIB001","doi-asserted-by":"publisher","DOI":"10.1145\/3143560"},{"key":"S0218126623500159BIB002","first-page":"2","volume":"1","author":"Masters K.","year":"2011","journal-title":"Internet J. Med. Educ."},{"key":"S0218126623500159BIB003","doi-asserted-by":"crossref","first-page":"15","DOI":"10.1145\/2491956.2462195","volume-title":"Proceedings of the 34th ACM SIGPLAN Conference on Programming Language Design and Implementation","author":"Singh R.","year":"2013"},{"key":"S0218126623500159BIB004","doi-asserted-by":"crossref","first-page":"740","DOI":"10.1145\/3106237.3106262","volume-title":"Proc. 2017 11th Joint Meeting on Foundations of Software Engineering","author":"Yi J.","year":"2017"},{"key":"S0218126623500159BIB005","first-page":"41","volume-title":"Proc. 22nd ACM SIGSOFT Int. Symp. Foundations of Software Engineering","author":"Gulwani S.","year":"2014"},{"key":"S0218126623500159BIB006","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1145\/3296979.3192387","volume":"53","author":"Gulwani S.","year":"2018","journal-title":"ACM SIGPLAN Not."},{"key":"S0218126623500159BIB007","doi-asserted-by":"crossref","first-page":"785","DOI":"10.1109\/ICDM.2014.142","volume-title":"2014 IEEE Int. Conf. Data Mining","author":"Drummond A.","year":"2014"},{"key":"S0218126623500159BIB008","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/3210713.3210721","volume-title":"Proc. ACM Turing Celebration Conf.-China","author":"Zhou W.","year":"2018"},{"key":"S0218126623500159BIB009","first-page":"1259","volume-title":"2017 IEEE 33rd Int. Conf. Data Engineering (ICDE)","author":"Marin V. J.","year":"2017"},{"key":"S0218126623500159BIB010","first-page":"481","volume-title":"Proc. 39th ACM SIGPLAN Conf. Programming Language Design and Implementation","author":"Wang K.","year":"2018"},{"key":"S0218126623500159BIB011","doi-asserted-by":"crossref","first-page":"609","DOI":"10.1109\/ICSE.2017.62","volume-title":"2017 IEEE\/ACM 39th Int. Conf. Software Engineering (ICSE)","author":"Pearson S.","year":"2017"},{"key":"S0218126623500159BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"S0218126623500159BIB013","doi-asserted-by":"crossref","first-page":"191","DOI":"10.1145\/2483760.2483785","volume-title":"Proc. 2013 Int. Symp. Software Testing and Analysis","author":"Qi Y.","year":"2013"},{"key":"S0218126623500159BIB014","first-page":"1","volume-title":"2016 IEEE Frontiers in Education Conf. (FIE)","author":"Araujo E.","year":"2016"},{"key":"S0218126623500159BIB015","first-page":"83","volume-title":"2012 Int. Symp. Information Technologies in Medicine and Education","volume":"1","author":"Wu J.","year":"2012"},{"key":"S0218126623500159BIB016","doi-asserted-by":"publisher","DOI":"10.1145\/3183377.3183383"},{"key":"S0218126623500159BIB017","doi-asserted-by":"crossref","first-page":"37","DOI":"10.1007\/s40593-015-0070-z","volume":"27","author":"Rivers K.","year":"2017","journal-title":"Int. J. Artif. Intell. Educ."},{"key":"S0218126623500159BIB018","doi-asserted-by":"crossref","first-page":"181","DOI":"10.1109\/ICSME.2014.40","volume-title":"2014 IEEE Int. Conf. Software Maintenance and Evolution","author":"Wong C.-P.","year":"2014"},{"key":"S0218126623500159BIB019","first-page":"143","volume-title":"Proc. Sixth Int. Symp. Software Reliability Engineering. ISSRE\u201995","author":"Agrawal H.","year":"1995"},{"key":"S0218126623500159BIB020","first-page":"489","volume-title":"29th Int. Conf. Software Engineering (ICSE\u201907)","author":"Kim S.","year":"2007"},{"key":"S0218126623500159BIB021","first-page":"14","volume-title":"2012 34th Int. Conf. Software Engineering (ICSE)","author":"Zhou J.","year":"2012"},{"key":"S0218126623500159BIB022","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134324"},{"key":"S0218126623500159BIB023","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1109\/TAIC.PART.2007.13","volume-title":"Testing: Academic and Industrial Conf. Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007)","author":"Abreu R.","year":"2007"},{"key":"S0218126623500159BIB024","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2014.28"},{"key":"S0218126623500159BIB025","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.1509"},{"key":"S0218126623500159BIB026","first-page":"547","volume":"37","author":"Jaccard P.","year":"1901","journal-title":"Bull. Soc. Vaudoise Sci. Nat."},{"key":"S0218126623500159BIB027","first-page":"467","volume-title":"Int. Conf. Software Engineering","author":"Jones J. A.","year":"2005"},{"key":"S0218126623500159BIB028","first-page":"39","volume-title":"Pacific Rim Int. Symp. Dependable Computing","author":"Rui A.","year":"2006"},{"key":"S0218126623500159BIB029","doi-asserted-by":"publisher","DOI":"10.1145\/2000791.2000795"},{"key":"S0218126623500159BIB030","doi-asserted-by":"crossref","first-page":"290","DOI":"10.1109\/TR.2013.2285319","volume":"63","author":"Wong W. E.","year":"2014","journal-title":"IEEE Trans. Reliab."},{"key":"S0218126623500159BIB031","doi-asserted-by":"crossref","first-page":"927","DOI":"10.1007\/s00607-018-0591-z","volume":"100","author":"Feyzi F.","year":"2018","journal-title":"Computing"},{"key":"S0218126623500159BIB032","doi-asserted-by":"crossref","first-page":"299","DOI":"10.1109\/ICST.2016.22","volume-title":"2016 IEEE Int. Conf. Software Testing, Verification and Validation (ICST)","author":"Shin D.","year":"2016"},{"issue":"4","key":"S0218126623500159BIB033","doi-asserted-by":"crossref","first-page":"352","DOI":"10.1109\/TSE.1984.5010248","volume":"10","author":"Weiser M.","year":"1984","journal-title":"IEEE Trans. Softw. Eng."},{"key":"S0218126623500159BIB034","doi-asserted-by":"publisher","DOI":"10.1145\/1050849.1050865"},{"volume-title":"Heuristics for Automatic Localization of Software Faults","year":"1992","author":"Pan H.","key":"S0218126623500159BIB035"},{"key":"S0218126623500159BIB036","first-page":"201","volume-title":"2008 ACM\/IEEE 30th Int. Conf. Software Engineering","author":"Yu Y.","year":"2008"},{"key":"S0218126623500159BIB037","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194011005505"},{"key":"S0218126623500159BIB038","doi-asserted-by":"crossref","first-page":"332","DOI":"10.1109\/TSE.2019.2892102","volume":"47","author":"Zou D.","year":"2019","journal-title":"IEEE Trans. Softw. Eng."},{"key":"S0218126623500159BIB039","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2017.09.006"},{"key":"S0218126623500159BIB040","doi-asserted-by":"crossref","first-page":"378","DOI":"10.1109\/TSMCC.2011.2118751","volume":"42","author":"Wong W. E.","year":"2012","journal-title":"IEEE Trans. Syst. Man Cybern. C"},{"key":"S0218126623500159BIB041","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2776912"},{"key":"S0218126623500159BIB042","doi-asserted-by":"crossref","first-page":"2348","DOI":"10.1109\/TSE.2019.2948158","volume":"47","author":"Wen M.","year":"2019","journal-title":"IEEE Trans. Softw. Eng."},{"key":"S0218126623500159BIB043","doi-asserted-by":"publisher","DOI":"10.1145\/3133916"},{"key":"S0218126623500159BIB044","first-page":"177","volume-title":"Proc. 25th Int. Symp. Software Testing and Analysis","author":"Le T.-D. B.","year":"2016"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126623500159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,6]],"date-time":"2023-01-06T02:38:17Z","timestamp":1672972697000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/10.1142\/S0218126623500159"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,9]]},"references-count":44,"journal-issue":{"issue":"01","published-print":{"date-parts":[[2023,1,15]]}},"alternative-id":["10.1142\/S0218126623500159"],"URL":"https:\/\/doi.org\/10.1142\/s0218126623500159","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2022,9,9]]},"article-number":"2350015"}}