{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T00:33:06Z","timestamp":1771461186737,"version":"3.50.1"},"reference-count":30,"publisher":"World Scientific Pub Co Pte Ltd","issue":"10","funder":[{"name":"National Key R&D Program Projects","award":["2017YFC0805900"],"award-info":[{"award-number":["2017YFC0805900"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2023,7,15]]},"abstract":"<jats:p> There are problems of low model detection accuracy, low detection speed and difficulty in deploying online inspection in industrial surface defect detection relying on deep learning object detection algorithms. In order to effectively solve this problem, an efficient channel attention-enhanced lightweight neural network model named as EMV2-YOLOX is proposed in this paper. The algorithm incorporates the ECA module into the lightweight backbone extraction network MobileNetV2 to achieve adaptive adjustment of channel information weights, which can improve the extraction capability of the algorithm. The YOLOX model is also introduced to enhance the model\u2019s identification and localization of tiny defects. The improved algorithm can guarantee the model\u2019s accuracy and improve the model detection performance, as well as the carrying capacity of hardware devices. The experimental results show that the highest accuracy is achieved on the GCT10 and NEU public defect datasets with mean Average Precision values of 0.86 and 0.68, respectively, which is higher than the accuracy of the EMV2yoloV4 model. The parametric model number is only 10.24[Formula: see text]M in size, and the detection rate is 54.25[Formula: see text]f\/s, which is the highest performance in embedded devices. EMV2-YOLOX, combined with the attention mechanism, can efficiently extract the location and semantic information of hard-to-detect defects and plays a vital role in the intelligent detection methods. <\/jats:p>","DOI":"10.1142\/s0218126623501785","type":"journal-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T09:16:45Z","timestamp":1669886205000},"source":"Crossref","is-referenced-by-count":5,"title":["An Efficient Channel Attention-Enhanced Lightweight Neural Network Model for Metal Surface Defect Detection"],"prefix":"10.1142","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0792-6303","authenticated-orcid":false,"given":"Xikun","family":"Xie","sequence":"first","affiliation":[{"name":"School of Mechanical and Power Engineering, Chongqing University of Science and Technology, Chongqing 401331, P. R. China"}]},{"given":"Changjiang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical and Power Engineering, Chongqing University of Science and Technology, Chongqing 401331, P. R. China"}]},{"given":"Yang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Mechanical and Power Engineering, Chongqing University of Science and Technology, Chongqing 401331, P. R. China"}]},{"given":"Junjie","family":"Song","sequence":"additional","affiliation":[{"name":"School of Mechanical and Power Engineering, Chongqing University of Science and Technology, Chongqing 401331, P. R. China"}]},{"given":"Jonghyun","family":"Ahn","sequence":"additional","affiliation":[{"name":"Department of Intelligent Mechanical Engineering, Hiroshima Institute of Technology, 2-1-1 Miyake Saeki-ku, Hiroshima 731-5193, Japan"}]},{"given":"Zhong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Intelligent Mechanical Engineering, Hiroshima Institute of Technology, 2-1-1 Miyake Saeki-ku, Hiroshima 731-5193, Japan"}]}],"member":"219","published-online":{"date-parts":[[2023,1,7]]},"reference":[{"key":"S0218126623501785BIB001","doi-asserted-by":"crossref","first-page":"210","DOI":"10.1109\/MNET.102.2100394","volume":"36","author":"Guo Z.","year":"2022","journal-title":"IEEE Netw."},{"issue":"9","key":"S0218126623501785BIB002","doi-asserted-by":"crossref","first-page":"16701","DOI":"10.1109\/TITS.2022.3190280","volume":"23","author":"Xia S.","year":"2022","journal-title":"IEEE Trans. Intell. Transp. Syst."},{"key":"S0218126623501785BIB003","doi-asserted-by":"crossref","first-page":"951","DOI":"10.1109\/TR.2022.3159664","volume":"71","author":"Zhao L.","year":"2022","journal-title":"IEEE Trans. Reliab."},{"issue":"12","key":"S0218126623501785BIB004","doi-asserted-by":"crossref","first-page":"5817","DOI":"10.1109\/JBHI.2021.3139541","volume":"26","author":"Guo Z.","year":"2022","journal-title":"IEEE J. Biomed. Health Inform."},{"key":"S0218126623501785BIB005","doi-asserted-by":"crossref","first-page":"22","DOI":"10.1109\/MWC.002.2100272","volume":"29","author":"Guo Z.","year":"2022","journal-title":"IEEE Wirel. Commun."},{"issue":"10","key":"S0218126623501785BIB006","doi-asserted-by":"crossref","first-page":"19772","DOI":"10.1109\/TITS.2022.3147826","volume":"23","author":"Zhou Z.","year":"2022","journal-title":"IEEE Trans. Intell. Transp. Syst."