{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T23:01:34Z","timestamp":1782428494501,"version":"3.54.5"},"reference-count":30,"publisher":"World Scientific Pub Co Pte Ltd","issue":"09","funder":[{"DOI":"10.13039\/501100004564","name":"ministarstvo prosvete nauke i tehnoloskog razvoja","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004564","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2024,6]]},"abstract":"<jats:p> In this paper, a robust fault detection methodology for complex analog CMOS integrated filters is presented. It is based on combining the two types of testing methodologies, Oscillation-Based Testing (OBT) and IDDQ testing, i.e., measuring of the power-supply current ([Formula: see text]). The proposed methodology is applied to the Bi-quad Sallen\u2013Key band-pass (BP) filter cell with relatively complex, two-stage, class-AB-output, operational amplifier (opamp) topology. The filter is custom designed targeting the 180-nm CMOS technology. Hundreds of time-domain simulations and analyses of the circuit output signal are performed in order to obtain the fault dictionary. The presented results show that the proposed hybrid OBT\u2013IDDQ methodology is significantly more efficient in the defects coverage than any of the particular test methodologies alone. Subsequently, the specific algorithm for the defects classification is proposed. Based on the classification, certain degree of diagnosis of the individual defect, or a group of defects, can be achieved. <\/jats:p>","DOI":"10.1142\/s0218126624501469","type":"journal-article","created":{"date-parts":[[2023,11,18]],"date-time":"2023-11-18T04:28:15Z","timestamp":1700281695000},"source":"Crossref","is-referenced-by-count":1,"title":["A Defects Classification Algorithm for the Hybrid OBT\u2013IDDQ Fault Diagnosis Technique in Analog CMOS Integrated Circuits"],"prefix":"10.1142","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5877-1404","authenticated-orcid":false,"given":"Dejan D.","family":"Mirkovic","sequence":"first","affiliation":[{"name":"Department of Electronics, Faculty of Electronic Engineering, University of Ni\u0161, Aleksandra Medvedeva 14, 1800 Ni\u0161, Serbia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0935-6922","authenticated-orcid":false,"given":"Milena J. 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