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In both low- and high- resolution modes, the error following two-point calibration is observed between [Formula: see text]C and [Formula: see text]C. The sensor\u2019s ability to function in both high- and low-resolution modes based on conversion time is an important feature. At a sampling frequency of 0.19[Formula: see text]MHz, the maximum resolution achieved is 0.18[Formula: see text]C. Additionally, the sensor has control logic built in to turn off the sensing as soon as the conversion is complete. At 90-nm process, 1.1[Formula: see text]V supply voltage and 27[Formula: see text]C, the proposed sensor occupies [Formula: see text] and consumes [Formula: see text]. <\/jats:p>","DOI":"10.1142\/s0218126624502384","type":"journal-article","created":{"date-parts":[[2024,2,18]],"date-time":"2024-02-18T05:01:47Z","timestamp":1708232507000},"source":"Crossref","is-referenced-by-count":2,"title":["Time Domain and Area Efficient Smart Temperature Sensor Exploiting Channel Length Modulation Coefficient"],"prefix":"10.1142","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-2833-9838","authenticated-orcid":false,"given":"Kuntal","family":"Chakraborty","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology, Arunachal Pradesh, Jote 791113, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4775-8591","authenticated-orcid":false,"given":"Alak","family":"Majumder","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology, Arunachal Pradesh, Jote 791113, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8023-4103","authenticated-orcid":false,"given":"Abir J","family":"Mondal","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication Engineering, National Institute of Technology, Arunachal Pradesh, Jote 791113, India"}]}],"member":"219","published-online":{"date-parts":[[2024,3,18]]},"reference":[{"key":"S0218126624502384BIB001","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2161783"},{"key":"S0218126624502384BIB002","doi-asserted-by":"publisher","DOI":"10.1016\/0250-6874(86)80037-3"},{"key":"S0218126624502384BIB003","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(00)00460-X"},{"key":"S0218126624502384BIB004","doi-asserted-by":"publisher","DOI":"10.1587\/elex.11.20142001"},{"key":"S0218126624502384BIB005","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2638464"},{"key":"S0218126624502384BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2141684"},{"key":"S0218126624502384BIB007","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2283196"},{"key":"S0218126624502384BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/82.868466"},{"key":"S0218126624502384BIB009","first-page":"1","volume-title":"IEEE Int. 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