},{"key":"S0218126623501785BIB007","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1109\/MWC.002.00293","volume":"29","author":"Peng D.","year":"2022","journal-title":"IEEE Wirel. Commun."},{"key":"S0218126623501785BIB008","doi-asserted-by":"crossref","first-page":"766","DOI":"10.1109\/TNSE.2018.2830307","volume":"7","author":"Cai Z.","year":"2020","journal-title":"IEEE Trans. Netw. Sci. Eng."},{"issue":"12","key":"S0218126623501785BIB009","doi-asserted-by":"crossref","first-page":"10934","DOI":"10.1109\/TWC.2022.3188302","volume":"21","author":"Zhang S.","year":"2022","journal-title":"IEEE Trans. Wirel. Commun."},{"issue":"6","key":"S0218126623501785BIB010","doi-asserted-by":"crossref","first-page":"4984","DOI":"10.1109\/TAES.2022.3192804","volume":"58","author":"Guo T.","year":"2022","journal-title":"IEEE Trans. Aerosp. Electron. Syst."},{"issue":"1","key":"S0218126623501785BIB011","doi-asserted-by":"crossref","DOI":"10.29099\/ijair.v6i1.286","volume":"6","author":"Santoso A. D.","year":"2022","journal-title":"Int. J. Artif. Intell. Res."},{"issue":"13","key":"S0218126623501785BIB012","doi-asserted-by":"crossref","first-page":"6823","DOI":"10.3390\/app12136823","volume":"12","author":"Yue X.","year":"2022","journal-title":"Appl. Sci."},{"key":"S0218126623501785BIB013","author":"Cai Z.","year":"2022","journal-title":"IEEE Trans. Mobile Comput."},{"key":"S0218126623501785BIB014","first-page":"729","volume-title":"Proc. 12th Int. Conf. Computer Engineering and Networks","author":"Zheng J.","year":"2022"},{"key":"S0218126623501785BIB015","first-page":"12894","volume-title":"Computer Vision and Pattern Recognition","author":"Vaswani A.","year":"2021"},{"key":"S0218126623501785BIB016","doi-asserted-by":"crossref","first-page":"2130","DOI":"10.1109\/TMC.2020.3033563","volume":"21","author":"Li Y.","year":"2022","journal-title":"IEEE Trans. Mobile Comput."},{"key":"S0218126623501785BIB017","author":"Chen C.","year":"2022","journal-title":"IEEE Trans. Aerosp. Electron. Syst."},{"key":"S0218126623501785BIB019","first-page":"1329","volume":"18","author":"Liu Y.","year":"2022","journal-title":"Int. J. Innov. Comput. Inf. Control"},{"key":"S0218126623501785BIB020","doi-asserted-by":"crossref","first-page":"103585","DOI":"10.1016\/j.compind.2021.103585","volume":"136","author":"Zhuxi M. A.","year":"2022","journal-title":"Comput. Ind."},{"issue":"21","key":"S0218126623501785BIB021","doi-asserted-by":"crossref","first-page":"20910","DOI":"10.1109\/JSEN.2022.3208580","volume":"22","author":"Xuan W.","year":"2022","journal-title":"IEEE Sens. J."},{"issue":"11","key":"S0218126623501785BIB023","doi-asserted-by":"crossref","first-page":"22452","DOI":"10.1109\/TITS.2021.3139888","volume":"23","author":"He Y.","year":"2021","journal-title":"IEEE Trans. Intell. Transp. Syst."},{"key":"S0218126623501785BIB024","first-page":"2778","author":"Zhu X.","year":"2021","journal-title":"Comput. Vis."},{"key":"S0218126623501785BIB025","first-page":"4510","author":"Sandler M.","year":"2018","journal-title":"Comput. Vis. Pattern Recognit."},{"key":"S0218126623501785BIB026","first-page":"1314","author":"Howard A.","year":"2019","journal-title":"Comput. Vis."},{"key":"S0218126623501785BIB027","first-page":"10781","author":"Tan M.","year":"2020","journal-title":"Comput. Vis. Pattern Recognit."},{"key":"S0218126623501785BIB028","doi-asserted-by":"crossref","first-page":"2121","DOI":"10.3390\/agronomy12092121","volume":"12","author":"Zu D.","year":"2022","journal-title":"Agronomy"},{"key":"S0218126623501785BIB029","first-page":"91","volume":"28","author":"Ren S.","year":"2015","journal-title":"Adv. Neural Inf. Process. Syst."},{"key":"S0218126623501785BIB030","first-page":"21","volume-title":"Computer Vision","author":"Liu W.","year":"2016"},{"key":"S0218126623501785BIB031","first-page":"1580","author":"Han K.","year":"2020","journal-title":"Comput. Vis. Pattern Recognit."},{"key":"S0218126623501785BIB032","first-page":"465","volume-title":"2021 IEEE Int. Conf. Emergency Science and Information Technology (ICESIT)","author":"Xie X.","year":"2021"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126623501785","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,15]],"date-time":"2023-06-15T03:05:21Z","timestamp":1686798321000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/10.1142\/S0218126623501785"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1,7]]},"references-count":30,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2023,7,15]]}},"alternative-id":["10.1142\/S0218126623501785"],"URL":"https:\/\/doi.org\/10.1142\/s0218126623501785","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1,7]]},"article-number":"2350178"}}